IMS analyzer

Patent metadata

Field	Value
Publication number	US-12504399-B2
Application number	US-202318111714-A
Country	US
Kind code	B2
Filing date	Feb 20, 2023
Priority date	Feb 25, 2022
Publication date	Dec 23, 2025
Grant date	Dec 23, 2025

Abstract

The present disclosure provides an IMS analyzer including an analysis chamber, an electron emitter, an ion detector, a first gas injector that injects a sample gas into the analysis chamber, a second gas injector that injects a drift gas into the analysis chamber, a third gas injector that injects a primary ion generating gas into the analysis chamber, and an outlet port, in which the first gas injector, the second gas injector, the third gas injector, and the outlet port are arranged such that the sample gas merges with the drift gas and the primary ion generating gas in a reaction area and is discharged through the outlet port, the ion detector is located on an upperstream side of the drift gas stream relative to the reaction area, and the electron emitter is located on an upperstream side of the primary ion generating gas stream relative to the reaction area.

First claim

What is claimed is:

1 . An ion mobility spectrometry (IMS) analyzer comprising:
an analysis chamber; an electron emitter located in the analysis chamber; an ion detector located in the analysis chamber; a first gas injector that injects a sample gas into a reaction area of the analysis chamber; a second gas injector that injects a drift gas into the analysis chamber; a third gas injector that injects a primary ion generating gas into the analysis chamber; an outlet port through which the sample gas, the drift gas, and the primary ion generating gas in the analysis chamber are discharged; and an electrostatic gate electrode configured to control movement of ions toward the ion detector, the ions including ions generated around an electrode on an electron-emitting side of the electron emitter, wherein:
the electrostatic gate electrode is located between the electron emitter and the ion detector,
the first gas injector, the second gas injector, the third gas injector, and the outlet port are arranged such that the sample gas merges with the drift gas that has flowed from an ion detector side and the primary ion generating gas that has flowed from the electron emitter side in the reaction area, and the merged gas is discharged through the outlet port,
the ion detector is located on an upperstream side of a stream of the drift gas relative to the reaction area, and the electron emitter is located on an upperstream side of a stream of the primary ion generating gas relative to the reaction area, and
the outlet port is:
located between the electron emitter and the electrostatic gate electrode, and is spatially overlapped with the first gas injector,
not located between the ion detector and the electrostatic gate electrode,
not overlapped with the electron emitter, and
not located on a side opposite the electrostatic gate electrode relative to the electron emitter.

2 . The IMS analyzer according to claim 1 , wherein the first gas injector, the second gas injector, and the third gas injector inject, respectively, the sample gas, the drift gas, and the primary ion generating gas into the analysis chamber from different positions.

3 . The IMS analyzer according to claim 1 , wherein the third gas injector injects the primary ion generating gas into the analysis chamber while the first gas injector is injecting the sample gas into the analysis chamber.

4 . The IMS analyzer according to claim 1 , wherein the primary ion generating gas comprises one of moist air, an oxygen-containing gas, or a chlorine-containing gas.

5 . The IMS analyzer according to claim 1 , wherein a pressure in the analysis chamber is 630 hPa or higher and 1120 hPa or lower.

6 . The IMS analyzer according to claim 1 , wherein
the third gas injector has an inlet port through which the primary ion generating gas is injected into the analysis chamber, and the electron emitter is located between the inlet port and the reaction area.

7 . The IMS analyzer according to claim 1 , wherein the primary ion generating gas has a higher relative humidity than the drift gas.

8 . The IMS analyzer according to claim 1 , wherein the primary ion generating gas has a relative humidity of 0.5% or higher and 10% or lower.

Assignees

• Sharp Kk

Inventors

• Komaru Shohei
• Iwamatsu Tadashi
• Moritani Masamitsu
• Kyuhken Katsuhiko
• Matsuo Shunsuke

Classifications

• G01N27/64

  using wave or particle radiation to ionise a gas, e.g. in an ionisation chamber · CPC title

• G01N27/622 Primary

  Ion mobility spectrometry · CPC title