Temperature correction circuit and method of operating a power amplifier
US-11251752-B2 · Feb 15, 2022 · US
US12587144B2 · US · B2
| Field | Value |
|---|---|
| Publication number | US-12587144-B2 |
| Application number | US-202318144803-A |
| Country | US |
| Kind code | B2 |
| Filing date | May 8, 2023 |
| Priority date | May 8, 2023 |
| Publication date | Mar 24, 2026 |
| Grant date | Mar 24, 2026 |
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Embodiments of self-heating tracking circuits for a power amplifier (PA) are disclosed. In an embodiment, a self-heating tracking circuit for a PA includes a PA replica circuit in proximity to the PA and an estimation unit configured to estimate a self-heating time constant of the PA in response to turning on the PA replica circuit and turning off the PA replica circuit.
Opening claim text (preview).
What is claimed is: 1 . A self-heating tracking circuit for a power amplifier (PA), the self-heating tracking circuit comprising: a PA replica circuit in proximity to the PA; and an estimation unit configured to estimate a self-heating time constant of the PA in response to turning on the PA replica circuit and turning off the PA replica circuit. 2 . The self-heating tracking circuit of claim 1 , wherein the PA is a fin field-effect transistor (FinFET) device. 3 . The self-heating tracking circuit of claim 1 , wherein the PA is a silicon on insulator (SOI) device. 4 . The self-heating tracking circuit of claim 1 , wherein the PA replica circuit is located within one micrometer (μm) of the PA such that a temperature of the PA replica circuit tracks with a temperature of the PA. 5 . The self-heating tracking circuit of claim 1 , wherein the PA replica circuit comprises a first transistor in proximity to a second transistor of the PA. 6 . The self-heating tracking circuit of claim 5 , wherein the first transistor is located within one hundred nanometers (nm) of the second transistor of the PA such that a temperature of the PA replica circuit tracks with a temperature of the PA. 7 . The self-heating tracking circuit of claim 5 , wherein the PA replica circuit further comprises a third transistor connected to the first transistor and configured to be turned on or off. 8 . The self-heating tracking circuit of claim 1 , wherein the estimation unit is further configured to estimate the self-heating time constant of the PA in response to turning on the PA replica circuit and turning off the PA replica circuit using a first order single-pole model. 9 . The self-heating tracking circuit of claim 1 , wherein the estimation unit is further configured to estimate the self-heating time constant of the PA in response to turning on the PA replica circuit and turning off the PA replica circuit using a rising step response model. 10 . The self-heating tracking circuit of claim 1 , wherein the estimation unit is further configured to estimate the self-heating time constant of the PA in response to turning on the PA replica circuit and turning off the PA replica circuit using a falling step response model. 11 . The self-heating tracking circuit of claim 1 , further comprising a bias circuit connected between the PA and the PA replica circuit. 12 . The self-heating tracking circuit of claim 11 , wherein the bias circuit comprises: a first current source connected to a first voltage; a first transistor connected to the first current source and to the first voltage; a second transistor connected to the first current source; and a third transistor connected to the second transistor and to a reference voltage. 13 . The self-heating tracking circuit of claim 12 , wherein the bias circuit further comprises: a second current source connected to the first transistor and to the reference voltage; and a transformer connected to the third transistor and to the PA. 14 . A self-heating tracking circuit for a fin field-effect transistor (FinFET) power amplifier (PA), the self-heating tracking circuit comprising: a PA replica circuit in proximity to the FinFET PA, wherein a temperature of the PA replica circuit tracks with a temperature of the FinFET PA; and an estimation unit configured to estimate a self-heating time constant of the FinFET PA in response to turning on the PA replica circuit and turning off the PA replica circuit. 15 . The self-heating tracking circuit of claim 14 , wherein the PA replica circuit is located within one hundred nanometers (nm) of the FinFET PA. 16 . The self-heating tracking circuit of claim 14 , wherein the PA replica circuit comprises: a first transistor in proximity to a second transistor of the FinFET PA; and a third transistor connected to the first transistor and configured to be turned on or off. 17 . The self-heating tracking circuit of claim 14 , wherein the estimation unit is further configured to estimate the self-heating time constant of the FinFET PA in response to turning on the PA replica circuit and turning off the PA replica circuit using a first order single-pole model. 18 . The self-heating tracking circuit of claim 14 , further comprising a bias circuit connected between the FinFET PA and the PA replica circuit. 19 . A self-heating tracking circuit for a power amplifier (PA), the self-heating tracking circuit comprising: a PA replica circuit located within one micrometer (μm) of the PA such that a temperature of the PA replica circuit tracks with a temperature of the PA, wherein the PA is a fin field-effect transistor (FinFET) device or a silicon on insulator (SOI) device; and an estimation unit configured to estimate a self-heating time constant of the PA in response to turning on the PA replica circuit and turning off the PA replica circuit. 20 . The self-heating tracking circuit of claim 19 , wherein the estimation unit is further configured to estimate the self-heating time constant of the PA in response to turning on the PA replica circuit and turning off the PA replica circuit using a first order single-pole model.
with semiconductor devices only {(H03F3/245 takes precedence)} · CPC title
the amplifier being protected to temperature influence · CPC title
the amplifier being a radio frequency amplifier · CPC title
in MOSFET amplifiers (H03F1/303, H03F1/305, H03F1/308 take precedence) · CPC title
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