Light intensity distribution pattern measuring device and method

US12584818B2 · US · B2

Patent metadata
FieldValue
Publication numberUS-12584818-B2
Application numberUS-202118685766-A
CountryUS
Kind codeB2
Filing dateSep 17, 2021
Priority dateSep 17, 2021
Publication dateMar 24, 2026
Grant dateMar 24, 2026

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  1. Title

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  2. Abstract

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  4. Key dates

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  5. First independent claim

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Abstract

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A light intensity distribution pattern measurement device according to the present disclosure includes: a two-dimensional imaging sensor for receiving multiplexed light that is obtained by multiplexing transmitted light obtained by injecting one branched light of first continuous light into an optical fiber under measurement, reference light that is the other branched light of the first continuous light, and local light; and a signal processing unit for performing digital signal processing on a light reception signal I (t) of each pixel obtained by the two-dimensional imaging sensor, in which the signal processing unit measures a light intensity distribution pattern, by calculating a square of an autocorrelation function between the light reception signal I (t) and a light reception signal I (t+τ) obtained by shifting the light reception signal by time τ, for each pixel of the two-dimensional imaging sensor.

First claim

Opening claim text (preview).

The invention claimed is: 1 . A light intensity distribution pattern measurement device comprising: a first light source for outputting first continuous light; a second light source for outputting second continuous light as local light; a two-dimensional imaging sensor for receiving multiplexed light obtained by multiplexing transmitted light that is obtained by injecting one branched light of the first continuous light into an optical fiber under measurement, reference light that is the other branched light of the first continuous light, and the local light; a processor; and a storage medium having computer program instructions stored thereon, when executed by the processor, perform: digital signal processing on a light reception signal I (t) of each pixel obtained by the two-dimensional imaging sensor, and measures a light intensity distribution pattern by calculating a square of an autocorrelation function between the light reception signal I (t) and a light reception signal I (τ+T) obtained by shifting the light reception signal by time τ for each pixel of the two-dimensional imaging sensor. 2 . The light intensity distribution pattern measurement device according to claim 1 , wherein a coherence time of the first continuous light is shorter than a delay time difference between propagation modes of the optical fiber under measurement, and a coherence time of the local light is longer than the delay time difference between propagation modes of the optical fiber under measurement. 3 . The light intensity distribution pattern measurement device according to claim 1 , wherein the time T is a propagation delay time difference between a given propagation mode of the optical fiber under measurement with respect to the reference light. 4 . The light intensity distribution pattern measurement device according to claim 1 , wherein an intensity of the reference light is greater than an intensity of the transmitted light such that a light reception signal correlation between propagation modes of the optical fiber under measurement is negligible with respect to the square of the autocorrelation function. 5 . A light intensity distribution pattern measurement method comprising: receiving, by a two-dimensional imaging sensor, multiplexed light obtained by multiplexing transmitted light that is obtained by injecting one branched light of first continuous light into an optical fiber under measurement, reference light that is the other branched light of the first continuous light, and local light that is second continuous light; and measuring a light intensity distribution pattern by calculating a square of an autocorrelation function between a light reception signal I (t) of each pixel obtained by the two-dimensional imaging sensor and a light reception signal I (τ+T) obtained by shifting the light reception signal by time τ for each pixel of the two-dimensional imaging sensor. 6 . The light intensity distribution pattern measurement method according to claim 5 , wherein a coherence time of the first continuous light is shorter than a delay time difference between propagation modes of the optical fiber under measurement, and a coherence time of the local light is longer than the delay time difference between propagation modes of the optical fiber under measurement. 7 . The light intensity distribution pattern measurement method according to claim 5 , wherein the time τ is a propagation delay time difference between a given propagation mode of the optical fiber under measurement with respect to the reference light. 8 . The light intensity distribution pattern measurement method according to claim 5 , wherein an intensity of the reference light is larger than an intensity of the transmitted light such that a light reception signal correlation between propagation modes of the optical fiber under measurement is negligible with respect to the square of the autocorrelation function.

Assignees

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Classifications

  • using modulated input signals · CPC title

  • using two or more input wavelengths · CPC title

  • by using targets or reference patterns · CPC title

  • Details of measuring devices · CPC title

  • G01M11/331Primary

    by using interferometer · CPC title

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What does patent US12584818B2 cover?
A light intensity distribution pattern measurement device according to the present disclosure includes: a two-dimensional imaging sensor for receiving multiplexed light that is obtained by multiplexing transmitted light obtained by injecting one branched light of first continuous light into an optical fiber under measurement, reference light that is the other branched light of the first continu…
Who is the assignee on this patent?
Ntt Inc
What technology area does this patent fall under?
Primary CPC classification G01M11/0264. Mapped technology areas include Physics.
When was this patent published?
Publication date Tue Mar 24 2026 00:00:00 GMT+0000 (Coordinated Universal Time) (B2). Legal status and post-grant events are not shown on this page.
What related patents are in patentsdb?
We list 8 related publications on this page (citations in our corpus or others sharing the same primary CPC).