Envelope based sample correction for digital flow metrology

Patent metadata

Field	Value
Publication number	US-12474190-B2
Application number	US-202017064671-A
Country	US
Kind code	B2
Filing date	Oct 7, 2020
Priority date	May 12, 2015
Publication date	Nov 18, 2025
Grant date	Nov 18, 2025

Abstract

In an embodiment, a system for measuring material flow in a pipe is disclosed. A first transducer is operable to transmit a first signal having a first frequency at a first time and receive a second signal at a second time, and a second transducer spaced apart from the first transducer and is operable to receive the first signal and transmit the second signal having the first frequency. A signal processing circuit communicatively coupled to the first transducer and the second transducer, the signal processing circuit is operable to determine a first envelope of the first signal and a second envelope of the second signal and calculate a flow rate based on the first envelope of the first signal and the second envelope of the second signal.

First claim

What is claimed is:

1 . A system, comprising:
a first transducer operable to transmit a first signal having a first frequency at a first time and receive a second signal at a second time; a second transducer operable to receive the first signal and transmit the second signal having the first frequency; and a signal processing circuit communicatively coupled to the first transducer and the second transducer, the signal processing circuit operable to:
sample the first signal to produce a sampled first signal;
sample the second signal to produce a sampled second signal;
band pass filter the sampled first signal and the sampled second signal based on the first frequency to produce a filtered first signal and a filtered second signal;
determine a first envelope of the filtered first signal and a second envelope of the filtered second signal;
normalize the first envelope to form a normalized first envelope;
normalize the second envelope to form a normalized second envelope;
align the first normalized envelope with the second normalized envelope based on a first crossing point of the first normalized envelope with a threshold and a second crossing point of the second normalized envelope with the threshold to determine a time of flight;
determine an error based on alignment points associated with the first signal and the second signal;
determine a corrected time of flight based on the error and the time of flight; and
calculate a flow rate of a material based on the corrected time of flight.

2 . The system of claim 1 , wherein the first transducer is affixed to a pipe, and wherein the second transducer is spaced apart from the first transducer and affixed to the pipe.

3 . The system of claim 1 , wherein the signal processing circuit is further operable to receive the first signal and the second signal.

4 . The system of claim 3 , wherein the signal processing circuit comprises an analog-to-digital converter, the analog-to-digital converter is operable to sample the received first signal and the received second signal at a sampling frequency.

5 . The system of claim 1 , wherein the signal processing circuit comprises a buffer memory to store the sampled first signal and the sampled second signal.

6 . The system of claim 1 , wherein the aligning of the first normalized envelope with the second normalized envelope includes:
determining an integer number of samples between the first crossing point of the first normalized envelope and the second crossing point of the second normalized envelope; and determining the time of flight based on the integer number of samples between the first crossing point of the first normalized envelope and the second crossing point of the second normalized envelope.

7 . The system of claim 6 wherein:
the determining of the error includes performing a cross-correlation of the first sampled signal and the second sampled signal to determine a fractional sample difference between the first sampled signal and the second sampled signal; and
the corrected time of flight is based on a sum of the integer number of samples and the fractional sample difference.

8 . The system of claim 1 , wherein the threshold is based on a flow rate.

9 . The system of claim 1 , wherein the threshold is based on a temperature.

10 . The system of claim 1 , wherein the first crossing point is on a falling edge of the first normalized envelope.

Assignees

• Texas Instruments Inc

Inventors

• Sathyanarayana Amardeep
• Dabak Anand G
• Magee David Patrick

Classifications

• G01F1/662 Primary

  Constructional details · CPC title