Method for analyzing alpha-ray spectrum obtained from radiation source

US12523788B2 · US · B2

Patent metadata
FieldValue
Publication numberUS-12523788-B2
Application numberUS-202118260469-A
CountryUS
Kind codeB2
Filing dateDec 9, 2021
Priority dateJan 29, 2021
Publication dateJan 13, 2026
Grant dateJan 13, 2026

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  1. Title

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  2. Abstract

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  3. Assignees and inventors

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  4. Key dates

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  5. First independent claim

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  6. CPC / IPC classifications

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  7. Citations and related patents

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Abstract

Official abstract text for this publication.

The present invention relates to a method for analyzing an alpha-ray spectrum obtained from a radiation source, wherein the radiation source includes a first nuclide and a second nuclide that are different from each other, the method comprising the steps of: obtaining simulated spectra for alpha rays emitted from the first nuclide and the second nuclide through a simulation using radioactivity functions of the first nuclide and the second nuclide; measuring alpha rays emitted from the radiation source to obtain an alpha-ray spectrum; and decomposing the alpha-ray spectrum into a first alpha-ray spectrum emitted from the first nuclide and a second alpha-ray spectrum emitted from the second nuclide, on the basis of the simulated spectra.

First claim

Opening claim text (preview).

The invention claimed is: 1 . A method of analyzing an alpha ray spectrum obtained from a radiation source, wherein the radiation source includes a first nuclide and a second nuclide that are different from each other, comprising: obtaining simulated spectra of alpha rays emitted from the first and second nuclides by a simulation based on radioactivity functions of the first and second nuclides; obtaining the alpha ray spectrum by measuring an alpha ray emitted from the radiation source; and decomposing the alpha ray spectrum into a first alpha ray spectrum for an alpha ray emitted from the first nuclide and a second alpha ray spectrum for an alpha ray emitted from the second nuclide based on the simulated spectra. 2 . The method of claim 1 , wherein the second nuclide is a daughter nuclide of the first nuclide. 3 . The method of claim 1 , wherein the combination of the first nuclide and the second nuclide is any one of the combinations of [ 225 Ac, 213 Bi], [ 211 At, 212 Po], [ 212 Bi, 212 Po], [ 213 Bi, 213 Po], [ 212 Pb, 212 Po], [ 223 Ra, 212 Bi], and [ 227 Th, 211 Bi]. 4 . The method of claim 2 , wherein the radiation source includes a first radiation source and a second radiation source, and the first radiation source and the second radiation source have different distributions of the first nuclide and the second nuclide. 5 . The method of claim 4 , wherein, in the measurement, the first radiation source and the second radiation source are spaced apart from each other. 6 . The method of claim 5 , further comprising deriving, after the decomposition, a ratio of an alpha ray from the first radiation source and an alpha ray from the second radiation source at a specific position to be measured. 7 . The method of claim 1 , wherein the measurement is performed on a replica of a part of the body. 8 . The method of claim 1 , wherein the radioactivity functions are obtained based on information on the half-life and the probability of emission of the first nuclide and the second nuclide. 9 . The method of claim 1 , wherein the decomposition of a spectrum to be measured involves a step of obtaining a coefficient ratio between the first alpha ray spectrum and the second alpha ray spectrum at a specific position to be measured. 10 . A method of analyzing an alpha ray spectrum obtained from a radiation source, wherein the radiation source includes a first radiation source including a parent nuclide and a second radiation source that is spaced apart from the first radiation source and includes a daughter nuclide of the parent nuclide, comprising: obtaining simulated spectra of alpha rays emitted from the parent nuclide and the daughter nuclide by a simulation based on radioactivity functions of the parent nuclide and the daughter nuclide; obtaining the alpha ray spectrum by measuring an alpha ray emitted from the radiation source; decomposing the alpha ray spectrum into a first alpha ray spectrum for an alpha ray emitted from the parent nuclide and a second alpha ray spectrum for an alpha ray emitted from the daughter nuclide based on the simulated spectra; and classifying alpha rays measured at a specific position into an alpha ray from the parent nuclide and an alpha ray from the daughter nuclide. 11 . The method of claim 10 , wherein the measurement is performed on a replica of a part of the body.

Assignees

Inventors

Classifications

  • Measuring radioactive content of objects, e.g. contamination (whole body counters G01T1/163) · CPC title

  • Measuring photoelectron spectrum, e.g. electron spectroscopy for chemical analysis [ESCA] or X-ray photoelectron spectroscopy [XPS] · CPC title

  • for spectrometry, i.e. using an analysing crystal, e.g. for measuring X-ray fluorescence spectrum of a sample with wavelength-dispersion, i.e. WDXFS · CPC title

  • the detector being a crystal · CPC title

  • Diffractometry using detectors, e.g. using a probe in a central position and one or more displaceable detectors in circumferential positions · CPC title

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What does patent US12523788B2 cover?
The present invention relates to a method for analyzing an alpha-ray spectrum obtained from a radiation source, wherein the radiation source includes a first nuclide and a second nuclide that are different from each other, the method comprising the steps of: obtaining simulated spectra for alpha rays emitted from the first nuclide and the second nuclide through a simulation using radioactivity …
Who is the assignee on this patent?
Korea Inst Radiological & Medical Sciences
What technology area does this patent fall under?
Primary CPC classification G01T1/36. Mapped technology areas include Physics.
When was this patent published?
Publication date Tue Jan 13 2026 00:00:00 GMT+0000 (Coordinated Universal Time) (B2). Legal status and post-grant events are not shown on this page.
What related patents are in patentsdb?
We list 1 related publication on this page (citations in our corpus or others sharing the same primary CPC).