Fast computational phase and timing correction for multiheterodyne spectroscopy
US-2020109988-A1 · Apr 9, 2020 · US
Method and apparatus for measuring a time delay between pairs of pulses from laser pulse sequences, and applications thereof
US12586977B2 · US · B2
| Field | Value |
|---|---|
| Publication number | US-12586977-B2 |
| Application number | US-202018268710-A |
| Country | US |
| Kind code | B2 |
| Filing date | Dec 22, 2020 |
| Priority date | Dec 22, 2020 |
| Publication date | Mar 24, 2026 |
| Grant date | Mar 24, 2026 |
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Abstract
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A laser pulse sequence measuring method for measuring a delay between a pair of pulses from two laser pulse sequences ( 1, 2 ), comprises the steps of creating a first laser pulse sequence ( 1 ) of first laser pulses ( 1 A) and a second laser pulse sequence ( 2 ) of second laser pulses ( 2 A), and generating a delay signal ( 3 ) which represents the delay between the pair of pulses from the first and second laser pulse sequences ( 1, 2 ), wherein the step of generating the delay signal ( 3 ) includes creating intra-pulse difference frequency generation (IPDFG) pulses ( 4 ) by applying intra-pulse difference frequency generation to the first laser pulses ( 1 A) in a difference frequency generation (DFG) medium ( 21 ), providing phase-stable reference waveforms ( 5 ) based on the IPDFG pulses ( 4 ), and electro-optic sampling (EOS) of the electric field of the phase-stable reference waveforms ( 5 ) with sampling pulses ( 6 ) in an EOS medium ( 22 ), wherein the sampling pulses ( 6 ) are created based on the second laser pulses ( 2 A), for generating an electro-optic sampling (EOS) signal ( 7 ), wherein the delay signal ( 3 ) is obtained from the EOS signal ( 7 ). Furthermore, a spectroscopic measuring method, a laser pulse sequence measuring apparatus ( 100 ) and a spectroscopic measuring apparatus are described.
First claim
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The invention claimed is: 1 . A laser pulse sequence measuring method for tracking a delay between a pair of pulses from two laser pulse sequences, said delay comprising a temporal separation between the pulses of said pair of pulses, said method comprising the steps of creating a first laser pulse sequence of first laser pulses and a second laser pulse sequence of second laser pulses, and generating a delay signal which is a quantitative measure of the delay between the pair of pulses from the first and second laser pulse sequences, wherein the step of generating the delay signal includes creating intra-pulse difference frequency generation pulses by applying intra-pulse difference frequency generation to the first laser pulses in a difference frequency generation medium, providing phase-stable reference waveforms based on the intra-pulse difference frequency generation pulses, and electro-optic sampling an electric field of the phase-stable reference waveforms with sampling pulses in an electro-optic sampling medium, wherein the sampling pulses are created based on the second laser pulses, for generating an electro-optic sampling signal, wherein the delay signal is obtained from the electro-optic sampling signal. 2 . The laser pulse sequence measuring method according to claim 1 , wherein the phase-stable reference waveforms are created by a bandwidth reduction of the intra-pulse difference frequency generation pulses. 3 . The laser pulse sequence measuring method according to claim 2 , wherein the bandwidth reduction is created with the intra-pulse difference frequency generation. 4 . The laser pulse sequence measuring method according to claim 3 , wherein the bandwidth reduction is created with the intra-pulse difference frequency generation by at least one of shaping the first laser pulses, setting phase matching conditions in the difference frequency generation medium and shaping the difference frequency generation medium. 5 . The laser pulse sequence measuring method according to claim 2 , wherein the bandwidth reduction is created after the intra-pulse difference frequency generation by filtering the intra-pulse difference frequency generation pulses. 6 . The laser pulse sequence measuring method according to claim 1 , wherein the phase-stable reference waveforms are created by applying a time chirp to the intra-pulse difference frequency generation pulses. 7 . The laser pulse sequence measuring method according to claim 1 , wherein the phase-stable reference waveforms are provided by a coherent sample resonance response being created via irradiating a resonant sample with the intra-pulse difference frequency generation pulses. 8 . The laser pulse sequence measuring method according to claim 1 , wherein the phase-stable reference waveforms are provided directly by the intra-pulse difference frequency generation pulses. 9 . The laser pulse sequence measuring method according to claim 1 , wherein the delay signal is obtained from zero-crossing sections of the electro-optic sampling signal. 10 . The laser pulse sequence measuring method according to claim 9 , wherein for the first and second laser pulse sequences having a periodic delay axis, with a period for a delay recurrence rate being an integer multiple n of a pulse-to-pulse delay, the delay signal is obtained as a downsampled delay signal by sampling the electro-optic sampling signal at zero-crossing sections thereof with the delay recurrence rate. 11 . The laser pulse sequence measuring method according to claim 1 , wherein the sampling pulses are provided directly by the second laser pulses or by compressing the second laser pulses. 