Signal analysis capability

Patent metadata

Field	Value
Publication number	US-12556271-B2
Application number	US-202318331919-A
Country	US
Kind code	B2
Filing date	Jun 8, 2023
Priority date	Jun 8, 2023
Publication date	Feb 17, 2026
Grant date	Feb 17, 2026

Abstract

Various example embodiments of a signal analysis capability are presented herein. The signal analysis capability may be configured to support analysis of a signal for determining the signal integrity of the signal, where the signal integrity of the signal corresponds to a set of one or more measures of the quality of an electrical signal (e.g., one or more signal integrity metrics indicative of the signal integrity of the signal). The signal analysis capability may be configured to support analysis of a signal for determining the signal integrity of the signal for various types of signals which may be communicated within various types of communication networks. The signal analysis capability may be configured to support analysis of a signal for determining the signal integrity of the signal where the signal may include various types of data traffic (e.g., live data traffic, user data traffic, test data traffic, or the like).

First claim

What is claimed is:

1 . An apparatus, comprising:
at least one processor; and at least one memory storing instructions which, when executed by the at least one processor, cause the apparatus at least to:
determine, within a multi-valued waveform recorded from a received signal including a plurality of protocol frames that are based on a protocol, a position of a repeating symbol pattern that repeats across the plurality of protocol frames, wherein the received signal includes data traffic, wherein the multi-valued waveform is recorded from the received signal including the data traffic;
extract, from the multi-valued waveform based on the position of the repeating symbol pattern, a waveform of the repeating symbol pattern; and
calculate, based on the waveform of the repeating symbol pattern, a signal integrity metric of the received signal to support signal analysis for the data traffic.

2 . The apparatus of claim 1 , wherein the position of the repeating symbol pattern is determined using a cross-correlation or convolution with a known symbol pattern of a protocol frame structure of the protocol frames of the protocol.

3 . The apparatus of claim 2 , wherein the cross-correlation or convolution within the known symbol pattern of the protocol frame structure of the protocol frames of the protocol is performed after application of at least one of upsampling or filtering to the known symbol pattern of the protocol frame structure of the protocol frames of the protocol.

4 . The apparatus of claim 1 , wherein the protocol is a passive optical network (PON) protocol, wherein the protocol frames are downstream physical PON frames based on a downstream physical PON frame format that includes a downstream physical synchronization block (PSBd), wherein the repeating symbol pattern is located within the PSBd.

5 . The apparatus of claim 4 , wherein the repeating symbol pattern is one of: a PSync field of the PSBd, at least a portion of a superframe counter (SFC) structure of the PSBd, or at least a portion of an operation control (OC) structure of the PBSd.

6 . The apparatus of claim 1 , wherein the protocol is a passive optical network (PON) protocol, wherein the protocol frames are upstream physical PON frames based on an upstream physical PON frame format, wherein the repeating symbol pattern is one of an upstream delimiter or an upstream burst preamble.

7 . The apparatus of claim 1 , wherein the instructions, when executed by the at least one processor, cause the apparatus at least to:
calculate the signal integrity metric of the received signal based on a signal integrity metric calculation performed based on the waveform of the repeating symbol pattern.

8 . The apparatus of claim 1 , wherein the instructions, when executed by the at least one processor, cause the apparatus at least to:
perform waveform processing on the waveform of the repeating symbol pattern to provide a processed waveform; and calculate the signal integrity metric of the received signal based on a signal integrity metric calculation performed based on the processed waveform.

9 . The apparatus of claim 1 , wherein the instructions, when executed by the at least one processor, cause the apparatus at least to:
calculate a first signal integrity metric based on a first signal integrity metric calculation performed based on the waveform of the repeating symbol pattern; perform waveform processing on the waveform of the repeating symbol pattern to provide a processed waveform; calculate a second signal integrity metric based on a second signal integrity metric calculation performed based on the processed waveform; and calculate the signal integrity metric of the received signal based on processing of the first signal integrity metric and the second signal integrity metric.

10 . The apparatus of claim 1 , wherein the instructions, when executed by the at least one processor, cause the apparatus at least to:
obtain, based on the plurality of protocol frames, an eye diagram for the received signal.

11 . The apparatus of claim 10 , wherein the instructions, when executed by the at least one processor, cause the apparatus at least to:
calculate the signal integrity metric of the received signal based on a signal integrity metric calculation performed based on the eye diagram for the received signal.

12 . The apparatus of claim 10 , wherein the instructions, when executed by the at least one processor, cause the apparatus at least to:
perform eye-related processing on the eye diagram for the received signal to provide a processed eye diagram; and calculate the signal integrity metric of the received signal based on a signal integrity metric calculation performed based on the processed eye diagram.

13 . The apparatus of claim 10 , wherein the instructions, when executed by the at least one processor, cause the apparatus at least to:
perform signal processing on the waveform of the repeating symbol pattern and the eye diagram for the received signal to provide an output signal; and calculate the signal integrity metric of the received signal based on a signal integrity metric calculation performed based on the output signal.

14 . The apparatus of claim 1 , wherein the instructions, when executed by the at least one processor, cause the apparatus at least to:
determine, within the multi-valued waveform recorded from the received signal, a second position of a second repeating symbol pattern that repeats across the plurality of protocol frames; extract, from the multi-valued waveform based on the second position of the second repeating symbol pattern, a second waveform of the repeating symbol pattern; and calculate, based on the second waveform of the second repeating symbol pattern, the signal integrity metric of the received signal.

15 . The apparatus of claim 14 , wherein the instructions, when executed by the at least one processor, cause the apparatus at least to:
perform waveform processing on the waveform of the repeating symbol pattern to provide a first processed waveform and on the second waveform of the second repeating symbol pattern to provide a second processed waveform; and calculate the signal integrity metric of the received signal based on a signal integrity metric computation performed based on the first processed waveform and the second processed waveform.

16 . The apparatus of claim 14 , wherein the instructions, when executed by the at least one processor, cause the apparatus at least to:
perform waveform processing on the waveform of the repeating symbol pattern to provide a first processed waveform and on the second waveform of the second repeating symbol pattern to provide a second processed waveform; calculate a first signal integrity metric based on a first signal integrity metric computation performed based on the first processed waveform and the second processed waveform; calculate a second signal integrity metric based on a second integrity metric computation performed based on the waveform of the repeating symbol pattern and the second waveform of the repeating symbol pattern; and calculate the signal integrity metric of the received signal based on a signal integrity metric processing configured to adjust the first signal integrity metric based on the second signal integrity metric.

17 . The apparatus of claim 1 , wherein the signal integrity metric includes at least one of an eye/eye-mask test after equalization (EYE-EQ) metric, a transmitter dispersion eye closure after equalization (TDEC-EQ) metric, or a transmitter dispersi

Assignees

• Nokia Solutions & Networks Oy

Inventors

• Borkowski Robert
• Houtsma Vincent
• Van Veen Doutje
• Mahadevan Amitkumar
• Vijayan Kovendhan

Classifications

• H04B10/079

  using measurements of the data signal · CPC title

• H04Q2011/0084

  Quality of service aspects · CPC title

• H04Q2011/0083

  Testing; Monitoring · CPC title

• H04L43/18

  Protocol analysers · CPC title

• H04B10/07957

  Monitoring or measuring wavelength · CPC title