Optical tuning test system using parallel oven pipelines with parallel instrument channels and machine learning assistance

Patent metadata

Field	Value
Publication number	US-12596145-B2
Application number	US-202418756281-A
Country	US
Kind code	B2
Filing date	Jun 27, 2024
Priority date	Mar 30, 2022
Publication date	Apr 7, 2026
Grant date	Apr 7, 2026

Abstract

A test system includes a test and measurement instrument, ovens to hold devices under test (DUT), each oven having an oven switch selectably connected to the DUTs, channel switches selectably connected to the oven switches and to one channel of the instrument, one or more processors to: select an oven and its oven switch, connect that oven switch to a subset of DUTs in that oven, connect the channel switches to that oven switch to receive signals from the subset of DUTs, send the signals to channels of the instrument to acquire waveforms from the subset of DUTs in parallel, and repeat connecting of the channel switches and that oven switch until the instrument has acquired waveforms from each DUT in that oven, use machine learning to tune each DUT, test whether each DUT in that oven is optimally tuned, and repeat until all DUTs have been tuned and tested.

First claim

The invention claimed is:

1 . A test system, comprising:
a test and measurement instrument having a number of channels;
ovens configured to hold a number of devices under test (DUT);
oven switches, each oven switch selectably connected to the DUTs in a dedicated oven;
channel switches selectably connected to the oven switches, each channel switch connected to one channel of the test and measurement instrument;
one or more processors configured to execute code that…

Assignees

• Tektronix Inc

Inventors

• Pickerd John J
• Smith Evan Douglas

Classifications

• G01R31/31908

  Physics · mapped topic

• G01R31/2868

  Physics · mapped topic

• G01R31/2874

  Physics · mapped topic

• G01R31/2862 Primary

  Physics · mapped topic

• G01R31/2834 Primary

  Physics · mapped topic