Stress compensation for piezoelectric optical mems devices
US-2015378127-A1 · Dec 31, 2015 · US
US2015166327A1 · US · A1
| Field | Value |
|---|---|
| Publication number | US-2015166327-A1 |
| Application number | US-201514631064-A |
| Country | US |
| Kind code | A1 |
| Filing date | Feb 25, 2015 |
| Priority date | Jan 11, 2010 |
| Publication date | Jun 18, 2015 |
| Grant date | — |
A practical reading order for non-experts. Skip the full description unless you need deep technical detail.
What the patent document calls the invention.
A short plain-language summary of the technical disclosure.
Who owns or filed the patent and who is credited as inventor.
Filing, priority, publication, and grant dates set the timeline.
The legal scope of protection — read this for what is actually claimed.
Technology tags used to group this patent with similar filings.
Prior art links and similar publications in this corpus.
Official abstract text for this publication.
The micro-electromechanical semiconductor component is provided with a semiconductor substrate ( 4, 5 ), a reversibly deformable bending element ( 8 a ) made of semiconductor material, and at least one transistor that is sensitive to mechanical stresses, said transistor being designed as an integrated component in the bending element ( 8 a ). The transistor is arranged in an implanted active region pan ( 78 a ) that is made of a semiconductor material of a first conducting type and is introduced in the bending element ( 8 a ). Two mutually spaced, implanted drain and source regions ( 79, 80 ) made of a semiconductor material of a second conducting type are designed in the active region pan ( 78 a ), a channel region extending between said two regions. Implanted feed lines made of a semiconductor material of the second conducting type lead to the drain and source regions ( 79, 80 ). The upper face of the active region pan ( 78 a ) is covered by a gate oxide ( 81 a ). In the area of the channel region, a gate electrode ( 81 ) made of polysilicon is located on the gate oxide ( 81 a ), a feed line likewise made of polysilicon leading to said gate electrode.
Opening claim text (preview).
1 . A micro-electromechanical semiconductor component comprising: a semiconductor substrate; a reversibly deformable bending element made of semiconductor material; and at least one transistor being sensitive to mechanical stresses; wherein the transistor is designed as an integrated component in the bending element, wherein the transistor is arranged in an implanted active region well which is made of a semiconductor material of a first conducting type and is formed in the bending eleme…
Electricity · mapped topic
Electricity · mapped topic
Electricity · mapped topic
Operations & Transport · mapped topic
Operations & Transport · mapped topic
Related publications grouped by family.
Free tools are coming soon. Tell us what you want to track and we'll notify you.
Answers are generated from the same data shown on this page.