Strain gauge

Patent metadata

Field	Value
Publication number	US-12595998-B2
Application number	US-202118255739-A
Country	US
Kind code	B2
Filing date	Dec 3, 2021
Priority date	Dec 11, 2020
Publication date	Apr 7, 2026
Grant date	Apr 7, 2026

Abstract

According to the present disclosure, a strain gauge has: a flexible substrate; a resistor formed on the substrate; and a pair of electrodes formed on the substrate and electrically connected with the resistor via conductive traces, and, in this strain gauge, a width of the resistor is 10 μm or more and 100 μm or less, and the conductive traces include a portion with a width of 5 μm or more and 100 μm or less.

First claim

The invention claimed is:

1 . A strain gauge comprising:
a flexible substrate; a resistor formed on the substrate; and a pair of electrodes formed on the substrate and electrically connected with the resistor via conductive traces, wherein a width of the resistor is 10 μm or more and 100 μm or less, wherein a width of each of the conductive traces is 5 μm or more and 100 μm or less, and each of the conductive traces includes a portion having a width smaller than the width of the resistor.

2 . The strain gauge according to claim 1 , wherein a strain limit is 8,000 us or more.

3 . The strain gauge according to claim 1 , wherein the conductive traces electrically connect each end of the resistor in a grid width direction with a corresponding one of the pair of electrodes.

4 . The strain gauge according to claim 3 ,
wherein the conductive traces include:
a first conductive trace that electrically connects one end of the resistor in the grid width direction with one of the pair of electrodes; and
a second conductive trace that electrically connects the other end of the resistor in the grid width direction and the other one of the pair of electrodes, and
wherein an entirety of the first conductive trace and an entirety of the second conductive trace have the width of 5 μm or more and 100 μm or less.

5 . A strain gauge comprising:
a flexible substrate; a resistor formed on the substrate; and a pair of electrodes formed on the substrate and electrically connected with the resistor via conductive traces, wherein the conductive traces further include:
two or more first conductive traces that electrically connect one end of the resistor in a grid width direction with one of the pair of electrodes; and
two or more second conductive traces that electrically connect another end of the resistor in the grid width direction with another one of the pair of electrodes, and
wherein an entirety of each first conductive trace and an entirety of each second conductive trace have a width of 5 μm or more and 100 μm or less.

6 . A strain gauge comprising:
a flexible substrate; a resistor formed on the substrate; and a pair of electrodes formed on the substrate and electrically connected with the resistor via conductive traces, wherein the conductive traces further include:
a first conductive trace that electrically connects one end of the resistor in a grid width direction with one of the pair of electrodes; and
a second conductive trace that electrically connects another end of the resistor in the grid width direction with another one of the pair of electrodes,
wherein the first conductive trace includes:
one thick portion, one end of which is electrically connected to the one end of the resistor in the grid width direction; and
two or more thin portions that branch from another end of the thick portion and that are electrically connected to the one of the pair of electrodes,
wherein the second conductive trace includes:
one thick portion, one end of which is electrically connected to the another end of the resistor in the grid width direction; and
two or more thin portions that branch from another end of the thick portion and that are electrically connected to the another one of the pair of electrodes, and
wherein an entirety of each thin portion has a width of 5 μm or more and 100 μm or less.

7 . The strain gauge according to claim 6 , wherein an entirety of the thick portion has a width greater than 100 μm.

8 . The strain gauge according to claim 1 , wherein the conductive traces are formed integrally with the resistor by using a same material.

9 . The strain gauge according to claim 1 , wherein the resistor is formed with a film containing Cr, CrN, and Cr 2 N.

10 . The strain gauge according to claim 9 , wherein a gauge factor is 10 or more.

11 . The strain gauge according to claim 9 , wherein the CrN and the Cr 2 N contained in the resistor are 20% or less by weight.

12 . The strain gauge according to claim 11 , wherein a proportion of the Cr 2 N in the CrN and the Cr 2 N is 80% or more by weight and less than 90% by weight.

Assignees

• Minebea Mitsumi Inc

Inventors

• Ishihara Iku
• Ono Aya
• Ogasa Yosuke
• Aizawa Yuta
• Asakawa Toshiaki
• Kitamura Atsushi

Classifications

• G01B7/20 Primary

  formed by printed-circuit technique · CPC title