Method of breaking through etch stop layer
US-2021202238-A1 · Jul 1, 2021 · US
US12535360B2 · US · B2
| Field | Value |
|---|---|
| Publication number | US-12535360-B2 |
| Application number | US-202217886372-A |
| Country | US |
| Kind code | B2 |
| Filing date | Aug 11, 2022 |
| Priority date | Aug 13, 2021 |
| Publication date | Jan 27, 2026 |
| Grant date | Jan 27, 2026 |
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Techniques for facilitating non-uniformity correction calibrations are provided. In one example, an infrared imaging system includes an infrared imager and a logic device. The infrared imager is configured to capture a set of infrared images of a reference object. The reference object is substantially at a single temperature. The logic device is configured to initiate a run-time calibration of the infrared imager and generate a gain map based on the set of infrared images and an offset map associated with the infrared imager. Related devices and methods are also provided.
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What is claimed is: 1 . A method comprising: initiating a run-time calibration of an imager of an imaging device; capturing, by the imager, a set of infrared images of a reference object, wherein the reference object is substantially at a single temperature, and wherein the reference object is a single temperature shutter of the imaging device or a single temperature external source; and generating a gain map based on the set of infrared images and an offset map associated with the imager, wherein the offset map is a factory calibrated offset map, and wherein run-time calibrations of the imager leave the offset map unchanged and are performed to generate gain maps that are updated relative to a factory calibrated gain map. 2 . The method of claim 1 , wherein the reference object is the single temperature shutter of the imaging device. 3 . The method of claim 2 , further comprising: moving the single temperature shutter to a closed position to present a surface of the single temperature shutter to the imager, wherein the surface is substantially at the single temperature; and storing the gain map in a volatile memory, wherein the run-time calibration comprises the moving, the capturing, the generating, and the storing. 4 . The method of claim 1 , wherein the run-time calibration leaves the offset map unchanged, and wherein the run-time calibration comprises the capturing and the generating. 5 . The method of claim 1 , further comprising determining a mean pixel value associated with the set of infrared images, wherein the gain map is further based on the mean pixel value. 6 . The method of claim 1 , further comprising averaging the set of infrared images to obtain an average infrared image, wherein the gain map is further based on the average infrared image. 7 . The method of claim 6 , further comprising determining a mean of the average infrared image, wherein the gain map is further based on the mean. 8 . The method of claim 7 , wherein the gain map is based on the average infrared image and a difference between the mean and the offset map. 9 . The method of claim 1 , further comprising after the run-time calibration: capturing, by the imager, an infrared image; and applying the gain map and the offset map on the infrared image to obtain a non-uniformity corrected image, wherein the imaging device is a portable thermal camera. 10 . An infrared imaging system comprising: an infrared imager configured to capture a set of infrared images of a reference object, wherein the reference object is substantially at a single temperature, and wherein the reference object is a single temperature shutter of the infrared imaging system or a single temperature external source; and a logic device configured to initiate a run-time calibration of the infrared imager and generate a gain map based on the set of infrared images and an offset map associated with the infrared imager, wherein the offset map is a factory calibrated offset map, and wherein the logic device is configured to initiate run-time calibrations of the infrared imager that leave the offset map unchanged and that generate gain maps that are updated relative to a factory calibrated gain map. 11 . The infrared imaging system of claim 10 , wherein the reference object is the single temperature shutter of the infrared imaging system, and wherein the logic device is further configured to: move the single temperature shutter to a closed position to present a surface of the single temperature shutter to the infrared imager, wherein the surface provides a uniform black body substantially at the single temperature, and wherein the run-time calibration comprises moving the single temperature shutter, capturing the set, and generating the gain map. 12 . The infrared imaging system of claim 10 , wherein the run-time calibration leaves the offset map unchanged, and wherein the run-time calibration comprises capturing the set of infrared images and generating the gain map. 13 . The infrared imaging system of claim 10 , wherein the logic device is further configured to determine a mean pixel value associated with the set of infrared images, and wherein the gain map is further based on the mean pixel value. 14 . The infrared imaging system of claim 10 , wherein the logic device is further configured to average the set of infrared images to obtain an average infrared image, and wherein the gain map is further based on the average infrared image. 15 . The infrared imaging system of claim 14 , wherein the logic device is further configured to determine a mean of the average infrared image, and wherein the gain map is further based on the mean. 16 . The infrared imaging system of claim 10 , wherein after the run-time calibration: the infrared imager is further configured to capture an infrared image; and the logic device is further configured to apply the gain map and the offset map on the infrared image to obtain a non-uniformity corrected image. 17 . The infrared imaging system of claim 10 , further comprising a memory, wherein the logic device is further configured to update gain terms stored in the memory with the gain map. 18 . The infrared imaging system of claim 10 , wherein the infrared imaging system is a portable thermal camera.
Temperature by averaging, e.g. by scan · CPC title
Imaging · CPC title
for non-uniformity detection or correction · CPC title
applied to dark current · CPC title
Control of the integration time · CPC title
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