Sensor element and device for checking the authenticity of a data carrier having a spin resonance feature
US-2024177555-A1 · May 30, 2024 · US
US12573254B2 · US · B2
| Field | Value |
|---|---|
| Publication number | US-12573254-B2 |
| Application number | US-202218552579-A |
| Country | US |
| Kind code | B2 |
| Filing date | Mar 22, 2022 |
| Priority date | Mar 26, 2021 |
| Publication date | Mar 10, 2026 |
| Grant date | Mar 10, 2026 |
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A sensor element for testing a flat data carrier, in particular a banknote, has a spin resonance feature. The sensor element contains a magnetic core having an air gap, into which the flat data carrier can be inserted for testing, an element for generating a static magnetic flux in the air gap, and a resonator for exciting the spin resonance feature of the data carrier to be tested. The resonator is formed by a microstrip line resonator which is arranged in the air gap of the magnetic core and comprises a flat carrier having an upper side and a conducting structure which is arranged on the upper side of the carrier with a characteristic length.
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The invention claimed is: 1 . A sensor element for testing a flat data carrier, comprising: a magnetic core having an air gap into which the flat data carrier is insertable for the test, an element for generating a static magnetic flux in the air gap, and a resonator for exciting a spin resonance feature of the data carrier under test, wherein the resonator is formed by a microstrip line resonator which is arranged in the air gap of the magnetic core and which has a flat carrier with an upper side and an opposing lower side, wherein a conducting structure having a characteristic length l is arranged on the upper side, wherein the microstrip line resonator is designed for excitation of spin resonance signals having a frequency between 1 GHz and 100 GHz. 2 . The sensor element according to claim 1 , wherein the carrier has a ground area arranged on the lower side. 3 . The sensor element according to claim 1 , wherein the microstrip line resonator forms a λ/4 fundamental mode, a λ2 fundamental mode or a λ fundamental mode. 4 . The sensor element according to claim 1 , wherein the microstrip line resonator as a conducting structure comprises a rectangular structure, an annular structure having a circular or elliptical outer contour, a disc-shaped structure, a ring-sector structure having round or elliptical outer edges, or a structure having a triangular or polygonal shape. 5 . The sensor element according to claim 1 , wherein the microstrip line resonator with its characteristic length l is designed and configured for testing the spin resonance feature of the data carrier in a higher-order spatial mode of an excitation field. 6 . The sensor element according to claim 1 , wherein the microstrip line resonator has a quality Q between 50 and 400. 7 . The sensor element according to claim 1 , wherein the microstrip line resonator is arranged in the air gap parallel to and distanced from a metallized shielding element in order to reduce radiation losses of the resonator. 8 . The sensor element according to claim 1 , wherein the sensor element is designed and configured for testing an electron spin resonance feature or a ferromagnetic or ferrimagnetic resonance feature. 9 . A test device for testing flat data carriers having a sensor element according to claim 1 and having a transport device which inserts the flat data carriers under test along a transport path into the air gap of the magnetic core or feeds them through the air gap of the magnetic core. 10 . The test device according to claim 9 , wherein the transport device is designed and configured for a fast-running transport of the flat data carriers under test along the transport path. 11 . The test device according to claim 9 , wherein the transport device is designed and configured to feed the flat data carriers under test along a transport path at a short distance above the upper side of the microstrip line resonator. 12 . The test device according to claim 9 , wherein the sensor element is equipped with a shielding element, and the transport device is designed and configured to feed the flat data carriers under test along the transport path in a slot between the microstrip line resonator and the shielding element. 13 . The test device according to claim 9 , wherein the test device has a signal source for a pulsed activation of the microstrip line resonator and/or for an operation of the microstrip line resonator using a rapid-scan method and/or using a CW method. 14 . The sensor element according to claim 1 , wherein the microstrip line resonator with its characteristic length l is designed and configured for testing the spin resonance feature of the data carrier in a second-order or third-order mode of an excitation field. 15 . A method for testing a flat data carrier having a spin resonance feature by means of a sensor element, in which the following steps are carried out: providing the flat data carrier; feeding the flat data carrier into an air gap of a magnetic core of the sensor element; exciting the spin resonance feature of the flat data carrier by means of a microstrip line resonator of the sensor element arranged in the air gap of the magnetic core; capturing a measurement signal which is characteristic of the spin resonance feature by means of the microstrip line resonator; and testing the flat data carrier by means of the captured measurement signal, wherein the microstrip line resonator is designed for excitation of spin resonance signals having a frequency between 1 GHz and 100 GHz.
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