Semiconductor device, battery monitoring system, and method of monitoring battery

Patent metadata

Field	Value
Publication number	US-2016018474-A1
Application number	US-201514798654-A
Country	US
Kind code	A1
Filing date	Jul 14, 2015
Priority date	Jul 15, 2014
Publication date	Jan 21, 2016
Grant date	—

Abstract

A semiconductor device includes a voltage generation circuit configured to generate a specific voltage; a first terminal configured to output the specific voltage; a second terminal configured to receive a temperature sensitive voltage; an analog/digital conversion circuit configured to convert the specific voltage and the temperature sensitive voltage to digital values; a storage unit configured to store the specific voltage and the temperature sensitive voltage; and a third terminal configured to transmit the specific voltage and the temperature sensitive voltage to an external semiconductor device.

First claim

What is claimed is:

1 . A semiconductor device, comprising:
a voltage generation circuit configured to generate a voltage having a specific voltage value; a first terminal configured to output the voltage generated with the voltage generation circuit; a second terminal connected to the first terminal, said second terminal being configured to receive a temperature sensitive voltage as a voltage at a connecting point between a temperature sensitive element and a resistor of a circuit for detecting a temperature of a subject, in which the temperature sensitive element is connected to the resistor in series; an analog/digital conversion circuit configured to convert the specific voltage value and a voltage value of the temperature sensitive voltage that are analog values to digital values, respectively, so that the specific voltage value and the voltage value of the temperature sensitive voltage are measured; a storage unit configured to store the specific voltage value and the voltage value of the temperature sensitive voltage thus measured with the analog/digital conversion circuit so that an external semiconductor device calculates the temperature of the subject; and a third terminal configured to transmit the specific voltage value and the voltage value of the temperature sensitive voltage thus stored in the storage unit to the external semiconductor device.

2 . The semiconductor device according to claim 1 , wherein said voltage generation circuit configured to generate a reference voltage so that the analog/digital conversion circuit converts the specific voltage value and the voltage value of the temperature sensitive voltage to the digital values according to the reference voltage generated with the voltage generation circuit.

3 . The semiconductor device according to claim 1 , wherein said second terminal is configured to receive the temperature sensitive voltage for detecting a temperature of a rechargeable battery as the subject.

4 . The semiconductor device according to claim 3 , further comprising a fourth terminal configured to receive a voltage generated with the rechargeable battery.

5 . The semiconductor device according to claim 4 , further comprising:
a first switch connected between the voltage generation circuit and the analog/digital conversion circuit; a second switch connected between the second terminal and the analog/digital conversion circuit; a third switch connected between the fourth terminal and the analog/digital conversion circuit; and a control circuit configured to control the first switch, the second switch, and the third switch.

6 . The semiconductor device according to claim 1 , further comprising a switch circuit for switching the first potential and the second potential according to one single switching signal.

7 . A battery monitoring system, comprising:
said semiconductor device according to claim 3 ; and said external semiconductor device that receives the specific voltage value and the voltage value of the temperature sensitive voltage stored in the storage unit through the third terminal so that the external semiconductor device calculates a temperature of the rechargeable battery according to a specific equation with the specific voltage value and the voltage value of the temperature sensitive voltage as variables.

8 . A method of monitoring a battery using a battery monitoring semiconductor device,
wherein said battery monitoring semiconductor device includes:
a voltage generation circuit configured to generate a voltage having a specific voltage value;
a first terminal configured to output the voltage generated with the voltage generation circuit;
a second terminal connected to the first terminal, said second terminal being configured to receive a temperature sensitive voltage as a voltage at a connecting point between a temperature sensitive element and a resistor of a circuit for detecting a temperature of a subject, in which the temperature sensitive element is connected to the resistor in series;
an analog/digital conversion circuit configured to convert the specific voltage value and a voltage value of the temperature sensitive voltage that are analog values to digital values, respectively, so that the specific voltage value and the voltage value of the temperature sensitive voltage are measured;
a storage unit configured to store the specific voltage value and the voltage value of the temperature sensitive voltage thus measured with the analog/digital conversion circuit so that an external semiconductor device calculates the temperature of the subject; and
a third terminal configured to transmit the specific voltage value and the voltage value of the temperature sensitive voltage thus stored in the storage unit to the external semiconductor device, and
said external semiconductor device is connected to the battery monitoring semiconductor device, said method of monitoring a battery comprising the steps of: receiving the specific voltage value and the voltage value of the temperature sensitive voltage stored in the storage unit through the third terminal; and calculating a temperature of the rechargeable battery according to a specific equation with the specific voltage value and the voltage value of the temperature sensitive voltage as variables.

Assignees

• Lapis Semiconductor Co Ltd

Inventors

• Kikuchi Hidekazu

Classifications

• H01M10/486 Primary

  for measuring temperature · CPC title

• H02J7/663

  using battery or load disconnect circuits (H02J9/002 takes precedence) · CPC title

• H01M10/48 Primary

  Accumulators combined with arrangements for measuring, testing or indicating the condition of cells, e.g. the level or density of the electrolyte (constructional details of current conducting connections for detecting conditions inside cells or batteries, e.g. details of voltage sensing terminals, H01M50/569) · CPC title

• G01R31/3675 Primary

  Physics · mapped topic

• G01R31/362

  Physics · mapped topic