Resist composition, method of forming resist pattern, and compound

US12498635B2 · US · B2

Patent metadata
FieldValue
Publication numberUS-12498635-B2
Application numberUS-201916686925-A
CountryUS
Kind codeB2
Filing dateNov 18, 2019
Priority dateDec 5, 2018
Publication dateDec 16, 2025
Grant dateDec 16, 2025

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  1. Title

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  2. Abstract

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  3. Assignees and inventors

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  4. Key dates

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  5. First independent claim

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  6. CPC / IPC classifications

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  7. Citations and related patents

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Abstract

Official abstract text for this publication.

A resist composition including a base material component (A) whose solubility in a developing solution is changed due to the action of an acid, and a compound (D0) formed of an anion moiety and a cation moiety which is represented by Formula (d0), in which the cation moiety of the compound (D0) has a Log P value of less than 7.7. In the formula, M m+ represents an m-valent organic cation, R d0 represents a substituent, p represents an integer of 0 to 3, q represents an integer of 0 to 3, n represents an integer of 2 or greater, and a relationship of “n+p≤(q×2)+5” is satisfied.

First claim

Opening claim text (preview).

What is claimed is: 1 . A resist composition which generates an acid upon exposure and whose solubility in a developing solution is changed due to an action of the acid, the resist composition comprising: a base material component (A) whose solubility in a developing solution is changed due to the action of an acid; and a compound (DO) formed of an anion moiety and a cation moiety, which is represented by Formula (d0), wherein the cation moiety of the compound (DO) has a Log P value of less than 7.7, wherein M m+ represents an m-valent organic cation represented by Formula (ca-d0), m represents 1, R d0 represents a substituent, p represents an integer of 0 to 3, and in a case where p represents 2 or 3, a plurality of substituents as R d0 may be the same as or different from one another, q represents an integer of 0 to 3, n represents an integer of 2 or greater, where a relationship of “n+p≤(q×2)+5” is satisfied, wherein R d1 represents an aryl group which may have a substituent; and R d2 and R d3 each independently represent an aryl group which may have a substituent or may be bonded to each other to form a ring with a sulfur atom in Formula (ca-d0); provided that when any of R d1 , R d2 and R d3 has a substituent represented by any of Formula (ca-r-1) to (ca-r-7), R′ 201 in Formula (ca-r-1) to (ca-r-7) is a hydrogen atom, a chain-like alkyl group which may have a substituent, or a chain-like alkenyl group which may have a substituent, 2 . A method of forming a resist pattern, comprising: forming a resist film on a support using the resist composition according to claim 1 ; exposing the resist film; and developing the exposed resist film to form a resist pattern. 3 . A compound formed of an anion moiety and a cation moiety, which is represented by Formula (d0), wherein a Log P value of the cation moiety is less than 7.7, wherein M m+ represents an m-valent organic cation represented by Formula (ca-d0), m represents 1, R d0 represents a substituent, p represents an integer of 0 to 3, and in a case where p represents 2 or 3, a plurality of substituents as R d0 may be the same as or different from one another, q represents an integer of 0 to 3, n represents an integer of 2 or greater, where a relationship of “n+p≤(q×2)+5” is satisfied, wherein R d1 represents an aryl group which may have a substituent; and R d2 and R d3 each independently represent an aryl group which may have a substituent or may be bonded to each other to form a ring with a sulfur atom in Formula (ca-d0); provided that when any of R d1 , R d2 and R d3 has a substituent represented by any of Formula (ca-r-1) to (ca-r-7), R′ 201 in Formula (ca-r-1) to (ca-r-7) is a hydrogen atom, a chain-like alkyl group which may have a substituent, or a chain-like alkenyl group which may have a substituent,

Assignees

Inventors

Classifications

  • Sulfides having the sulfur atom of at least one thio group bound to two carbon atoms of six-membered aromatic rings · CPC title

  • Exposure; Apparatus therefor (photographic printing apparatus for making copies G03B27/00) · CPC title

  • Coating on a rotating support, e.g. using a whirler or a spinner · CPC title

  • Imagewise removal using liquid means · CPC title

  • o-Hydroxy carboxylic acids · CPC title

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What does patent US12498635B2 cover?
A resist composition including a base material component (A) whose solubility in a developing solution is changed due to the action of an acid, and a compound (D0) formed of an anion moiety and a cation moiety which is represented by Formula (d0), in which the cation moiety of the compound (D0) has a Log P value of less than 7.7. In the formula, M m+ represents an m-valent organic cation, R d0…
Who is the assignee on this patent?
Tokyo Ohka Kogyo Co Ltd
What technology area does this patent fall under?
Primary CPC classification G03F7/0045. Mapped technology areas include Physics.
When was this patent published?
Publication date Tue Dec 16 2025 00:00:00 GMT+0000 (Coordinated Universal Time) (B2). Legal status and post-grant events are not shown on this page.
What related patents are in patentsdb?
We list 1 related publication on this page (citations in our corpus or others sharing the same primary CPC).