Apparatus for testing electronic devices
US-2015369858-A1 · Dec 24, 2015 · US
US2016011133A1 · US · A1
| Field | Value |
|---|---|
| Publication number | US-2016011133-A1 |
| Application number | US-201514726973-A |
| Country | US |
| Kind code | A1 |
| Filing date | Jun 1, 2015 |
| Priority date | Jul 14, 2014 |
| Publication date | Jan 14, 2016 |
| Grant date | — |
A practical reading order for non-experts. Skip the full description unless you need deep technical detail.
What the patent document calls the invention.
A short plain-language summary of the technical disclosure.
Who owns or filed the patent and who is credited as inventor.
Filing, priority, publication, and grant dates set the timeline.
The legal scope of protection — read this for what is actually claimed.
Technology tags used to group this patent with similar filings.
Prior art links and similar publications in this corpus.
Official abstract text for this publication.
An information output apparatus comprises: a first switching element joined through a solder part, and forming one arm of a power conversion apparatus; a second switching element connected in series with the first switching element, and forming the other arm of the power conversion apparatus; a smoothing capacitor; a measuring unit configured to measure a temperature of the first switching element to output a measured value; an applying unit configured to apply two or more continuous pulses in a state where a potential difference across the smoothing capacitor is greater than or equal to a predetermined value, the pulses causing the first switching element and the second switching element to simultaneously turn on; an adjusting unit configured to adjust pulse widths of the pulses; and an output unit configured to output information indicating a deterioration of the solder part based on a manner of a change in measured values.
Opening claim text (preview).
What is claimed is: 1 . An information output apparatus comprising: a first switching element joined through a solder part to a surface of a substrate cooled by a refrigerant, and forming one arm of a power conversion apparatus; a second switching element connected in series with the first switching element, and forming the other arm of the power conversion apparatus; a smoothing capacitor disposed in parallel with the first switching element and the second switching element; a measuring unit configured to measure a temperature of the first switching element to output a measured value corresponding to the measured temperature; an applying unit, achieved by a process performed by a processing device, configured to apply two or more continuous pulses to the first switching element and the second switching element in a state where a potential difference across the smoothing capacitor is greater than or equal to a predetermined value, the pulses causing the first switching element and the second switching element to simultaneously turn on; an adjusting unit, achieved by a process performed by the processing device, configured to adjust pulse widths of the pulses so that a difference between a temperature of the first switching element before having the pulses applied and a temperature of the first switching element after having the pulses applied becomes greater than or equal to a predetermined temperature; and an output unit, achieved by a process performed by the processing device, configured to output information indicating a deterioration of the solder part based on a manner of a change in measured values, the measured values being output from the measuring unit when the pulses are applied. 2 . The information output apparatus as claimed in claim 1 , wherein the manner of a change in the measured values includes a peak value among the measured values or a difference between a measured value before having the pulses applied and the peak value among the measured values.
Testing of solder joints · CPC title
Testing semiconductor operation lifetime or reliability, e.g. by accelerated life tests · CPC title
Testing power supplies (testing photovoltaic devices H02S50/10) · CPC title
Investigating presence of flaws · CPC title
Related publications grouped by family.
Answers are generated from the same data shown on this page.