Phase unwrapping method based on multi-view constraints of light field and related components

US12529555B2 · US · B2

Patent metadata
FieldValue
Publication numberUS-12529555-B2
Application numberUS-202318199358-A
CountryUS
Kind codeB2
Filing dateMay 18, 2023
Priority dateMay 30, 2022
Publication dateJan 20, 2026
Grant dateJan 20, 2026

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Abstract

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The present disclosure provides a phase unwrapping method based on multi-view constraints of a light field and related components. The method includes: sampling main view phases at different depths in a measurement scene; performing polynomial calibration on a mapping relation from the main view phase to the pixel coordinates of the corresponding points in auxiliary view images; calculating a candidate absolute phase set of each pixel in a main view image; traversing the candidate absolute phase set, calculating an error value between the candidate absolute phase set and wrapped phases of the pixel coordinates of the corresponding points in all the auxiliary view images by utilizing a calibrated mapping relation, and taking a candidate phase corresponding to the minimum error value as an absolute phase of each pixel in the main view image. The present disclosure can stably realize accurate phase unwrapping of the structured light field.

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What is claimed is: 1 . A phase unwrapping method based on multi-view constraints of a light field, comprising: a calibration step, including: sampling main view phases and auxiliary view phases at different depths in a measurement scene through a structured light field system, specifically including: sampling a phase of each pixel in a main view image at each depth and a phase of each pixel in one or more auxiliary view images; acquiring pixel coordinates of corresponding points of the main view phase at each depth in all the auxiliary view images by utilizing a phase consistency principle, so as to obtain a mapping sample set at each depth, and performing polynomial calibration on a mapping relation from the main view phase to the pixel coordinates of the corresponding points in all the auxiliary view images by using the mapping sample set; calculating a candidate order range of each pixel in the main view image according to sampled data; and performing the following calculation steps of phase unwrapping after sampling calibration is completed: calculating according to the candidate order range and obtaining a candidate absolute phase set of each pixel; according to the candidate absolute phase set of each pixel in the main view image, and on the basis of the calibrated mapping relation from the main view phase to the pixel coordinates of the corresponding points in all the auxiliary view images, traversing and calculating pixel coordinates of corresponding points of each candidate absolute phase of the candidate absolute phase set in all the auxiliary view images; and traversing the candidate absolute phase set of each pixel in the main view image, calculating an error value between the candidate absolute phase set and wrapped phases of the pixel coordinates of the corresponding points in the auxiliary view images, and taking the candidate phase corresponding to the minimum error value as an absolute phase of each pixel in the main view image; and wherein the acquiring pixel coordinates of corresponding points of the main view phase at each depth in all the auxiliary view images by utilizing a phase consistency principle, so as to obtain a mapping sample set at each depth, and performing polynomial calibration on a mapping relation from the main view phase to the pixel coordinates of the corresponding points in all the auxiliary view images by using the mapping sample set includes: acquiring a candidate phase ϕ of a single pixel in the main view image at each depth by utilizing the phase consistency principle, so as to obtain a single mapping sample {ϕ→u i |i=1, 2, . . . , V}, wherein u i represents the pixel coordinate of the corresponding point in the i th auxiliary view image, V represents the number of pixels of the auxiliary view image, and V≥i; obtaining the mapping sample set {ϕ n {u} n |n=1, 2, . . . , N} at each depth on the basis of all pixels in the main view image at each depth, wherein n represents a serial number of a data sample, N represents the number of auxiliary views employed, and N≥n; and performing polynomial calibration on the mapping relation from the main view phase to the pixel coordinates of the corresponding points in all the auxiliary view images according to the following formula, and obtaining a polynomial coefficient d n : u i = f u i ( ϕ m ) = ∑ n = 0 N ⁢ d n ⁢ ϕ ⁢ m n ; wherein ui represents the pixel coordinate of the corresponding point in the i th auxiliary view image, f u i (ϕ m ) represents mapping a main view absolute phase to a candidate absolute phase of the pixel in the main view image corresponding to u i of a corresponding point coordinate of the i th auxiliary view, and ϕ m n represents the candidate absolute phase of the nth pixel in the main view image. 2 . The phase unwrapping method based on multi-view constraints of a light field according to claim 1 , wherein the sampling main view phases and auxiliary view phases at different depths in a measurement scene through a structured light field system comprises: placing a plane target at different depths in a measurement space of the structured light field system; performing the following phase calculation flow for each depth: projecting phase shift fringes and complementary Gray codes to the measurement scene by a projector engine of the structured light field system; acquiring a main view image and one or more auxiliary view images of the measurement scene by a light field camera of the structured light field system; and carrying out phase demodulation calculation to obtain a phase of each pixel in the main view image and a phase of each pixel in all the auxiliary view images. 3 . The phase unwrapping method based on multi-view constraints of a light field according to claim 1 , wherein the calculating a candidate order range of each pixel in the main view image according to sampled data comprises: acquiring measurement depths of the structured light field system to obtain a depth range; and obtaining the candidate order range according to a non-linear monotonic relation between the depth and the absolute phase and a corresponding relation between different absolute phases and different orders. 4 . The phase unwrapping method based on multi-view constraints of a light field according to claim 1 , wherein the calculating according to the candidate order range and obtaining a candidate absolute phase set of each pixel comprises: calculating candidate absolute phases Om at different candidate orders according to the following formula: ϕ m =φ m +2 πK; wherein φm represents wrapped phases of pixels in the main view image, and K represents different candidate orders; and obtaining a candidate absolute phase set {ϕ k =k∈[K min , K max ]} on the basis of each candidate order, wherein k represents the kth order. 5 . The phase unwrapping method based on multi-view constraints of a light field according to claim 1 , wherein the according to the candidate absolute phase set of each pixel in the main view image, and on the basis of the calibrated mapping relation from the main view phase to the pixel coordinates of the corresponding points in all the auxiliary view images, traversing and calculating pixel coordinates of corresponding points of each candidate absolute phase of the candidate absolute phase set in all the auxiliary view images comprises: on the basis of the calibration formula u i =

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What does patent US12529555B2 cover?
The present disclosure provides a phase unwrapping method based on multi-view constraints of a light field and related components. The method includes: sampling main view phases at different depths in a measurement scene; performing polynomial calibration on a mapping relation from the main view phase to the pixel coordinates of the corresponding points in auxiliary view images; calculating a c…
Who is the assignee on this patent?
Univ Shenzhen
What technology area does this patent fall under?
Primary CPC classification G01B11/2527. Mapped technology areas include Physics.
When was this patent published?
Publication date Tue Jan 20 2026 00:00:00 GMT+0000 (Coordinated Universal Time) (B2). Legal status and post-grant events are not shown on this page.
What related patents are in patentsdb?
We list 1 related publication on this page (citations in our corpus or others sharing the same primary CPC).