Structure analyzing device and a structure analyzing method

US2015114121A1 · US · A1

Patent metadata
FieldValue
Publication numberUS-2015114121-A1
Application numberUS-201314405902-A
CountryUS
Kind codeA1
Filing dateJan 11, 2013
Priority dateJun 6, 2012
Publication dateApr 30, 2015
Grant date

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Abstract

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An object of the invention is to provide a structure analyzing device and a structure analyzing method which can analyze a state change of a structure, which is caused before the structure is destroyed, such as a state change of degradation of the structure or the like. A structure analyzing device ( 10 ) according to the present invention includes a vibration detecting means ( 11 ) which detects a vibration of a structure, and an analysis means ( 12 ) which analyzes an output signal of the vibration detecting means ( 11 ). The analysis means ( 12 ) analyzes a state change of the structure by comparing a value of at least one out of a vibration amplitude of the structure and a vibration continuation time of the structure, which is measured in a state existing when carrying out analysis, with a value of at least one out of a vibration amplitude of the water service pipe and a vibration continuation time of the water service pipe which is measured in a standard state.

First claim

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1 . A structure analyzing device, comprising: a vibration detecting unit which detects a vibration of a structure; and an analysis unit which analyzes an output signal of the vibration detecting unit, wherein the analysis unit analyzes a state change of the structure by comparing a value of at least one out of a vibration amplitude of the structure and a vibration continuation time of the structure, which is measured in a state existing when carrying out analysis, with a value of at least one…

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What does patent US2015114121A1 cover?
An object of the invention is to provide a structure analyzing device and a structure analyzing method which can analyze a state change of a structure, which is caused before the structure is destroyed, such as a state change of degradation of the structure or the like. A structure analyzing device ( 10 ) according to the present invention includes a vibration detecting means ( 11 ) which detec…
Who is the assignee on this patent?
Takahashi Masatake, Shinoda Shigeki, Sasaki Yasuhiro, and 1 more
What technology area does this patent fall under?
Primary CPC classification G01N29/12. Mapped technology areas include Physics.
When was this patent published?
Publication date Thu Apr 30 2015 00:00:00 GMT+0000 (Coordinated Universal Time) (A1). Legal status and post-grant events are not shown on this page.
What related patents are in patentsdb?
We list 8 related publications on this page (citations in our corpus or others sharing the same primary CPC).