Machine learning based rapid parameter development for additive manufacturing and related methods

US12554245B2 · US · B2

Patent metadata
FieldValue
Publication numberUS-12554245-B2
Application numberUS-202318157221-A
CountryUS
Kind codeB2
Filing dateJan 20, 2023
Priority dateSep 15, 2022
Publication dateFeb 17, 2026
Grant dateFeb 17, 2026

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  1. Title

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  5. First independent claim

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  7. Citations and related patents

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Abstract

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An additive manufacturing system may include an additive manufacturing device and a process map generation system. The process map generation system may generate an operational process map responsive to mathematical simulations of an additive manufacturing device, cause the additive manufacturing device to print a plurality of test structures responsive to the operational process map, detect one or more defects in each of the plurality of test structures, automatically update the operational process map responsive to the defects, and modify one or more operating parameters of the additive manufacturing device responsive to the updated operational process map.

First claim

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What is claimed is: 1 . An additive manufacturing system, comprising: an additive manufacturing device; and a process map generation system comprising: at least one processor; at least one non-transitory computer-readable storage medium storing instructions thereon that, when executed by the at least one processor cause the process map generation system to: obtain an operational process map defining operating parameters of the additive manufacturing device; cause the additive manufacturing device to print a plurality of test structures responsive to the operational process map, each test structure of the plurality of test structures printed based on at least one different operating parameter relative to other test structures of the plurality of test structures; detect one or more defects in each of the plurality of test structures; automatically update the operational process map responsive to the one or more defects; and modify one or more operating parameters of the additive manufacturing device responsive to the operational process map. 2 . The additive manufacturing system of claim 1 , wherein the one or more defects include at least one defect selected from among the group consisting of key holing, vertical lack of fusion, horizontal lack of fusion, balling, or surface closed porosity. 3 . The additive manufacturing system of claim 1 , wherein the operating parameters include at least one parameter selected from among the group consisting of laser power, laser scanning speed, hatch spacing, powder layer thickness, build direction, laser spot size, scan vector, powder bed composition, or melt pool size. 4 . The additive manufacturing system of claim 1 , wherein the operational process map defines an optimal process zone based, at least in part, on each operating parameter of the operational process map, the optimal process zone defining a range of operating parameter values configured to reduce defects in structures printed by the additive manufacturing device. 5 . The additive manufacturing system of claim 1 , further comprising a computed tomography (CT) imager, wherein the instructions stored on the at least one non-transitory computer-readable storage medium, when executed by the processor, cause the process map generation system to: obtain one or more CT images of each of the plurality of test structures via the CT imager; extract one or more features from the one or more CT images; detect one or more defects in each of the plurality of test structures responsive to the one or more features and classify each defect of the one or more defects into a defect type. 6 . The additive manufacturing system of claim 5 , wherein the instructions stored on the at least one non-transitory computer-readable storage medium, when executed by the processor, cause the process map generation system to: determine one or more root causes for at least one of the one or more defects; and automatically update the operational process map responsive to classified defect types and the one or more root causes. 7 . The additive manufacturing system of claim 5 , wherein the instructions stored on the at least one non-transitory computer-readable storage medium, when executed by the processor, cause the process map generation system to: train a classification model configured to identify a defect type and/or defect location based, at least in part, on features represented in a CT image. 8 . The additive manufacturing system of claim 1 , further comprising: a memory device storing data representative of experiment data related to a process of the additive manufacturing device; wherein the instructions stored on the at least one non-transitory computer-readable storage medium, when executed by the processor, cause the process map generation system to: generate an operational process map responsive to the experiment data. 9 . The additive manufacturing system of claim 1 , further comprising a plurality of mathematical simulations, the plurality of mathematical simulations being physics-based simulations of an operation of the additive manufacturing device. 10 . A method for determining operating parameters of an additive manufacturing device, comprising: generating an operational process map based on a plurality of pre-calculated mathematical simulations of an operation of an additive manufacturing device; printing a plurality of test structures via the additive manufacturing device, each test structure of the plurality of test structures printed using at least one different operating parameter relative to other test structures of the plurality of test structures; detecting one or more defects in each test structure of the plurality of test structures; automatically updating the operational process map responsive to the one or more defects; and modifying one or more operating parameters of the additive manufacturing device responsive to the updated operational process map. 11 . The method of claim 10 , wherein detecting one or more defects in each test structure of the plurality of test structures comprises: obtaining one or more Computed Tomography (CT) images of each of the plurality of test structures via the CT imager; extracting one or more features from the one or more CT images; detecting one or more defects in each of the plurality of test structures responsive to the one or more features; and classifying each defect of the one or more defects into a defect type. 12 . The method of claim 11 , further comprising performing one or more image processing techniques on the one or more CT images. 13 . The method of claim 12 , further comprising selecting the one or more image processing techniques to include at least one technique selected from among the group consisting of edge detection, histogram equalization, noise reduction, edge enhancement, image sharpening, signal boosting, or signal damping. 14 . The method of claim 11 , further comprising training a classification model configured to identify a defect type and/or defect location based, at least in part, on features represented in a CT image. 15 . The method of claim 11 , further comprising automatically updating the operational process map responsive to classified defect types. 16 . The method of claim 10 , further comprising detecting the one or more defects from among the group consisting of key holing, vertical lack of fusion, horizontal lack of fusion, balling, or surface closed porosity. 17 . The method of claim 10 , modifying the one or more operating parameters includes modifying at least one parameter selected from the group consisting of laser power, laser scanning speed, hatch spacing, powder layer thickness, build direction, laser spot size, scan vector, powder bed composition, or melt pool size. 18 . The method of claim 10 , further comprising configuring the operational process map to define an optimal process zone based, at least in part, on each operating parameter of the operational process map, the optimal process zone defining a range of operating parameter values configured to reduce defects in structures printed by the additive manufacturing device. 19 . A non-transitory computer-readable medium storing instructions thereon that, when executed by at least one processor, cause the at least one processor to perform the steps comprising: generating an operational process map based on a plurality of pre-calculated mathematical simulations of an operation of an additive manufacturing device; printing a plural

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Inventors

Classifications

  • Data acquisition or data processing · CPC title

  • the criterion being a learning criterion · CPC title

  • B33Y50/00Primary

    Data acquisition or data processing for additive manufacturing · CPC title

  • 3-D printing, layer of powder, add drops of binder in layer, new powder · CPC title

  • Data acquisition or data processing for additive manufacturing · CPC title

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What does patent US12554245B2 cover?
An additive manufacturing system may include an additive manufacturing device and a process map generation system. The process map generation system may generate an operational process map responsive to mathematical simulations of an additive manufacturing device, cause the additive manufacturing device to print a plurality of test structures responsive to the operational process map, detect on…
Who is the assignee on this patent?
Baker Hughes Oilfield Operations Llc
What technology area does this patent fall under?
Primary CPC classification B33Y50/00. Mapped technology areas include Operations & Transport.
When was this patent published?
Publication date Tue Feb 17 2026 00:00:00 GMT+0000 (Coordinated Universal Time) (B2). Legal status and post-grant events are not shown on this page.
What related patents are in patentsdb?
We list 4 related publications on this page (citations in our corpus or others sharing the same primary CPC).