Display apparatus
US-2023105374-A1 · Apr 6, 2023 · US
US12550598B2 · US · B2
| Field | Value |
|---|---|
| Publication number | US-12550598-B2 |
| Application number | US-202318355509-A |
| Country | US |
| Kind code | B2 |
| Filing date | Jul 20, 2023 |
| Priority date | Dec 22, 2022 |
| Publication date | Feb 10, 2026 |
| Grant date | Feb 10, 2026 |
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A manufacturing method of a display device includes forming a light emitting element layer on a substrate, co-depositing bismuth (Bi) and ytterbium (Yb) on the light emitting element layer to form a first inorganic absorbing layer, and forming a reflection control layer on the first inorganic absorbing layer. In the co-depositing, a deposition temperature of bismuth (Bi) is in a range of about 500° C. to about 850° C., a deposition temperature of ytterbium (Yb) is in a range of about 300° C. to about 550° C., and an extinction coefficient of the first inorganic absorbing layer is less than or equal to about 3.
Opening claim text (preview).
What is claimed is: 1 . A manufacturing method of a display device, comprising: forming a light emitting element layer on a substrate; co-depositing bismuth (Bi) and ytterbium (Yb) on the light emitting element layer to form a first inorganic absorbing layer; and forming a reflection control layer on the first inorganic absorbing layer, wherein in the co-depositing, a deposition temperature of bismuth (Bi) is in a range of about 500° C. to about 850° C., a deposition temperature of ytterbium (Yb) is in a range of about 300° C. to about 550° C., and an extinction coefficient of the first inorganic absorbing layer is less than or equal to about 3. 2 . The manufacturing method of the display device of claim 1 , wherein in the co-depositing, a bismuth (Bi) metal compound and an ytterbium (Yb) metal compound are simultaneously thermally deposited. 3 . The manufacturing method of the display device of claim 1 , wherein in the co-depositing, a bismuth (Bi) inorganic compound and an ytterbium (Yb) inorganic compound are simultaneously thermally deposited. 4 . The manufacturing method of the display device of claim 1 , wherein in the co-depositing, the deposition temperature of bismuth (Bi) is in a range of about 600° C. to about 700° C., and the deposition temperature of ytterbium (Yb) is in a range of about 480° C. to about 540° C. 5 . The manufacturing method of the display device of claim 1 , wherein a composition ratio of bismuth (Bi) and ytterbium (Yb) in the first inorganic absorbing layer is in a range of about 80:20 to about 40:60. 6 . The manufacturing method of the display device of claim 1 , wherein a refractive index of the first inorganic absorbing layer is in a range of about 1 to about 3. 7 . The manufacturing method of the display device of claim 1 , wherein the first inorganic absorbing layer further includes at least one of titanium (Ti), zirconium (Zr), tungsten (W), tantalum (Ta), or molybdenum oxide (MoO 3 ). 8 . The manufacturing method of the display device of claim 1 , further comprising: forming a second inorganic absorbing layer on the first inorganic absorbing layer. 9 . The manufacturing method of the display device of claim 8 , wherein the second inorganic absorbing layer is directly formed on the first inorganic absorbing layer. 10 . The manufacturing method of the display device of claim 9 , wherein the second inorganic absorbing layer includes at least one of bismuth (Bi), ytterbium (Yb), titanium (Ti), zirconium (Zr), tungsten (W), tantalum (Ta), or molybdenum oxide (MoO 3 ). 11 . The manufacturing method of the display device of claim 1 , further comprising: forming a light blocking layer on the first inorganic absorbing layer, wherein the reflection control layer is formed on the light blocking layer. 12 . A display device comprising: a light emitting element layer; a first inorganic absorbing layer disposed on the light emitting element layer and including a multi-element co-deposited film; and a reflection control layer disposed on the first inorganic absorbing layer, wherein an extinction coefficient of the first inorganic absorbing layer is less than or equal to about 3. 13 . The display device of claim 12 , further comprising: a second inorganic absorbing layer disposed between the first inorganic absorbing layer and the reflection control layer. 14 . The display device of claim 13 , wherein the first inorganic absorbing layer and the second inorganic absorbing layer include a same material. 15 . The display device of claim 14 , wherein each of the first inorganic absorbing layer and the second inorganic absorbing layer includes at least one of bismuth (Bi), ytterbium (Yb), titanium (Ti), zirconium (Zr), tungsten (W), tantalum (Ta), or molybdenum oxide (MoO 3 ). 16 . The display device of claim 15 , wherein the first inorganic absorbing layer includes bismuth (Bi) and ytterbium (Yb). 17 . The display device of claim 15 , wherein the second inorganic absorbing layer includes bismuth (Bi) or ytterbium (Yb). 18 . The display device of claim 12 , wherein a composition ratio of bismuth (Bi) and ytterbium (Yb) in the first inorganic absorbing layer is in a range of about 80:20 to about 40:60. 19 . The display device of claim 12 , wherein a refractive index of the first inorganic absorbing layer is in a range of about 1 to about 3. 20 . The display device of claim 12 , further comprising: a light blocking layer disposed between the first inorganic absorbing layer and the reflection control layer.
Manufacture or treatment specially adapted for the organic devices covered by this subclass · CPC title
comprising light absorbing layers, e.g. light-blocking layers · CPC title
OLEDs integrated with touch screens · CPC title
comprising refractive means, e.g. lenses · CPC title
Obtaining rare earth metals · CPC title
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