Measuring device, measuring method, and computer program product

Patent metadata

Field	Value
Publication number	US-2015271466-A1
Application number	US-201514645572-A
Country	US
Kind code	A1
Filing date	Mar 12, 2015
Priority date	Mar 20, 2014
Publication date	Sep 24, 2015
Grant date	—

Abstract

According to an embodiment, a measuring device includes a projector, an image capturing unit, a first calculator, a setting unit, and a second calculator. The projector projects, onto an object, a first pattern in which predetermined designs are distributed randomly and a second pattern in which a luminance value changes according to a sinusoidal wave function having a frequency. The image capturing unit captures a first image of the object onto which the first pattern is projected and a second image of the object onto which the second pattern is projected. The first calculator calculates a distance to the object by using the first pattern and the first image. The setting unit sets the frequency of a sinusoidal wave function by using the distance. The second calculator calculates a three-dimensional shape of the object by using the second pattern and the second image.

First claim

What is claimed is:

1 . A measuring device comprising:
a projector to project, onto an object, a first pattern in which predetermined designs are distributed randomly and a second pattern in which a luminance value changes according to a sinusoidal wave function having a frequency; an image capturing unit to capture a first image of the object onto which the first pattern is projected and a second image of the object onto which the second pattern is projected; a first calculator to calculate a distance to the object by using the first pattern and the first image; a setting unit to set the frequency of a sinusoidal wave function by using the distance; and a second calculator to calculate a three-dimensional shape of the object by using the second pattern and the second image.

2 . The device according to claim 1 , further comprising a generator to generate the second pattern, wherein
the setting unit sets a frequency of the sinusoidal wave function for each projection unit pixel that represents a unit pixel of the projector, and the generator generates, for each of the projection unit pixels, the second pattern in which a luminance value changes according to the sinusoidal wave function having the frequency set for the projection unit pixel.

3 . The device according to claim 2 , wherein
for each image unit pixel that represents a unit pixel of the first image, the first calculator calculates, as the distance, three-dimensional distance from the measuring device to a position of the object corresponding to the image unit pixel, the setting unit calculates, for each of the image unit pixels, a number of pixels of projection unit pixels corresponding to the image unit pixel by using the three-dimensional distance to the image unit pixel, and sets the frequency at each of the projection unit pixels based on the number of pixels calculated for a corresponding image unit pixel.

4 . The device according to claim 3 , wherein, for each of the projection unit pixels, the setting unit performs setting in such a way that a number of pixels required for a unit period of the sinusoidal wave function at the projection unit pixel is equal to or smaller than half of the number of pixels calculated at the image unit pixel corresponding to the projection unit pixel, and sets the frequency at the projection unit pixel according to the number of pixels thus set.

5 . The device according to claim 4 , wherein, the setting unit sets, as a number of pixels required for a unit period of the sinusoidal wave function at the projection unit pixel, natural numbers in descending order that are equal to or smaller than half of the number of pixels calculated at the image unit pixel corresponding to the projection unit pixel to calculate phase errors of the sinusoidal wave function, and sets a natural number having the phase error equal to or greater than a threshold value as the number of pixels required for the unit period.

6 . The device according to claim 1 , wherein
the setting unit further sets a direction of the sinusoidal wave function by using the distance, and the generator generates the second pattern in which a luminance value changes according to the sinusoidal wave function having the frequency and the direction.

7 . The device according to claim 6 , wherein
the setting unit sets a direction of the sinusoidal wave function for each of the projection unit pixels, and the generator generates, for each of the projection unit pixels, the second pattern in which a luminance value changes according to the sinusoidal wave function having the frequency and the direction set for the projection unit pixel.

8 . The device according to claim 7 , wherein, for each of the projection unit pixels, the setting unit calculates a plurality of directions of curvature of the object by using the distance and, from among the plurality of directions of curvature thus calculated, sets a predetermined direction of curvature as the direction of the sinusoidal wave function.

9 . The device according to claim 8 , wherein the predetermined direction of curvature is direction of the smallest curvature from among the plurality of directions of curvature.

10 . The device according to claim 2 , wherein the projection unit pixel represents a single pixel.

11 . The device according to claim 3 , wherein the image unit pixel represents a single pixel.

12 . The device according to claim 4 , wherein the unit period represents a single period.

13 . A measuring method comprising:
projecting, onto an object, a first pattern in which predetermined designs are distributed randomly and a second pattern in which a luminance value changes according to a sinusoidal wave function having a frequency; capturing a first image of the object onto which the first pattern is projected and a second image of the object onto which the second pattern is projected; calculating a distance to the object by using the first pattern and the first image; setting the frequency of a sinusoidal wave function by using the distance; and calculating a three-dimensional shape of the object by using the second pattern and the second image.

14 . A computer program product comprising a computer readable medium including programmed instructions, wherein the instructions, when executed by a computer, cause the computer to perform:
projecting, onto an object, a first pattern in which predetermined designs are distributed randomly and a second pattern in which a luminance value changes according to a sinusoidal wave function having a frequency; capturing a first image of the object onto which the first pattern is projected and a second image of the object onto which the second pattern is projected; calculating a distance to the object by using the first pattern and the first image; setting the frequency of a sinusoidal wave function by using the distance; and calculating a three-dimensional shape of the object by using the second pattern and the second image.

Assignees

• Toshiba Kk

Inventors

• Yamazaki Masaki

Classifications

• G01B11/2527 Primary

  with phase change by in-plane movement of the patern · CPC title

• G06V10/60

  relating to illumination properties, e.g. using a reflectance or lighting model · CPC title

• G06K9/468

  Physics · mapped topic

• G06T7/0042

  Physics · mapped topic

• H04N13/0203 Primary

  Electricity · mapped topic