X-ray analyzer with movable slit between sample and analyzing crystal

Patent metadata

Field	Value
Publication number	US-12523622-B2
Application number	US-202418624261-A
Country	US
Kind code	B2
Filing date	Apr 2, 2024
Priority date	Apr 28, 2023
Publication date	Jan 13, 2026
Grant date	Jan 13, 2026

Abstract

An X-ray analyzer is provided with an excitation source configured to irradiate a sample with an excitation beam, an analyzing crystal configured to diffract characteristic X-rays emitted from the sample irradiated with the excitation beam for each wavelength, a line detector having a plurality of detection elements each arranged to detect an intensity of each of the plurality of wavelengths diffracted by the analyzing crystal, a slit arranged between the sample and the analyzing crystal, an actuator configured to move the slit in a direction intersecting a propagation direction of the characteristic X-rays passing through the slit, and a controller. The controller analyzes the sample using a measurement result when the slit is in an initial position and a measurement result when the slit has been moved from the initial position by a predetermined amount.

First claim

The invention claimed is:

1 . An X-ray analyzer comprising:
an excitation source configured to irradiate a sample with an excitation beam; an analyzing crystal configured to diffract characteristic X-rays emitted from the sample irradiated with the excitation beam; a line detector having a plurality of detection elements each arranged to detect an intensity of each of a corresponding plurality of wavelengths diffracted by the analyzing crystal; a slit arranged between the sample and the analyzing crystal; a drive unit configured to move the slit in a direction intersecting a propagation direction of the characteristic X-rays passing through the slit; and a controller, wherein the controller analyzes the sample using a first measurement result which is a measurement result of the line detector when the slit is in a first position and a second measurement result which is a measurement result of the line detector when the slit has been moved from the first position by the driving device and is in a second position.

2 . The X-ray analyzer as recited in claim 1 ,
wherein the controller generates a spectrum of the characteristic X-rays to be used for an analysis of the sample by synthesizing the first measurement result and the second measurement result.

3 . The X-ray analyzer as recited in claim 1 ,
wherein the plurality of detection elements includes a first detection element, and wherein a movement amount of the slit from the first position to the second position is set to an amount such that a wavelength measured by the first detection element at a time of the first measurement and a wavelength measured by the first detection element at a time of the second measurement differ in value from each other.

4 . The X-ray analyzer as recited in claim 3 ,
wherein the plurality of detection elements includes a second detection element arranged adjacently to the first detection element, and wherein when a wavelength measured by the first detection element at the time of the first measurement and a wavelength measured by the second detection element at the time of the first measurement are defined as a first wavelength and a second wavelength, respectively, a difference between the first wavelength and the second wavelength is defined as a measurement pitch, and a wavelength measured by the first detection element at the time of the second measurement is defined a third wavelength, a difference between the first wavelength and the third wavelength is less than the measurement pitch.

5 . The X-ray analyzer as recited in claim 1 ,
wherein a sample analysis mode by the controller includes a movement mode in which a movement of the slit by the drive unit is accompanied and a fixed mode in which the slit is fixed in position, and wherein the controller switches whether the sample analysis mode is the movement mode or the fixed mode according to a request of the user.

6 . The X-ray analyzer as recited in claim 5 ,
wherein the movement mode includes a step movement mode in which the slit is moved stepwise and a continuous movement mode in which the slit is moved continuously, and wherein the controller switches whether the sample analysis mode is the step movement mode, the continuous movement mode, or the fixed mode, depending on the request of the user.

Assignees

• Shimadzu Corp

Inventors

• Suzuki Keijiro

Classifications

• G01N23/223 Primary

  by irradiating the sample with X-rays or gamma-rays and by measuring X-ray fluorescence · CPC title

• G01N2223/0563

  measure of energy-dispersion spectrum of diffracted radiation · CPC title

• G01N2223/076

  X-ray fluorescence · CPC title

• G01N23/2076 Primary

  for spectrometry, i.e. using an analysing crystal, e.g. for measuring X-ray fluorescence spectrum of a sample with wavelength-dispersion, i.e. WDXFS · CPC title

• G01N2223/079

  incident electron beam and measuring excited X-rays · CPC title