Semiconductor device
US-2016233856-A1 · Aug 11, 2016 · US
US2016087622A1 · US · A1
| Field | Value |
|---|---|
| Publication number | US-2016087622-A1 |
| Application number | US-201514856059-A |
| Country | US |
| Kind code | A1 |
| Filing date | Sep 16, 2015 |
| Priority date | Sep 19, 2014 |
| Publication date | Mar 24, 2016 |
| Grant date | — |
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The semiconductor device according to one embodiment includes a power transistor and a sense transistor connected in parallel with each other, a first operational amplifier having a non-inverting input terminal connected to an emitter of the sense transistor and an inverting input terminal connected to an emitter of the power transistor, a resistor element having one end connected to the emitter of the sense transistor and another end connected to a first node, and an adjustment transistor placed between the first node and a low-voltage power supply. The first operational amplifier adjusts a current flowing through the adjustment transistor so that an emitter voltage of the power transistor and an emitter voltage of the sense transistor are substantially the same.
Opening claim text (preview).
What is claimed is: 1 . A semiconductor device comprising: a power transistor; a sense transistor having a gate connected to a gate of the power transistor and a collector or drain connected to a collector or drain of the power transistor; a first operational amplifier having a first input terminal connected to an emitter or source of the sense transistor and a second input terminal connected to an emitter or source of the power transistor; a resistor element having one end connected to the emitter or source of the sense transistor and another end connected to a first node; and an adjustment transistor placed between the first node and a low-voltage power supply and having a base or gate supplied with an output of the first operational amplifier, wherein the first operational amplifier adjusts a current flowing through the adjustment transistor so that a voltage of the emitter or source of the power transistor and a voltage of the emitter or source of the sense transistor are substantially the same. 2 . The semiconductor device according to claim 1 , wherein the first input terminal of the first operational amplifier is a non-inverting input terminal, and the second input terminal of the first operational amplifier is an inverting input terminal, and a collector or drain of the adjustment transistor is connected to the first node, and an emitter or source of the adjustment transistor is connected to the low-voltage power supply. 3 . The semiconductor device according to claim 1 , wherein a current flowing through the power transistor is monitored by monitoring a voltage of the first node. 4 . The semiconductor device according to claim 1 , wherein the adjustment transistor is placed in a semiconductor chip different from a semiconductor chip including the first operational amplifier. 5 . The semiconductor device according to claim 1 , wherein a low-voltage power supply of the first operational amplifier and a low-voltage power supply connected to the adjustment transistor are lower than a voltage of the emitter or source of the power transistor. 6 . The semiconductor device according to claim 2 , wherein the inverting input terminal of the first operational amplifier is connected to a ground potential, and the emitter or source of the adjustment transistor is connected to a negative potential. 7 . The semiconductor device according to claim 1 , comprising: a gate driver that drives the power transistor; and a comparator that compares a voltage of the first node with a specified reference voltage and outputs a comparison result to the gate driver, wherein the gate driver turns the power transistor OFF when the comparison result from the comparator indicates that an overcurrent is flowing through the power transistor. 8 . The semiconductor device according to claim 1 , further comprising: a switching element capable of switching between a case where the output of the first operational amplifier is supplied to the gate of the adjustment transistor and a case where a voltage for turning the adjustment transistor OFF is supplied to the gate of the adjustment transistor, wherein a voltage of the emitter or source of the sense transistor when the adjustment transistor is OFF is used as temperature information of the power transistor. 9 . The semiconductor device according to claim 8 , further comprising: a second operational amplifier having one input supplied with a gate voltage of the sense transistor and another input supplied with a voltage of the emitter or source of the sense transistor, wherein the second operational amplifier outputs a voltage corresponding to a difference between the gate voltage of the sense transistor and the voltage of the emitter or source of the sense transistor as the temperature information of the power transistor. 10 . The semiconductor device according to claim 8 , comprising: a temperature abnormality detection circuit that detects temperature abnormality of the power transistor by using the temperature information of the power transistor; and a gate driver that drives the power transistor, wherein the gate driver turns the power transistor OFF when the temperature abnormality detection circuit detects temperature abnormality of the power transistor. 11 . The semiconductor device according to claim 1 , further comprising: a switching element capable of switching between a case where the output of the first operational amplifier is supplied to the gate of the adjustment transistor and a case where a voltage for turning the adjustment transistor OFF is supplied to the gate of the adjustment transistor, wherein a temperature of the power transistor is estimated by using a voltage of the first node measured when the output of the first operational amplifier is supplied to the gate of the adjustment transistor and a voltage of the first node measured when the adjustment transistor is OFF.
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