Analysis device and analysis method

Patent metadata

Field	Value
Publication number	US-2016011040-A1
Application number	US-201514865584-A
Country	US
Kind code	A1
Filing date	Sep 25, 2015
Priority date	Mar 28, 2013
Publication date	Jan 14, 2016
Grant date	—

Abstract

An analysis device constructs an analytical model with a circuit board and a medium, and applies a concentrated load grouping composed of concentrated loads to the circuit board. In this case, the concentrated loads are established such that the sum of the respective vectors is zero, and such that the torque is zero with respect to the center of gravity. The analysis device applies a finite element method to the analytical model to figure out the vibration of the circuit board, which is caused when the concentrated loads vibrate with a constant period. The change in the pressure of the medium is computed from the vibration of the circuit board, and the change in the pressure is converted to a sound pressure.

First claim

1 . An analysis device that uses a finite element method to analyze an acoustic noise phenomenon of a circuit board with a multilayer ceramic capacitor mounted thereon, the analysis device comprising:
a model construction that constructs an analytical model with the circuit board and a medium; a concentrated load grouping application that applies a concentrated load grouping including multiple concentrated loads configured such that the sum of respective vectors is zero and such that the torque is zero with respect to the center of gravity, to the circuit board of the analytical model in accordance with the multilayer ceramic capacitor; a board vibration calculation that figures out vibration of the circuit board with the concentrated load grouping applied thereto, when the magnitudes of the respective concentrated loads are periodically changed with time; and a sound pressure calculation that figures out a sound pressure in the medium on the basis of the change in pressure of the medium due to the vibration of the circuit board.

2 . The analysis device according to claim 1 , further comprising a setting value determination that determines values set for locations and magnitudes of the concentrated loads so that a calculation value for the sound pressure is close to an actual measurement value for the sound pressure.

3 . The analysis device according to claim 2 , wherein the setting value determination determines values set for the locations and magnitudes of the concentrated loads such that the calculation value for the sound pressure is close to the actual measurement value therefor around a band in which a maximal value is produced for the sound pressure when frequency characteristics are obtained for the sound pressure.

4 . The analysis device according to claim 2 , further comprising:
a library registration that figures out values set for the locations and magnitudes of the concentrated loads for each type of the multilayer ceramic capacitor, and registers the set values in a library; and a setting value selection that selects, from the library, the values set for the concentrated loads depending on the type of the multilayer ceramic capacitor.

5 . An analysis method for using a finite element method to analyze an acoustic noise phenomenon of a circuit board with a multilayer ceramic capacitor mounted thereon, the method comprising:
constructing an analytical model with the circuit board and a medium; applying a concentrated load grouping including multiple concentrated loads configured such that the sum of respective vectors is zero and such that the torque is zero with respect to the center of gravity, to the circuit board of the analytical model in accordance with the multilayer ceramic capacitor; figuring out vibration of the circuit board with the concentrated load grouping applied thereto, when the magnitudes of the respective concentrated loads are periodically changed with time; and figuring out a sound pressure in the medium on the basis of the change in pressure of the medium due to the vibration of the circuit board.

Assignees

• Murata Manufacturing Co

Inventors

• Mifune Hiroshi
• Hidaka Seiji
• Fujii Yasuo

Classifications

• G06F30/23 Primary

  using finite element methods [FEM] or finite difference methods [FDM] · CPC title

• G01H11/08

  using piezoelectric devices · CPC title

• G01H17/00 Primary

  Measuring mechanical vibrations or ultrasonic, sonic or infrasonic waves, not provided for in the other groups of this subclass · CPC title

• G01H1/00

  Measuring {characteristics of} vibrations in solids by using direct conduction to the detector (G01H9/00, G01H11/00 take precedence) · CPC title