Probes for electrical testing in defect detection systems
US-2024094285-A1 · Mar 21, 2024 · US
US2015114685A1 · US · A1
| Field | Value |
|---|---|
| Publication number | US-2015114685-A1 |
| Application number | US-201314063242-A |
| Country | US |
| Kind code | A1 |
| Filing date | Oct 25, 2013 |
| Priority date | Oct 25, 2013 |
| Publication date | Apr 30, 2015 |
| Grant date | — |
A practical reading order for non-experts. Skip the full description unless you need deep technical detail.
What the patent document calls the invention.
A short plain-language summary of the technical disclosure.
Who owns or filed the patent and who is credited as inventor.
Filing, priority, publication, and grant dates set the timeline.
The legal scope of protection — read this for what is actually claimed.
Technology tags used to group this patent with similar filings.
Prior art links and similar publications in this corpus.
Official abstract text for this publication.
A test and measurement probe connection system including an interposer, at least one probe tab connected to the interposer, and a connector that is releasably connectable to the at least one probe tab to measure signals from the interposer.
Opening claim text (preview).
What is claimed is: 1 . A test and measurement probe connection system, comprising: an interposer; at least one probe tab connected to the interposer; and a connector that is releasably connectable to the at least one probe tab to measure signals from the interposer. 2 . The test and measurement probe connection system of claim 1 , further comprising at least two probe tabs connected to the interposer. 3 . The test and measureme…
Physics · mapped topic
Physics · mapped topic
Physics · mapped topic
Electricity · mapped topic
Related publications grouped by family.
Free tools are coming soon. Tell us what you want to track and we'll notify you.
Answers are generated from the same data shown on this page.