Interposer Test Structures and Methods
US-2015380324-A1 · Dec 31, 2015 · US
Probe card for an apparatus for testing electronic devices
US2015048856A1 · US · A1
| Field | Value |
|---|---|
| Publication number | US-2015048856-A1 |
| Application number | US-201414528774-A |
| Country | US |
| Kind code | A1 |
| Filing date | Oct 30, 2014 |
| Priority date | Jun 8, 2012 |
| Publication date | Feb 19, 2015 |
| Grant date | — |
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- Title
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Abstract
Official abstract text for this publication.
A probe card for an apparatus for testing electronic devices comprises at least one probe head, a plurality of contact probes housed within the probe head, each contact probe having at least one contact tip suitable to abut against contact pads of a device to be tested, a supporting plate of the probe head, an interface plate, a stiffener associating the supporting plate and the interface plate, a plurality of connecting elements with clearance disposed between the supporting plate and the interface plate and housed in a floating manner in a plurality of respective seats made in the supporting plate, and a plurality of connecting elements without clearance disposed between the interface plate and the stiffener.
First claim
Opening claim text (preview).
1 . A probe card for a testing apparatus for testing electronic devices, comprising: a probe head, a plurality of contact probes housed within the probe head, each contact probe having at least one contact tip suitable to abut against a contact pad of a device to be tested, a supporting plate configured to support the probe head, an interface plate, a stiffener associated with the supporting plate and the interface plate, a plurality of connecting elements with clearance disposed betw…
Assignees
Inventors
Classifications
- G01R1/07378Primary
Physics · mapped topic
Physics · mapped topic
Physics · mapped topic
- G01R1/073Primary
Physics · mapped topic
Physics · mapped topic
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Frequently asked questions
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- What does patent US2015048856A1 cover?
- A probe card for an apparatus for testing electronic devices comprises at least one probe head, a plurality of contact probes housed within the probe head, each contact probe having at least one contact tip suitable to abut against contact pads of a device to be tested, a supporting plate of the probe head, an interface plate, a stiffener associating the supporting plate and the interface plate…
- Who is the assignee on this patent?
- Technoprobe Spa
- What technology area does this patent fall under?
- Primary CPC classification G01R1/07378. Mapped technology areas include Physics.
- When was this patent published?
- Publication date Thu Feb 19 2015 00:00:00 GMT+0000 (Coordinated Universal Time) (A1). Legal status and post-grant events are not shown on this page.
- What related patents are in patentsdb?
- We list 8 related publications on this page (citations in our corpus or others sharing the same primary CPC).