Semiconductor component comprising magnetic field sensor
US-9076717-B2 · Jul 7, 2015 · US
US2016064451A1 · US · A1
| Field | Value |
|---|---|
| Publication number | US-2016064451-A1 |
| Application number | US-201514792289-A |
| Country | US |
| Kind code | A1 |
| Filing date | Jul 6, 2015 |
| Priority date | Dec 8, 2006 |
| Publication date | Mar 3, 2016 |
| Grant date | — |
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The invention relates to a semiconductor component ( 100 ) comprising a semiconductor chip ( 10 ) configured as a wafer level package, a magnetic field sensor ( 11 ) being integrated into said semiconductor chip.
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What is claimed is: 1 . Semiconductor component comprising a semiconductor chip configured as a wafer level package, a magnetic field sensor being integrated into said semiconductor chip. 2 . Semiconductor component according to claim 1 , wherein a magnet is applied to a first main surface of the semiconductor chip. 3 . Semiconductor component according to claim 2 , wherein the magnet is a layer made of a permanent-magnetic material that is deposited on the first main surface of the semiconductor chip. 4 . Semiconductor component according to claim 2 , wherein the magnet is an integral permanent magnet mounted onto the first main surface of the semiconductor chip. 5 . Semiconductor component according to claim 2 , 20 wherein the first main surface is the active main surface ofthe semiconductor chip. 6 . Semiconductor component according to claim 1 , wherein external contact elements are applied to the active main surface of the semiconductor chip. 7 . Semiconductor component according to claim 6 , wherein the external contact elements have an underbump metallization. 8 . Semiconductor component according to claim 6 , wherein the external contact elements have solder deposits arranged in particular in flip-chip-like fashion. 9 . Semiconductor component according to claim 6 , wherein a rewiring layer is arranged between the semiconductor chip and the external contact elements. 10 . Semiconductor component according to claim 1 , wherein the semiconductor chip is configured as a position sensor or rate-of-rotation sensor or as a part of a position sensor or rate-of-rotation sensor. 11 . Semiconductor component comprising: a semiconductor chip, into which a magnetic field sensor is integrated, and external contact elements applied to an active main surface of the semiconductor chip. 12 . Semiconductor component according to claim 11 , wherein a magnet is applied to a first main surface of the semiconductor chip. 13 . Semiconductor component according to claim 12 , wherein the magnet is a layer made of a permanent-magnetic material that is deposited on the first main surface of the semiconductor chip. 14 . Semiconductor component according to claim 12 , wherein the magnet is an integral permanent magnet mounted onto the first main surface of the semiconductor chip. 15 . Semiconductor component according to claim 11 , wherein the external contact elements have an underbump metalization. 16 . Semiconductor component according to claim 11 , wherein the external contact elements have solder deposits arranged in particular in flip-chip-like fashion. 17 . Semiconductor component according to claim 11 , wherein a rewiring layer is arranged between the active main surface of the semiconductor chip and the external contact elements. 18 . Method in which a carrier is provided, which comprises a plurality of integrated circuits, wherein at least one first one of the integrated circuits comprises a magnetic field sensor, external contact elements are applied to a main surface of the carrier, and the integrated circuits are singulated after the application of the external contact element. 19 . Method according to claim 18 , wherein the carrier is a semiconductor wafer. 20 . Method according to claim 18 , wherein the magnetic field sensor and the external contact elements are arranged at the same main surface of the carrier. 21 - 32 . (canceled)
Electricity · mapped topic
Electricity · mapped topic
Electricity · mapped topic
Integrated devices, or assemblies of multiple devices, comprising at least one galvanomagnetic or Hall-effect element covered by groups H10N50/00 - H10N52/00 (MRAM devices H10B61/00) · CPC title
Geometrical arrangement of magnetic sensor elements; Apparatus combining different magnetic sensor types (G01R33/0206 takes precedence) · CPC title
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