Method for detecting and handling detector pixels with intermittent behavior for a small pixelated photon counting computed tomography (CT) system

US12502156B2 · US · B2

Patent metadata
FieldValue
Publication numberUS-12502156-B2
Application numberUS-202318316700-A
CountryUS
Kind codeB2
Filing dateMay 12, 2023
Priority dateMay 12, 2023
Publication dateDec 23, 2025
Grant dateDec 23, 2025

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Abstract

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An apparatus and a method for detection of defective pixels for a photon-counting detector-based computed tomography (CT) system is disclosed. In particular, the apparatus and the method disclosed herein, detect detector pixels that have intermittent behavior using on-the-fly defective pixel screening based on various criteria during an object scan. The defective pixels are discarded using a defective pixel map before image reconstruction.

First claim

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The invention claimed is: 1 . A photon-counting computed tomography (CT) apparatus, comprising: processing circuitry configured to receive a first defective pixel map of a detector of the apparatus, wherein the first defective pixel map is generated from results of a calibration scan; perform a scan of a patient; determine a second defective pixel map based on results of the scan of the patient; update the first defective pixel map based on the determined second defective pixel map, reconstruct an image from results of the scan of the patient by utilizing the updated first defective pixel map, and cause a display to display the image, wherein in determining the second defective pixel map, the processing circuitry is further configured to, for each pixel of a plurality of pixels of the detector: determine an energy spectrum of received photons received at the pixel, and determine whether the pixel is defective based on the determined energy spectrum of the pixel. 2 . The apparatus of claim 1 , wherein the processing circuitry is further configured to determine whether the pixel is defective based on a count value in a particular bin of the determined energy spectrum. 3 . The apparatus of claim 1 , wherein the processing circuitry is further configured to determine whether the pixel is defective based on a ratio of (1) those received photons with an energy value greater than a pre-determined energy value to (2) a total count of the received photons at the pixel. 4 . The apparatus of claim 3 , wherein the processing circuitry is further configured to compare the ratio to a threshold to determine whether the pixel is defective. 5 . The apparatus of claim 4 , wherein the threshold varies based on a location of the pixel on the detector for a particular set of parameters of the detector, wherein the threshold further varies based on the particular set of parameters of the detector. 6 . The apparatus of claim 4 , wherein the processing circuitry is further configured to determine the threshold from at least one of a theoretical calculation, a computer simulation, or a physical scan. 7 . The apparatus of claim 1 , wherein the processing circuitry is further configured to determine whether the pixel is defective based on a ratio of a first count value of a first particular bin to a second count value of a second particular bin of the determined energy spectrum of the pixel. 8 . The apparatus of claim 1 , wherein the processing circuitry is further configured to determine whether the pixel is defective based on a weighted average of count values in one or more particular bins of the determined energy spectrum of the pixel. 9 . The apparatus of claim 1 , wherein the processing circuitry is further configured to determine whether the pixel is defective based on a variance of count values in one or more particular bins of the determined energy spectrum of the pixel. 10 . The apparatus of claim 1 , wherein the processing circuitry is further configured to determine whether the pixel is defective based on outputs of a neural network trained to detect an irregularity in an energy distribution of the determined energy spectrum of the pixel. 11 . A method for determining a defective pixel of a detector of a photon-counting computed tomography (CT) apparatus, the method comprising: receiving a first defective pixel map of the detector, wherein the first defective pixel map was generated from results of a calibration scan; performing a scan of a patient; determining a second defective pixel map based on results of the scan of the patient; updating the first defective pixel map based on the determined second defective pixel map, reconstructing an image from results of the scan of the patient by utilizing the updated first defective pixel map, and causing a display to display the image, wherein the determining step further comprises, for each pixel of a plurality of pixels of the detector: determining an energy spectrum of received photons received at the pixel, and determining whether the pixel is defective based on the determined energy spectrum of the pixel. 12 . The method of claim 11 , wherein the step of determining whether the pixel is defective further comprises determining whether the pixel is defective based on a count value in a particular bin of the determined energy spectrum. 13 . The method of claim 11 , wherein the step of determining whether the pixel is defective further comprises determining whether the pixel is defective is based on a ratio of (1) those received photons with an energy value greater than a pre-determined energy value to (2) a total count of the received photons at the pixel. 14 . The method of claim 13 , wherein in determining whether the pixel is defective further comprises comparing the ratio to a threshold. 15 . The method of claim 14 , wherein the threshold varies based on a location of the pixel on the detector for a predetermined set of parameters of the detector, wherein the threshold further varies based on the particular set of parameters of the detector. 16 . A photon-counting computed tomography (CT) apparatus, comprising: a photon-counting detector; and processing circuitry configured to receive a first defective pixel map of the photon-counting detector, wherein the first defective pixel map is generated from results of a calibration scan; determine an energy spectrum of received photons for each pixel of a plurality of pixels of the photon-counting detector; determine a second defective pixel map based on a count value in a pre-determined energy bin of the determined energy spectrum of the pixel; update the first defective pixel map based on the determined second defective pixel map; reconstruct an image from results of the scan of the patient by utilizing the updated first defective pixel map; and cause a display to display the image, wherein in determining the second defective pixel map, the processing circuitry is further configured to, for each pixel of a plurality of pixels of the detector: determine an energy spectrum of received photons received at the pixel, and determine whether the pixel is defective based on the determined energy spectrum of the pixel.

Assignees

Inventors

Classifications

  • calibration techniques (stabilization of spectrometer G01T1/40) · CPC title

  • Detector read-out circuitry (for processing gain or off-set correction H04N) · CPC title

  • involving processing of raw data to produce diagnostic data · CPC title

  • A61B6/4241Primary

    using energy resolving detectors, e.g. photon counting · CPC title

  • Transmission computed tomography [CT] · CPC title

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What does patent US12502156B2 cover?
An apparatus and a method for detection of defective pixels for a photon-counting detector-based computed tomography (CT) system is disclosed. In particular, the apparatus and the method disclosed herein, detect detector pixels that have intermittent behavior using on-the-fly defective pixel screening based on various criteria during an object scan. The defective pixels are discarded using a de…
Who is the assignee on this patent?
Canon Medical Systems Corp
What technology area does this patent fall under?
Primary CPC classification A61B6/4241. Mapped technology areas include Human Necessities.
When was this patent published?
Publication date Tue Dec 23 2025 00:00:00 GMT+0000 (Coordinated Universal Time) (B2). Legal status and post-grant events are not shown on this page.
What related patents are in patentsdb?
We list 3 related publications on this page (citations in our corpus or others sharing the same primary CPC).