Infrared cut filter, solid-state imaging device, and imaging/display apparatus

US2016018576A1 · US · A1

Patent metadata
FieldValue
Publication numberUS-2016018576-A1
Application numberUS-201514870751-A
CountryUS
Kind codeA1
Filing dateSep 30, 2015
Priority dateApr 10, 2013
Publication dateJan 21, 2016
Grant date

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Abstract

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Provided is an infrared cut filter including: an infrared absorbing layer of a transparent resin containing an infrared absorber; and a selected wavelength cut layer stacked on the infrared absorbing layer, wherein the following requirements are satisfied. (i) In a spectral transmittance curve for an incident angle of 0°, an average transmittance in a 450-600 nm range is 80% or more, a transmittance in a 700-1200 nm range is 2.0% or less, and D 0 represented by the following expression is less than 0.04. D 0 (%/nm)=(Tmax·0−Tmin·0)/(λ(Tmax·0)−λ(Tmin·0)) (ii) wherein a spectrum transmittance curve for an incident angle of 30°, an average transmittance in the 450 to 600 nm range is 80% or more, a transmittance in the 700-1200 nm range is 2.0% or less, and D 30 represented by the following expression is less than 0.04. D 30 (%/nm)=(Tmax·30−Tmin·30)/(λ(Tmax·30)−×(Tmin·30))

First claim

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What is claimed is: 1 . An infrared cut filter comprising: an infrared absorbing layer of a transparent resin containing an infrared absorber; and a selected wavelength cut layer stacked on the infrared absorbing layer, wherein the following requirements (i) and (ii) are satisfied. (i) In a spectral transmittance curve for an incident angle of “0” (zero) degree, an average transmittance in the wavelength range of 450 to 600 nm is 80% or more, a transmittance in the wavelength range of 700 to 1200 nm is 2% or less, and a transmittance variation D 0 represented by the following expression (1) is less than 0.04. D 0 (%/nm)=( T max·0− T min·0)/(λ( T max·0)−λ( T min·0))  (1) wherein Tmax·0 and Tmin·0 are respectively a maximum transmittance and a minimum transmittance in the wavelength range of 1100 to 1250 nm, and λ(Tmax·0) is a wavelength showing the maximum transmittance Tmax·0, and λ(Tmin·0) is a wavelength showing the minimum transmittance Tmin·0. (ii) In a spectrum transmittance curve for an incident angle of 30 degrees, an average transmittance in the wavelength range of 450 to 600 nm is 80% or more, a transmittance in the wavelength range of 700 to 1200 nm is 2% or less, and a transmittance variation D 30 represented by the following expression (2) is less than 0.04. D 30 (%/nm)=( T max·30− T min·30)/(λ( T max·30)−λ( T min·30))  (2) wherein Tmax·30 and Tmin·30 are respectively a maximum transmittance and a minimum transmittance in the wavelength range of 1100 to 1250 nm, and λ(Tmax·30) is a wavelength showing the maximum transmittance Tmax·30, and λ(Tmin·30) is a wavelength showing the minimum transmittance Tmin·30. 2 . The infrared cut filter according to claim 1 , further comprising a transparent substrate supporting the infrared absorbing layer and the selected wavelength cut layer. 3 . The infrared cut filter according to claim 1 , wherein the selected wavelength cut layer satisfies the following requirements (iii-1) to (iii-3). (iii-1) In a spectral transmittance curve for the incident angle of “0” (zero) degree, a transmittance in the wavelength range of 430 to 670 nm is 90% or more, and a transmittance in the wavelength range of λa to 1150 nm is 1% or less, wherein λa is a maximum wavelength whose transmittance is 1% in the wavelength range of 670 to 800 nm. (iii-2) In a spectral transmittance curve for the incident angle of 30 degrees, a transmittance in the wavelength range of 430 to 650 nm is 90% or more, and a maximum wavelength whose transmittance is 1% in the wavelength range of λb to 1200 nm is 1100 nm or more, wherein λb is a maximum wavelength whose transmittance is 1% in the wavelength range of 670 to 800 nm). (iii-3) A ratio [T 1200 (30)/T 1200 (0)] between a transmittance T 1200 (30) at a wavelength of 1200 nm in the spectral transmittance curve for the incident angle of 30 degrees and a transmittance T 1200 (0) at a wavelength of 1200 nm in the spectral transmittance curve for the incident angle of “0” (zero) degree is 40 or less. 4 . The infrared cut filter according to claim 1 , wherein a light absorption spectrum in a wavelength range of 700 to 1300 nm of the infrared absorber dissolved in a solvent whose refractive index (n d ) is less than 1.5 satisfies requirements of the following (iv-1) and (iv-2). (iv-1) A maximum absorption wavelength λ max is from 1100 to 1250 nm. (iv-2) A shortest wavelength in the range where an absorbance calculated by setting an absorbance at the maximum absorption wavelength λ max as one is 0.2 is 1000 nm or less. 5 . The infrared cut filter according to claim 1 , wherein the infrared absorber comprises a compound having a dithiolene structure of the following general formula (1): wherein M represents an metal atom, X 1 represents a bivalent organic group constituting a heterocycle (ring A) together with a sulfur atom, X 2 represents a bivalent organic group constituting a heterocycle (ring B) together with the sulfur atom, Z represents a compound represented by DR 1 R 2 R 3 R 4 wherein D represents a nitrogen atom, a phosphorus atom, or a bismuth atom, and each of R 1 , R 2 , R 3 and R 4 represents an alkyl group which may have a substituent group or an aryl group which may have the substituent group, and y represents “0” (zero) or 1. 6 . The infrared cut filter according to claim 1 , wherein the transparent resin comprises at least one selected from a group consisting of an acrylic resin, an epoxy resin, an ene-thiol resin, a polycarbonate resin, a polyether resin, a polyarylate resin, a polysulfone resin, a polyethersulfone resin, a polyparaphenylene resin, a polyarylene ether phosphine oxide resin, a polyimide resin, a polyamideimide resin, a polyethyleneterephthalate resin, a polyethylenenaphthalate resin, a polyolefin resin, a cyclic olefin resin, and a polyester resin. 7 . A solid-state imaging device comprising the infrared cut filter according to claim 1 . 8 . An imaging/display apparatus comprising the infrared cut filter according to claim 1 .

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Classifications

  • G02B5/208Primary

    for use with infrared or ultraviolet radiation, e.g. for separating visible light from infrared and/or ultraviolet radiation · CPC title

  • containing organic substances, e.g. dyes, inks or pigments · CPC title

  • Filters or other obturators specially adapted for photographic purposes · CPC title

  • Metal complexes of organic compounds not being dyes in uncomplexed form · CPC title

  • from other compounds {, e.g. other heterocyclic compounds} · CPC title

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What does patent US2016018576A1 cover?
Provided is an infrared cut filter including: an infrared absorbing layer of a transparent resin containing an infrared absorber; and a selected wavelength cut layer stacked on the infrared absorbing layer, wherein the following requirements are satisfied. (i) In a spectral transmittance curve for an incident angle of 0°, an average transmittance in a 450-600 nm range is 80% or more, a transmit…
Who is the assignee on this patent?
Asahi Glass Co Ltd
What technology area does this patent fall under?
Primary CPC classification G02B5/208. Mapped technology areas include Physics.
When was this patent published?
Publication date Thu Jan 21 2016 00:00:00 GMT+0000 (Coordinated Universal Time) (A1). Legal status and post-grant events are not shown on this page.
What related patents are in patentsdb?
We list 1 related publication on this page (citations in our corpus or others sharing the same primary CPC).