Substrate polishing apparatus
US-2019389027-A1 · Dec 26, 2019 · US
US2016005618A1 · US · A1
| Field | Value |
|---|---|
| Publication number | US-2016005618-A1 |
| Application number | US-201414476991-A |
| Country | US |
| Kind code | A1 |
| Filing date | Sep 4, 2014 |
| Priority date | Jul 3, 2014 |
| Publication date | Jan 7, 2016 |
| Grant date | — |
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A polishing device includes a housing, a flexible base coupled to the housing, and a contact region disposed on a first side of the flexible base, wherein the flexible base expands and contracts based on pressure contained within the housing and a second side of the flexible base to form a contact area on the first side that is less than a surface area of the flexible base.
Opening claim text (preview).
1 . A polishing device, comprising: a housing; a flexible base coupled to the housing; and a contact region disposed on a first side of the flexible base, wherein the flexible base expands and contracts based on pressure contained within the housing and a second side of the flexible base to form a contact area on the first side that is less than a surface area of the flexible base. 2 . The device of claim 1 , wherein the contact region is raised from the flexible base. 3 . The device of claim 1 , wherein the contact region is positioned on the base along an arc segment. 4 . The device of claim 1 , wherein the contact region comprises a plurality of contact pads. 5 . The device of claim 1 , wherein the flexible base comprises a raised lip at a perimeter thereof. 6 . The device of claim 1 , wherein the contact area is adjustable. 7 . The device of claim 6 , wherein the adjustment of the contact area is based on a process recipe. 8 . The device of claim 1 , wherein the contact region is arc-shaped. 9 . The device of claim 1 , wherein the contact region is circular. 10 . A polishing module, comprising: a chuck having a substrate receiving surface and a perimeter; and a polishing pad positioned about the perimeter of the chuck, the polishing pad comprising a contact region positioned about a center of a flexible base, wherein the polishing pad is inflatable by pressure application to a backside of the flexible base. 11 . The module of claim 10 , wherein the contact region is detachably coupled to the flexible base. 12 . The module of claim 10 , wherein the contact region is arc-shaped. 13 . The module of claim 10 , wherein the contact region is circular. 14 . A method of polishing a substrate, comprising: urging a polishing pad disposed on a housing against a surface of a substrate, the polishing pad being disposed on a flexible base; and adjusting a contact area of the polishing pad by adjusting a pressure to a backside of the flexible base, wherein the contact area is less than a surface area of the flexible base. 15 . The method of claim 14 , wherein the adjusting of the contact area is based on a process recipe. 16 . The method of claim 15 , wherein the contact area conforms to the surface of the substrate. 17 . The method of claim 14 , wherein the contact area is arc-shaped. 18 . The method of claim 17 , wherein the contact area conforms to the surface of the substrate. 19 . The method of claim 14 , wherein the contact area is circular. 20 . The method of claim 19 , wherein the contact area conforms to the surface of the substrate.
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