Multiple transport level tester system

Patent metadata

Field	Value
Publication number	US-12535518-B2
Application number	US-202218077869-A
Country	US
Kind code	B2
Filing date	Dec 8, 2022
Priority date	Dec 8, 2022
Publication date	Jan 27, 2026
Grant date	Jan 27, 2026

Abstract

A multiple transport level tester system according to some embodiments includes an entry point, an exit point, a first transport level having a first level, and at least one additional transport levels, wherein the first level is different than the at least one additional levels. The multiple transport level tester system further includes at least one environmental conditioning chamber configured to perform an environmental conditioning on units under test; and at least one test station configured to perform at least one test on the units under test.

First claim

What is claimed is:

1 . A multiple transport level tester system comprising:
an entry point; an exit point; a first transport level having a first level; a second transport level having a second level; wherein the first level is different than the second level; a first environmental conditioning chamber configured to perform a first environmental conditioning on a unit under test; a second environmental conditioning chamber configured to perform a second environmental conditioning on the unit under test; and a plurality of test stations comprising a first test station configured to perform a first test on the unit under test in the first transport level and a second test station configured to perform a second test on the unit under test in the second transport level.

2 . The multiple transport level tester system of claim 1 , further comprising:
a first end of the multiple transport level tester system; a second end of the multiple transport level tester system; a first side of the multiple transport level tester system; and a second side of the multiple transport level tester system, wherein the multiple transport level tester is configured between the first end and the second end and between the first side and the second side.

3 . The multiple transport level tester system of claim 2 , wherein the entry point and the exit point are configured at one or more of the first end, the second end, the first side, and the second side, and at least one of the first end and the second end of the multiple transport level tester system.

4 . The multiple transport level tester system of claim 2 , wherein the first level and second levels, respectively, are substantially level between the first and second ends of the multiple transport level tester system.

5 . The multiple transport level tester system of claim 2 , wherein the first level has a vAraible level within the first transport level.

6 . The multiple transport level tester system of claim 2 , wherein the second level has a vAraible level within the second transport level.

7 . The multiple transport level tester system of claim 1 , wherein the first environmental conditioning chamber is configured to receive and to output the unit under test in the second transport level.

8 . The multiple transport level tester system of claim 1 , wherein the first environmental conditioning chamber is configured to receive the unit under test in the second transport level and to output the unit under test in the first transport level.

9 . The multiple transport level tester system of claim 1 , wherein the first environmental conditioning chamber is configured to receive the unit under test in the first transport level and to output the unit under test in the second transport level.

10 . The multiple transport level tester system of claim 1 , wherein the first environmental conditioning chamber comprises an environmental controller configured to control at least one of (i) a temperature, (ii) an atmospheric condition, (iii) a humidity, (iv) electromagnetic radiation, and (v) a pressure.

11 . The multiple transport level tester system of claim 1 , wherein
the second test station is configured to receive and to output the unit under test in the second transport level.

12 . The multiple transport level tester system of claim 1 , wherein
the second test station is configured to receive and to output the unit under test in the first transport level.

13 . The multiple transport level tester system of claim 1 , further comprising:
a third test station configured to receive and to output the unit under test in the first transport level.

14 . The multiple transport level tester system of claim 1 , further comprising:
a third test station configured to receive and to output the unit under test in the second transport level.

15 . The multiple transport level tester system of claim 1 , further comprising:
a fourth test station configured to receive and to output the unit under test in the first transport level.

16 . The multiple transport level tester system of claim 1 , further comprising:
a fourth test station configured to receive and to output the unit under test in the second transport level.

17 . The multiple transport level tester system of claim 1 , further comprising:
a third transport level having a third level; and a third test station configured to receive the unit under test in the second transport level and to output the unit under test to the third transport level.

18 . The multiple transport level tester system of claim 1 , wherein the multiple transport level tester system comprises a linear footprint that is about 30%-70% less than a linear arrangement in one transport level of at least the entry point, the exit point, the first environmental conditioning chamber, the second environmental conditioning chamber, and the first test station.

19 . The multiple transport level tester system of claim 1 , wherein the unit under test comprises a semiconductor-based power module.

20 . A multiple transport level tester system, comprising:
an entry point; at least one exit point; a reject point; wherein the at least one exit point has a different location than the reject point; a first transport level having a first level comprising at least one test station configured to perform at least one test on the plurality of units under test; at least one additional transport level having at least one additional level comprising at least one additional test station configured to perform at least one additional test on the plurality of units under test, wherein the first level is different than the at least one additional level; and at least one environmental conditioning chamber configured to perform an environmental conditioning on a plurality of units under test.

21 . The multiple transport level tester system of claim 20 , wherein the entry point is configured to receive the unit under test and comprises a first transfer device configured to handle one or more tiers.

22 . The multiple transport level tester system of claim 21 , wherein the entry point is configured to receive the unit under test in the at least one additional transport level and the first transfer device is configured to move the unit under test between the one or more tiers within the at least one additional transport level.

23 . The multiple transport level tester system of claim 21 , wherein the entry point is configured to receive the unit under test in the first transport level and the first transfer device is configured to move the unit under test between the one or more tiers within the first transport level.

24 . The multiple transport level tester system of claim 21 , wherein the first transfer device comprises a shelf system having the one or more tiers for at least one shelf and an end-effector configured to move a unit under test from the at least one shelf towards the first test station.

25 . The multiple transport level tester system of claim 20 , wherein the at least one environmental conditioning chamber is configured to receive the unit under test and comprises a second transfer device having one or more tiers, the second transfer device configured to move the unit under test between the one or more tiers.

26 . The multiple transport level tester system of claim 25 , wherein the at least one environment

Assignees

• Wolfspeed Inc

Inventors

• Hricik Jason P
• Foster Timothy
• Kobliska Jacob
• Scott Michael

Classifications

• G01R31/2642 Primary

  Testing semiconductor operation lifetime or reliability, e.g. by accelerated life tests · CPC title

• G01R31/2868

  Complete testing stations; systems; procedures; software aspects · CPC title

• G01R31/2872 Primary

  related to electrical or environmental aspects, e.g. temperature, humidity, vibration, nuclear radiation · CPC title