Memory device including string select transistors having different threshold voltages and method of operating the memory device

Patent metadata

Field	Value
Publication number	US-12494257-B2
Application number	US-202418409344-A
Country	US
Kind code	B2
Filing date	Jan 10, 2024
Priority date	Feb 21, 2023
Publication date	Dec 9, 2025
Grant date	Dec 9, 2025

Abstract

A memory device including: a memory cell array including a plurality of memory blocks; a voltage generator configured to generate an erase voltage and row line voltages to be provided to a target block of the plurality of memory blocks on which an erase operation is to be performed; and a control logic circuit configured to control the memory cell array and the voltage generator, wherein, during the erase operation, after a precharge voltage is applied to a plurality of string select lines connected to the target block, the control logic circuit is further configured to provide the erase voltage to a plurality of bit lines connected to the plurality of string select lines, wherein the plurality of string select lines includes a first string select line and a second string select line, wherein a first distance between the first string select line and ends of a plurality of word lines connected to the target block is less than a second distance between the second string select line and the ends of the plurality of word lines, and wherein a first threshold voltage of a first transistor connected to the first string select line is higher than a second threshold voltage of a second transistor connected to the second string select line.

First claim

What is claimed is:

1 . A memory device comprising:
a memory cell array comprising a plurality of memory blocks; a voltage generator configured to generate an erase voltage and row line voltages to be provided to a target block of the plurality of memory blocks on which an erase operation is to be performed; and a control logic circuit configured to control the memory cell array and the voltage generator, wherein, during the erase operation, after a precharge voltage is applied to a plurality of string select lines connected to the target block, the voltage generator is further configured to provide the erase voltage to a plurality of bit lines connected to the plurality of string select lines, wherein the plurality of string select lines comprises a first string select line and a second string select line, wherein a first distance between the first string select line and ends of a plurality of word lines connected to the target block is less than a second distance between the second string select line and the ends of the plurality of word lines, and wherein a first threshold voltage of a first transistor connected to the first string select line is higher than a second threshold voltage of a second transistor connected to the second string select line.

2 . The memory device of claim 1 , wherein the first string select line and the second string select line are configured to be floated after the first string select line and the second string select line are precharged.

3 . The memory device of claim 1 , wherein, during a program operation for the target block, while a program voltage is applied to the plurality of word lines, the voltage generator is further configured to provide a first voltage to the first string select line, and to provide a second voltage which is lower than the first voltage to the second string select line.

4 . The memory device of claim 1 , wherein, during an operation to check the first threshold voltage of the first transistor and the second threshold voltage of the second transistor, the voltage generator is further configured to provide a first voltage to the first string select line, and to provide a second voltage to the second string select line,
wherein a difference between the second voltage and the first voltage is equal to a difference between the second threshold voltage and the first threshold voltage.

5 . The memory device of claim 1 , wherein, based on the precharge voltage being applied to the plurality of string select lines, the voltage generator is further configured to provide a first precharge voltage to the first string select line, and to provide a second precharge voltage to the second string select line,
wherein the first precharge voltage is lower than the second precharge voltage.

6 . The memory device of claim 1 , wherein, during a read operation for the target block, the voltage generator is further configured to provide a first pulse voltage having a first voltage level to the first string select line during a first time period, and to provide a second pulse voltage having a second voltage level to the second string select line for a second time period,
wherein the first time period is greater than the second time period.

7 . The memory device of claim 6 , wherein the first voltage level is greater than the second voltage level.

8 . The memory device of claim 1 , wherein the first transistor is configured to provide a first voltage, which is obtained by subtracting the first threshold voltage from the erase voltage, to a terminal of a first erase control transistor which is connected in series with the first transistor, and
wherein the second transistor is configured to provide a second voltage, which is obtained by subtracting the second threshold voltage from the erase voltage, to a terminal of a second erase control transistor which is connected in series with the second transistor.

9 . The memory device of claim 8 , wherein, during the erase operation, a voltage difference between a voltage of a gate terminal of the first erase control transistor and a voltage of the terminal of the first erase control transistor is less than a voltage difference between a voltage of a gate terminal of the second erase control transistor and a voltage of the terminal of the second erase control transistor.

10 . The memory device of claim 1 , further comprising a first pass transistor between the voltage generator and a gate terminal of the first transistor and a second pass transistor between the voltage generator and a gate terminal of the second transistor,
wherein the first pass transistor is configured to transfer the precharge voltage to the gate terminal of the first transistor, and the second pass transistor is configured to transfer the precharge voltage to the gate terminal of the second transistor, based on a voltage level of a block select line, wherein, based on the first pass transistor and the second pass transistor being turned off, the precharge voltage maintains a predetermined level.

11 . A method of operating a memory device including a memory block which includes a plurality of cell strings connected to a plurality of word lines formed in a vertical direction on a substrate, the method comprising:
precharging a plurality of string select lines connected to gate terminals of a plurality of string select transistors and horizontally adjacent to each other between word line cut regions, wherein the plurality of string select transistors have different threshold voltages; providing different voltages to first terminals of a plurality of erase control transistors connected to second terminals of the plurality of string select transistors, by applying an erase voltage to a plurality of bit lines connected to first terminals of the plurality of string select transistors; and erasing data of the plurality of cell strings by applying an erase control voltage to gate terminals of the plurality of erase control transistors, wherein the plurality of string select lines comprises a first string select line and a second string select line, wherein a first distance between the first string select line and ends of the plurality of word lines is less than a second distance between the second string select line and the ends of the plurality of word lines, and wherein a first threshold voltage of a first string select transistor connected to the first string select line is higher than a second threshold voltage of a second string select transistor connected to the second string select line.

12 . The method of claim 11 , wherein the providing of the different voltages to the first terminals of the plurality of erase control transistors comprises providing voltages obtained by subtracting threshold voltages of the plurality of string select transistors from the erase voltage to the first terminals of the plurality of erase control transistors.

13 . The method of claim 12 , wherein during a program operation, the method further comprises:
applying a first voltage to the first string select line while a program voltage is applied to word lines connected to the plurality of cell strings; and applying a second voltage which is lower than the first voltage to the second string select line while the program voltage is applied to the word lines.

14 . The method of claim 11 , wherein during a read operation, the method further comprises:
applying a first pulse voltage having a first voltage level to the first string select line during a first time period; and applying a second pulse voltage having a second voltage level to the second string select line duri

Assignees

• Samsung Electronics Co Ltd

Inventors

• Lee Yohan
• Yu Jaeduk
• Park Sangsoo

Classifications

• G11C16/26

  Sensing or reading circuits; Data output circuits · CPC title

• G11C16/10

  Programming or data input circuits · CPC title

• G11C16/0483 Primary

  comprising cells having several storage transistors connected in series · CPC title

• G11C16/08

  Address circuits; Decoders; Word-line control circuits · CPC title

• G11C16/32

  Timing circuits · CPC title