Temperature characteristic correction device, temperature characteristic correction formula determination method, electronic apparatus, and control circuit

US2015131695A1 · US · A1

Patent metadata
FieldValue
Publication numberUS-2015131695-A1
Application numberUS-201414539189-A
CountryUS
Kind codeA1
Filing dateNov 12, 2014
Priority dateNov 13, 2013
Publication dateMay 14, 2015
Grant date

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Abstract

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A temperature characteristic correction device corrects a temperature characteristic of an electronic device. The temperature characteristic correction device calculates a peak correction characteristic approximating a peak waveform having a peak value in a second range included in a first range of the temperature characteristic using a first formula, and a correction characteristic approximating a waveform continuing in the first range of the temperature characteristic using a second formula. The temperature characteristic correction device calculates a total correction amount from the peak correction characteristic and the correction characteristic, and then corrects the temperature characteristic using the total correction amount.

First claim

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What is claimed is: 1 . A temperature characteristic correction device adapted to correct a temperature characteristic of an electronic device, the temperature characteristic correction device calculating a peak correction characteristic approximating a peak waveform having a peak value in a second range included in a first range of the temperature characteristic using a first formula, and a correction characteristic approximating a waveform continuing in the first range of the temperature characteristic using a second formula; calculating a total correction amount from the peak correction characteristic and the correction characteristic; and correcting the temperature characteristic using the total correction amount. 2 . The temperature characteristic correction device according to claim 1 , wherein the temperature characteristic correction device receives a parameter signal for identifying temperature, calculates the total correction amount in accordance with the temperature, and corrects the temperature characteristic. 3 . The temperature characteristic correction device according to claim 1 , wherein the first formula is an exponential function. 4 . The temperature characteristic correction device according to claim 1 , wherein the second formula is a polynomial. 5 . The temperature characteristic correction device according to claim 1 , wherein in a case in which a plurality of the peak waveforms exist in the first range, the peak correction characteristics are separately set using the first formula in a descending order of a ratio of a height of the peak to a width of the peak. 6 . The temperature characteristic correction device according to claim 1 , wherein the temperature characteristic correction device performs a filtering process on the temperature characteristic of the electronic device to separate the waveform continuing in the first range and the peak waveform from each other, and calculates the peak correction characteristic using the first formula based on the peak waveform separated. 7 . An electronic device comprising: the temperature characteristic correction device according to claim 1 incorporated in the electronic device. 8 . An electronic apparatus comprising: the electronic device according to claim 7 . 9 . A moving object comprising: the electronic device according to claim 7 . 10 . A temperature characteristic correction formula determination method comprising: changing temperature to identify a temperature characteristic of an electronic device; obtaining a peak correction characteristic by approximating a peak waveform having a peak value in a second range included in a first range of the temperature characteristic using a first formula; obtaining a correction characteristic by approximating a waveform continuing in the first range of the temperature characteristic using a second formula; and obtaining a computational formula for calculating a total correction amount from the peak correction characteristic and the correction characteristic. 11 . A control circuit adapted to correct a temperature characteristic of an electronic device, the control circuit calculating a peak correction characteristic approximating a peak waveform having a peak value in a second range included in a first range of the temperature characteristic using a first formula, and a correction characteristic approximating a waveform continuing in the first range of the temperature characteristic using a second formula; calculating a total correction amount from the peak correction characteristic and the correction characteristic; and correcting the temperature characteristic using the total correction amount.

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Classifications

  • Signal processing not specific to any of the devices covered by groups G01C19/5607 - G01C19/5719 · CPC title

  • G01K15/005Primary

    Calibration · CPC title

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What does patent US2015131695A1 cover?
A temperature characteristic correction device corrects a temperature characteristic of an electronic device. The temperature characteristic correction device calculates a peak correction characteristic approximating a peak waveform having a peak value in a second range included in a first range of the temperature characteristic using a first formula, and a correction characteristic approximati…
Who is the assignee on this patent?
Seiko Epson Corp
What technology area does this patent fall under?
Primary CPC classification G01C19/5776. Mapped technology areas include Physics.
When was this patent published?
Publication date Thu May 14 2015 00:00:00 GMT+0000 (Coordinated Universal Time) (A1). Legal status and post-grant events are not shown on this page.
What related patents are in patentsdb?
We list 8 related publications on this page (citations in our corpus or others sharing the same primary CPC).