Method for reconstructing three-dimensional object combining structured light and photometry and terminal device

US12586223B2 · US · B2

Patent metadata
FieldValue
Publication numberUS-12586223-B2
Application numberUS-202017927692-A
CountryUS
Kind codeB2
Filing dateNov 17, 2020
Priority dateJul 28, 2020
Publication dateMar 24, 2026
Grant dateMar 24, 2026

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Abstract

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The present application is applicable to the technical field of computer vision, and provides a method for reconstructing a three-dimensional object combining structured light and photometry and a terminal device, wherein the method comprises: acquiring N first images, wherein each first image is obtained by shooting after a coded pattern having a coding stripe sequence is projected to a three-dimensional object, and N is a positive integer; determining structured light depth information of the three-dimensional object based on the N first images; acquiring M second images, wherein the M second images are obtained by shooting after P light sources are respectively projected to the three-dimensional object from different directions, and M and P are positive integers; determining photometric information of the three-dimensional object based on the M second images; and reconstructing the three-dimensional object based on the structured light depth information and the photometric information. Therefore, the structured light system and the photometric system are combined to reconstruct the three-dimensional object, and the precision of a three-dimensional reconstruction result of the three-dimensional object with complex surfaces is improved.

First claim

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What is claimed is: 1 . A method for reconstructing a three-dimensional object combining structured light and photometry, comprising: acquiring N first images, wherein each first image is obtained by shooting after a coded pattern having a coding stripe sequence is projected to a three-dimensional object, and N is a positive integer; determining structured light depth information of the three-dimensional object based on the N first images; acquiring M second images, wherein the M second images are obtained by shooting after P light sources are respectively projected to the three-dimensional object from different directions, and M and P are positive integers; determining photometric information of the three-dimensional object based on the M second images; and reconstructing the three-dimensional object based on the structured light depth information and the photometric information, wherein reconstructing the three-dimensional object based on the structured light depth information and the photometric information comprises: iteratively calibrating the structured light depth information based on the photometric information to obtain calibration deviation information relative to the structured light depth information; determining whether the calibration deviation information meets a preset iteration termination condition or not; and if yes, reconstructing the three-dimensional object based on calibrated structured light depth information correspondingly meeting the iteration termination condition. 2 . The method for reconstructing a three-dimensional object combining structured light and photometry according to claim 1 , wherein prior to acquiring M second images, the method further comprises: determining positions and projection directions of the P light sources according to the structured light depth information. 3 . The method for reconstructing a three-dimensional object combining structured light and photometry according to claim 1 , wherein determining photometric information of the three-dimensional object based on the M second images specifically comprises: inputting the M second images into a reflection model matched with a target surface type of the three-dimensional object to output the photometric information of the three-dimensional object by the reflection model. 4 . The method for reconstructing a three-dimensional object combining structured light and photometry according to claim 1 , wherein the photometric information comprises a first photometric information and a second photometric information, wherein iteratively calibrating the structured light depth information based on the photometric information to obtain first calibration deviation information relative to the structured light depth information comprises: iteratively calibrating the structured light depth information based on the first photometric information to obtain first calibration deviation information relative to the structured light depth information; correspondingly, determining whether the calibration deviation information meets a preset iteration termination condition or not comprises: calibrating the second photometric information with the calibrated structured light depth information to obtain second calibration deviation information relative to the second photometric information; and determining whether the first calibration deviation information and the second calibration deviation information meet a preset deviation condition or not so as to correspondingly determine whether the calibration deviation information meets the preset iteration termination condition or not. 5 . The method for reconstructing a three-dimensional object combining structured light and photometry according to claim 4 , wherein the first photometric information is a reflectivity and the second photometric information is normal information. 6 . The method for reconstructing a three-dimensional object combining structured light and photometry according to claim 4 , wherein determining whether the first calibration deviation information and the second calibration deviation information meet a preset deviation condition or not comprises: determining target deviation information of a preset deviation weight allocation corresponding to the first calibration deviation information and the second calibration deviation information; and correspondingly determining whether the first calibration deviation information and the second calibration deviation information meet the preset deviation condition or not according to a comparison result of whether the target deviation information is smaller than preset deviation threshold information or not. 7 . The method for reconstructing a three-dimensional object combining structured light and photometry according to claim 1 , wherein iteratively calibrating the structured light depth information based on the photometric information comprises: inputting the photometric information and the structured light depth information into a depth information calibration model to correspondingly output the calibrated structured light depth information, wherein each training sample of a training sample set in the depth information calibration model comprises structured light depth information corresponding to Q pieces of photometric information, and Q is a positive integer.

Assignees

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Classifications

  • Projection of a pattern, viewing through a pattern, e.g. moiré · CPC title

  • relating to illumination properties, e.g. using a reflectance or lighting model · CPC title

  • Analysis of captured images to determine intrinsic or extrinsic camera parameters, i.e. camera calibration · CPC title

  • for measuring contours or curvatures · CPC title

  • using several gratings with variable grating pitch, projected on the object with the same angle of incidence · CPC title

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What does patent US12586223B2 cover?
The present application is applicable to the technical field of computer vision, and provides a method for reconstructing a three-dimensional object combining structured light and photometry and a terminal device, wherein the method comprises: acquiring N first images, wherein each first image is obtained by shooting after a coded pattern having a coding stripe sequence is projected to a three-…
Who is the assignee on this patent?
Shenzhen Inst Of Adv Tech Cas
What technology area does this patent fall under?
Primary CPC classification G06T7/521. Mapped technology areas include Physics.
When was this patent published?
Publication date Tue Mar 24 2026 00:00:00 GMT+0000 (Coordinated Universal Time) (B2). Legal status and post-grant events are not shown on this page.
What related patents are in patentsdb?
We list 8 related publications on this page (citations in our corpus or others sharing the same primary CPC).