Power amplifier (PA) self-heating tracking for with self-heating time constant estimation

US12587144B2 · US · B2

Patent metadata
FieldValue
Publication numberUS-12587144-B2
Application numberUS-202318144803-A
CountryUS
Kind codeB2
Filing dateMay 8, 2023
Priority dateMay 8, 2023
Publication dateMar 24, 2026
Grant dateMar 24, 2026

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  1. Title

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  2. Abstract

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  3. Assignees and inventors

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  4. Key dates

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  5. First independent claim

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  6. CPC / IPC classifications

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  7. Citations and related patents

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Abstract

Official abstract text for this publication.

Embodiments of self-heating tracking circuits for a power amplifier (PA) are disclosed. In an embodiment, a self-heating tracking circuit for a PA includes a PA replica circuit in proximity to the PA and an estimation unit configured to estimate a self-heating time constant of the PA in response to turning on the PA replica circuit and turning off the PA replica circuit.

First claim

Opening claim text (preview).

What is claimed is: 1 . A self-heating tracking circuit for a power amplifier (PA), the self-heating tracking circuit comprising: a PA replica circuit in proximity to the PA; and an estimation unit configured to estimate a self-heating time constant of the PA in response to turning on the PA replica circuit and turning off the PA replica circuit. 2 . The self-heating tracking circuit of claim 1 , wherein the PA is a fin field-effect transistor (FinFET) device. 3 . The self-heating tracking circuit of claim 1 , wherein the PA is a silicon on insulator (SOI) device. 4 . The self-heating tracking circuit of claim 1 , wherein the PA replica circuit is located within one micrometer (μm) of the PA such that a temperature of the PA replica circuit tracks with a temperature of the PA. 5 . The self-heating tracking circuit of claim 1 , wherein the PA replica circuit comprises a first transistor in proximity to a second transistor of the PA. 6 . The self-heating tracking circuit of claim 5 , wherein the first transistor is located within one hundred nanometers (nm) of the second transistor of the PA such that a temperature of the PA replica circuit tracks with a temperature of the PA. 7 . The self-heating tracking circuit of claim 5 , wherein the PA replica circuit further comprises a third transistor connected to the first transistor and configured to be turned on or off. 8 . The self-heating tracking circuit of claim 1 , wherein the estimation unit is further configured to estimate the self-heating time constant of the PA in response to turning on the PA replica circuit and turning off the PA replica circuit using a first order single-pole model. 9 . The self-heating tracking circuit of claim 1 , wherein the estimation unit is further configured to estimate the self-heating time constant of the PA in response to turning on the PA replica circuit and turning off the PA replica circuit using a rising step response model. 10 . The self-heating tracking circuit of claim 1 , wherein the estimation unit is further configured to estimate the self-heating time constant of the PA in response to turning on the PA replica circuit and turning off the PA replica circuit using a falling step response model. 11 . The self-heating tracking circuit of claim 1 , further comprising a bias circuit connected between the PA and the PA replica circuit. 12 . The self-heating tracking circuit of claim 11 , wherein the bias circuit comprises: a first current source connected to a first voltage; a first transistor connected to the first current source and to the first voltage; a second transistor connected to the first current source; and a third transistor connected to the second transistor and to a reference voltage. 13 . The self-heating tracking circuit of claim 12 , wherein the bias circuit further comprises: a second current source connected to the first transistor and to the reference voltage; and a transformer connected to the third transistor and to the PA. 14 . A self-heating tracking circuit for a fin field-effect transistor (FinFET) power amplifier (PA), the self-heating tracking circuit comprising: a PA replica circuit in proximity to the FinFET PA, wherein a temperature of the PA replica circuit tracks with a temperature of the FinFET PA; and an estimation unit configured to estimate a self-heating time constant of the FinFET PA in response to turning on the PA replica circuit and turning off the PA replica circuit. 15 . The self-heating tracking circuit of claim 14 , wherein the PA replica circuit is located within one hundred nanometers (nm) of the FinFET PA. 16 . The self-heating tracking circuit of claim 14 , wherein the PA replica circuit comprises: a first transistor in proximity to a second transistor of the FinFET PA; and a third transistor connected to the first transistor and configured to be turned on or off. 17 . The self-heating tracking circuit of claim 14 , wherein the estimation unit is further configured to estimate the self-heating time constant of the FinFET PA in response to turning on the PA replica circuit and turning off the PA replica circuit using a first order single-pole model. 18 . The self-heating tracking circuit of claim 14 , further comprising a bias circuit connected between the FinFET PA and the PA replica circuit. 19 . A self-heating tracking circuit for a power amplifier (PA), the self-heating tracking circuit comprising: a PA replica circuit located within one micrometer (μm) of the PA such that a temperature of the PA replica circuit tracks with a temperature of the PA, wherein the PA is a fin field-effect transistor (FinFET) device or a silicon on insulator (SOI) device; and an estimation unit configured to estimate a self-heating time constant of the PA in response to turning on the PA replica circuit and turning off the PA replica circuit. 20 . The self-heating tracking circuit of claim 19 , wherein the estimation unit is further configured to estimate the self-heating time constant of the PA in response to turning on the PA replica circuit and turning off the PA replica circuit using a first order single-pole model.

Assignees

Inventors

Classifications

  • with semiconductor devices only {(H03F3/245 takes precedence)} · CPC title

  • the amplifier being protected to temperature influence · CPC title

  • the amplifier being a radio frequency amplifier · CPC title

  • H03F1/301Primary

    in MOSFET amplifiers (H03F1/303, H03F1/305, H03F1/308 take precedence) · CPC title

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What does patent US12587144B2 cover?
Embodiments of self-heating tracking circuits for a power amplifier (PA) are disclosed. In an embodiment, a self-heating tracking circuit for a PA includes a PA replica circuit in proximity to the PA and an estimation unit configured to estimate a self-heating time constant of the PA in response to turning on the PA replica circuit and turning off the PA replica circuit.
Who is the assignee on this patent?
Nxp Usa Inc
What technology area does this patent fall under?
Primary CPC classification H03F1/301. Mapped technology areas include Electricity.
When was this patent published?
Publication date Tue Mar 24 2026 00:00:00 GMT+0000 (Coordinated Universal Time) (B2). Legal status and post-grant events are not shown on this page.
What related patents are in patentsdb?
We list 3 related publications on this page (citations in our corpus or others sharing the same primary CPC).