Electrochemical impedance spectroscopy current measurement system calibration

Patent metadata

Field	Value
Publication number	US-12553975-B2
Application number	US-202418595283-A
Country	US
Kind code	B2
Filing date	Mar 4, 2024
Priority date	Mar 6, 2023
Publication date	Feb 17, 2026
Grant date	Feb 17, 2026

Abstract

A calibration system for calibrating an electrochemical impedance spectroscopy (EIS) current measurement system can include a calibration resistor, which can have a specified resistance and an unspecified reactance, a reactive element which can have a specified reactance and an unspecified resistance, and a current source, which can be configured to provide a specified current through the reactive element, through the calibration resistor, and through a sense resistor arrangement of the EIS current measurement system to be calibrated, where the sense resistor arrangement can have a resistance and a reactance. The calibration system can also include voltage measurement circuitry, which can be configured to measure (1) a first voltage across the calibration resistor and a second voltage across the sense resistor arrangement and (2) a third voltage across the reactive element and a fourth voltage across the sense resistor arrangement, to determine a calibrated resistance value and a calibrated reactance value associated with the sense resistor arrangement.

First claim

What is claimed is:

1 . A calibration system for calibrating an electrochemical impedance spectroscopy (EIS) current measurement system, the calibration system comprising:
a calibration resistor, having a specified resistance and an unspecified reactance; a reactive element having a specified reactance and an unspecified resistance; a current source, configured to provide a specified current through the reactive element, through the calibration resistor, and through a sense resistor arrangement of the EIS current measurement system to be calibrated, wherein the sense resistor arrangement has a resistance and a reactance; and voltage measurement circuitry, configured to measure (1) a first voltage across the calibration resistor and a second voltage across the sense resistor arrangement while the current source provides a first current and (2) a third voltage across the reactive element and a fourth voltage across the sense resistor arrangement while the current source provides a second current, wherein the first voltage, the second voltage, the third voltage, and the fourth voltage are used to determine a calibrated resistance value and a calibrated reactance value associated with the sense resistor arrangement.

2 . The calibration system of claim 1 , wherein the voltage measurement circuitry includes:
an analog-to-digital converter (ADC); and a multiplexer, configured to selectably connect the calibration resistor, reactive element, or sense resistor arrangement to the ADC.

3 . The calibration system of claim 2 , comprising a short circuit component, having a specified resistance and reactance, wherein the multiplexer is configured to connect the ADC to the short circuit component to determine a zero-voltage offset of the ADC.

4 . The calibration system of claim 1 , comprising a fourth circuit element, having at least one of a specified resistance or a specified reactance, configured to receive the specified current, wherein the voltage measurement circuitry is configured to measure a fifth voltage across the fourth circuit element and a sixth voltage across the sense resistor arrangement while the current source provides a third current, wherein the fifth voltage and the sixth voltage are used to verify the determined calibrated resistance value and the determined calibrated reactance value.

5 . The calibration system of claim 1 , wherein the first current is equal to the second current.

6 . The calibration system of claim 1 , wherein the current source includes a specified voltage connected across a specified resistance, wherein the specified voltage is an ADC reference voltage.

7 . The calibration system of claim 1 , wherein the EIS current measurement system is installed in a location of use during the calibration, wherein the calibration is used to account for one or more parasitic effects of the location of use.

8 . The calibration system of claim 1 , further comprising the EIS current measurement system.

9 . The calibration system of claim 8 , wherein the EIS current measurement system includes the voltage measurement circuitry.

10 . The calibration system of claim 9 , wherein the calibration resistor, the reactive element, and the current source are included on calibration board separate from the EIS current measurement system.

11 . The calibration system of claim 9 , wherein at least one of the calibration resistor or the reactive element are connected in place of an electrochemical cell arrangement.

12 . The calibration system of claim 9 , wherein the reactive element includes at least one of a capacitor or an inductor.

13 . A method for calibrating an electrochemical impedance spectroscopy (EIS) current measurement system, the method comprising:
measuring a first voltage across a calibration resistor and a second voltage across a sense resistor arrangement, wherein a first current through the calibration resistor is equal to the first current through the sense resistor arrangement, wherein the calibration resistor has a specified resistance and an unspecified reactance and wherein the sense resistor arrangement has an unspecified resistance and an unspecified reactance; measuring a third voltage across a reactive element and a fourth voltage across the sense resistor arrangement, wherein a second current through the reactive element is equal to the second current through the sense resistor arrangement, wherein the reactive element has a specified reactance and an unspecified resistance; and calculating, using the first voltage, the second voltage, the third voltage, and the fourth voltage, a calibrated resistance value and a calibrated reactance value of the sense resistor arrangement.

14 . The method of claim 13 , comprising:
performing a calibrated EIS measurement using the calibrated resistance value and the calibrated reactance value.

15 . The method of claim 14 , wherein the performing a calibrated EIS measurement includes:
providing an EIS excitation current through an electrochemical cell and through the sense resistor arrangement; measuring a sense voltage across the sense resistor arrangement and, using the calibrated resistance value and the calibrated reactance value, determining a current through the sense resistor arrangement and through the electrochemical cell; and measuring a cell voltage across the electrochemical cell and, using the determined current, determining an impedance of the electrochemical cell.

16 . The method of claim 15 , wherein the first current and the second current are provided by a current source that is generated by applying a reference voltage to a resistance.

17 . The method of claim 16 , wherein the reference voltage is also used as an ADC reference voltage for an ADC used to measure the first voltage, the second voltage, the third voltage, and the fourth voltage.

18 . The method of claim 17 , comprising measuring a fifth voltage across a short circuit element and using the measured fifth voltage to determine an offset in the ADC.

19 . The method of claim 13 , comprising determining at least one of the calibrated resistance value or the calibrated reactance value at more than one frequency.

20 . A calibration system for calibrating an electrochemical impedance spectroscopy (EIS) current measurement system, the calibration system comprising:
a calibration resistor, having a specified resistance and an unspecified reactance; a reactive element having a specified reactance and an unspecified resistance; a current source, configured to provide a specified current through the reactive element, through the calibration resistor, and through a sense resistor arrangement of the EIS current measurement system to be calibrated, wherein the sense resistor arrangement has a resistance and a reactance; and voltage measurement circuitry, configured to measure (1) a first voltage across the calibration resistor and a second voltage across the sense resistor arrangement while the current source provides a first current and (2) a third voltage across the reactive element and a fourth voltage across the sense resistor arrangement while the current source provides a second current, wherein the first voltage, the second voltage, the third voltage, and the fourth voltage are used to determine a calibrated resistance value and a calibrated reactance value associated with the sense resistor arrangement, wherein the calibrated resistance value and the calibrated reactance value are determined at more than one frequency.

Assignees

• Analog Devices Inc

Inventors

• Harrington Brian
• Seidel Sheila Patricia
• Garber Leah Alexis
• Zheng Sue
• Fischl Kate Danielle
• Yellepeddi Atulya
• Merkel Evan

Classifications

• G01R31/3842

  combining voltage and current measurements · CPC title

• G01R31/396

  Acquisition or processing of data for testing or for monitoring individual cells or groups of cells within a battery · CPC title

• G01R31/389

  Measuring internal impedance, internal conductance or related variables · CPC title

• G01R1/203

  Resistors used for electric measuring, e.g. decade resistors standards, resistors for comparators, series resistors, shunts (resistors in general H01C; microwave or radiowave terminations H01P1/26; coupling devices H01R) · CPC title

• G01R19/0092

  Measuring current only · CPC title