12 . The laser pulse sequence measuring method according to claim 1 , wherein the phase-stable reference waveforms are at least one of infrared, mid-infrared, near-infrared and visible pulses. 13 . The laser pulse sequence measuring method according to claim 1 , wherein the phase-stable reference waveforms are THz pulses. 14 . The laser pulse sequence measuring method according to claim 1 , wherein the difference frequency generation medium and the electro-optic sampling medium comprise two optically non-linear crystals. 15 . The laser pulse sequence measuring method according to claim 1 , wherein a single optically non-linear crystal is used for providing both of the difference frequency generation medium and the electro-optic sampling medium. 16 . The laser pulse sequence measuring method according to claim 1 , wherein the delay signal is used for feedback-controlling a repetition frequency of at least one of the first and second laser pulse sequences. 17 . The laser pulse sequence measuring method according to claim 16 , wherein the delay signal is used for feedback-controlling the repetition frequency of at least one of the first and second laser pulse sequences so that they have equal repetition frequencies. 18 . The laser pulse sequence measuring method according to claim 16 , wherein the delay signal is used for feedback-controlling the repetition frequency of at least one of the first and second laser pulse sequences so that they have detuned repetition frequencies with a detuning Δf. 19 . The laser pulse sequence measuring method according to claim 16 , wherein for the first and second laser pulse sequences having a periodic delay axis, with a period for a delay recurrence rate being an integer multiple n of a pulse-to-pulse delay, the delay signal is obtained by sampling the electro-optic sampling signal at zero-crossing sections thereof with a delay recurrence rate and the delay signal is used for PID feedback-controlling the repetition frequency of at least one of the first and second laser pulse sequences. 20 . A spectroscopic measuring method including a time domain spectroscopic measurement, wherein the laser pulse sequence measuring method of claim 1 is executed, and the first and second laser pulse sequences are used for the time domain spectroscopic measurement. 21 . The spectroscopic measuring method according to claim 20 , wherein the delay signal is used for creating a delay axis for the time domain spectroscopic measurement. 22 . The spectroscopic measuring method according to claim 21 , wherein the second laser pulse sequence is subjected to a delay modulation of the delay relative to the first laser pulse sequence. 23 . The spectroscopic measuring method according to claim 21 , wherein the second laser pulse sequence is subjected to a repetition frequency modulation relative to the first laser pulse sequence. 24 . The spectroscopic measuring method according to claim 21 , wherein the delay signal is used for post-processing output data of the time domain spectroscopic measurement. 25 . A laser pulse sequence measuring apparatus being configured for tracking a delay between a pair of pulses from two laser pulse sequences, said delay comprising a temporal separation between the pulses of said pair of pulses, said apparatus comprising at least one pulse laser source device being arranged for creating a first laser pulse sequence of first laser pulses and a second laser pulse sequence of second laser pulses, and a delay signal generation device being arranged for generating a delay signal which is a quantitative measure of the delay between the pair of pulses from the first and second laser pul
Assignees
Inventors
Classifications
Feedback control systems · CPC title
Frequency filtering · CPC title
Temporal shaping, e.g. pulse compression, frequency chirping (soliton generation and propagation G02F1/3513, H01S3/063 and H01S3/108) · CPC title
by Terahertz time domain spectroscopy [THz-TDS] · CPC title
using infrared light (G01N21/39 takes precedence) · CPC title
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- What does patent US12586977B2 cover?
- A laser pulse sequence measuring method for measuring a delay between a pair of pulses from two laser pulse sequences ( 1, 2 ), comprises the steps of creating a first laser pulse sequence ( 1 ) of first laser pulses ( 1 A) and a second laser pulse sequence ( 2 ) of second laser pulses ( 2 A), and generating a delay signal ( 3 ) which represents the delay between the pair of pulses from the fir…
- Who is the assignee on this patent?
- Max Planck Gesellschaft, Univ Muenchen Ludwig Maximilians
- What technology area does this patent fall under?
- Primary CPC classification H01S3/1307. Mapped technology areas include Electricity.
- When was this patent published?
- Publication date Tue Mar 24 2026 00:00:00 GMT+0000 (Coordinated Universal Time) (B2). Legal status and post-grant events are not shown on this page.
- What related patents are in patentsdb?
- We list 4 related publications on this page (citations in our corpus or others sharing the same primary CPC).