Vision based methods for directional antenna boresight alignment

Patent metadata

Field	Value
Publication number	US-12578445-B2
Application number	US-202418626800-A
Country	US
Kind code	B2
Filing date	Apr 4, 2024
Priority date	Apr 4, 2024
Publication date	Mar 17, 2026
Grant date	Mar 17, 2026

Abstract

A testing system includes an antenna assembly having a directional antenna, the alignment of which can be adjusted with respect to a device under test. The directional antenna includes a horn having a housing having a side piece with an opening. A reflecting surface is movable through the opening from a first position away from a beam axis of the directional antenna to a second position along the beam axis. A light source is configured to transmit a light beam to be incident on the reflecting surface. The light beam reflects at the reflecting surface to project along the beam axis to the device under test. A mounting stage coupled to the directional antenna can be adjusted to align the directional antenna by placing the light beam at a desired location of the device under test.

First claim

What is claimed is:

1 . A method of adjusting an alignment of a directional antenna, comprising:
moving a reflecting surface from a first position away from a beam axis of a horn of the directional antenna to a second position along the beam axis; transmitting a light beam from a light source to be incident on the reflecting surface, wherein the light beam reflects at the reflecting surface to project along the beam axis to a device under test; and adjusting the alignment of the directional antenna to place the light beam at a desired location of the device under test.

2 . The method of claim 1 , further comprising
receiving a reflection of the light beam from the device under test at the reflecting surface; directing the reflection via the reflecting surface to a light sensor; and adjusting the alignment based on an actual array position of the reflection of the light beam at the light sensor.

3 . The method of claim 2 , further comprising measuring the actual array position within a light-sensitive array of the light sensor and adjusting a pose parameter of the directional antenna to move the actual array position to a desired array position within the light-sensitive array.

4 . The method of claim 2 , further comprising measuring a time-of-flight of the light beam and determining a path loss for an electromagnetic wave in air received from the device under test based on the time-of-flight.

5 . The method of claim 1 , wherein the reflecting surface and the light source are included in an alignment calibration device, further comprising inserting at least a part of the alignment calibration device through an opening in a housing of the horn.

6 . The method of claim 1 , wherein the directional antenna is coupled to a mounting stage, further comprising adjusting at least one of a translational parameter of the directional antenna and a rotational parameter of the directional antenna at the mounting stage.

7 . The method of claim 6 , wherein the mounting stage is coupled to a mast, further comprising adjusting a vertical position of the directional antenna by moving the mounting stage vertically with respect to the mast.

8 . An antenna assembly, comprising:
a directional antenna including a horn having a housing having a side piece with an opening; a reflecting surface movable through the opening from a first position away from a beam axis of the directional antenna to a second position along the beam axis; a light source configured to transmit a light beam to be incident on the reflecting surface, the light beam reflecting at the reflecting surface to project along the beam axis to a device under test; and a mounting stage for adjusting an alignment of the directional antenna to place the light beam at a desired location of the device under test.

9 . The antenna assembly of claim 8 , further comprising a light sensor, wherein a reflection of the light beam from the device under test is directed from the reflecting surface to the light sensor and the mounting stage adjusts the alignment based on an actual array position of the reflection of the light beam at the light sensor.

10 . The antenna assembly of claim 9 , wherein the light sensor further comprises a light-sensitive array, the actual array position is determined within the light-sensitive array and a pose parameter of the directional antenna is adjusted to move the actual array position to a desired array position within the light-sensitive array.

11 . The antenna assembly of claim 9 , further comprising a processor configured to measure a time-of-flight of the light beam and determine a path loss for an electromagnetic wave in air received from the device under test based on the time-of-flight.

12 . The antenna assembly of claim 8 , further comprising an alignment calibration device that includes the reflecting surface and the light source, wherein at least a part of the alignment calibration device is insertable through the opening.

13 . The antenna assembly of claim 8 , wherein the mounting stage is further configured to adjust at least one of a translational parameter of the directional antenna and a rotational parameter of the directional antenna.

14 . The antenna assembly of claim 13 , wherein the mounting stage is coupled to a mast and is further configured to move vertically with respect to the mast to adjust a vertical position of the directional antenna.

15 . A testing system, comprising:
a device under test; a directional antenna at a location with respect to the device under test, the direction antenna including a horn having a housing having a side piece with an opening; a reflecting surface movable through the opening from a first position away from a beam axis of the directional antenna to a second position along the beam axis; a light source configured to transmit a light beam to be incident on the reflecting surface, the light beam reflecting at the reflecting surface to project along the beam axis to the device under test; and a mounting stage for adjusting an alignment of the directional antenna to place the light beam at a desired location of the device under test.

16 . The testing system of claim 15 , further comprising a light sensor, wherein a reflection of the light beam from the device under test is directed from the reflecting surface to the light sensor and the mounting stage adjusts the alignment based on an actual array position of the reflection of the light beam at the light sensor.

17 . The testing system of claim 16 , wherein the light sensor further comprises a light-sensitive array, the actual array position is determined within the light-sensitive array and a pose parameter of the directional antenna is adjusted to move the actual array position to a desired array position within the light-sensitive array.

18 . The testing system of claim 16 , further comprising a processor configured to measure a time-of-flight of the light beam and determine a path loss for an electromagnetic wave in air received from the device under test based on the time-of-flight.

19 . The testing system of claim 15 , further comprising an alignment calibration device that includes the reflecting surface and the light source, wherein at least a part of the alignment calibration device is insertable through the opening.

20 . The testing system of claim 15 , wherein the mounting stage is further configured to adjust at least one of a translational parameter of the directional antenna and a rotational parameter of the directional antenna.

Assignees

• Gm Global Tech Operations Llc

Inventors

• Kotzer Igal
• Philipp Tzvi
• Mandziuk Michael Lawrence
• Givati Ofer

Classifications

• G01S7/484

  Transmitters · CPC title

• H01Q5/22

  RF wavebands combined with non-RF wavebands, e.g. infrared or optical · CPC title

• H01Q3/267

  Phased-array testing or checking devices · CPC title

• H01Q1/125

  Means for positioning · CPC title

• G01S7/497 Primary

  Means for monitoring or calibrating · CPC title