Pulsed electrochemical machining
US-2024109142-A1 · Apr 4, 2024 · US
US12472571B2 · US · B2
| Field | Value |
|---|---|
| Publication number | US-12472571-B2 |
| Application number | US-202217661483-A |
| Country | US |
| Kind code | B2 |
| Filing date | Apr 29, 2022 |
| Priority date | Apr 29, 2022 |
| Publication date | Nov 18, 2025 |
| Grant date | Nov 18, 2025 |
A practical reading order for non-experts. Skip the full description unless you need deep technical detail.
What the patent document calls the invention.
A short plain-language summary of the technical disclosure.
Who owns or filed the patent and who is credited as inventor.
Filing, priority, publication, and grant dates set the timeline.
The legal scope of protection — read this for what is actually claimed.
Technology tags used to group this patent with similar filings.
Prior art links and similar publications in this corpus.
Official abstract text for this publication.
The disclosure describes a method for defining an electrode of a pulsed electrochemical machining (pECM) tool that is performed by one or more processors. The method includes receiving workpiece measurement data representative of a machined surface of a machined workpiece. The machined workpiece has been machined by a working surface of an initial electrode. The method includes identifying a set of dimensional differences between the workpiece measurement data and workpiece model data representative of a finished surface of a master workpiece. The method includes updating, based on the set of dimensional differences, initial electrode model data representative of the working surface of the initial electrode and outputting the updated electrode model data.
Opening claim text (preview).
The invention claimed is: 1 . A method for defining a pulsed electrochemical machining (pECM) tool, comprising: receiving, by one or more processors, workpiece measurement data representative of a machined surface of a machined workpiece, wherein the machined workpiece has been machined by a working surface of an initial electrode, and wherein the workpiece measurement data comprises a first point cloud; identifying, by the one or more processors, a set of dimensional differences between the workpiece measurement data and workpiece model data representative of a finished surface of a master workpiece, wherein the workpiece model data comprises a second point cloud, and wherein the set of dimensional differences comprises a plurality of vectors representing a distance between corresponding data points of the first point cloud and the second point cloud; updating, by the one or more processors and based on the set of dimensional differences, initial electrode model data representative of the working surface of the initial electrode; and outputting, by the one or more processors, the updated electrode model data. 2 . The method of claim 1 , wherein the electrode model data comprises a plurality of data points, and wherein updating the initial electrode model data comprises adjusting the plurality of data points by the plurality of vectors. 3 . The method of claim 2 , wherein the initial electrode is configured to advance along a z-axis, and wherein each of the plurality of vectors comprises a difference in the z-axis between a data point of the first point cloud and a corresponding data point of the second point cloud. 4 . The method of claim 3 , wherein each of the plurality of vectors comprises a magnitude along the z-axis and a direction along the z-axis. 5 . The method of claim 1 , further comprising: receiving, by the one or more processors, second workpiece measurement data representative of a machined surface of a second machined workpiece, wherein the second machined workpiece has been machined by a working surface of a refined electrode based on the updated electrode model data; identifying, by the one or more processors, a second set of dimensional differences between the second workpiece measurement data and the workpiece model data; updating, by the one or more processors and based on the second set of dimensional differences, the previously updated electrode model data representative of the working surface of the refined electrode; and outputting, by the one or more processors, the newly updated electrode model data. 6 . The method of claim 1 , wherein the working surface of the initial electrode is offset from the finished surface of the master workpiece by a predetermined gap. 7 . The method of claim 6 , further comprising determining, by the one or more processors and based on the workpiece model data and the predetermined gap, the initial electrode model data. 8 . The method of claim 1 , further comprising receiving, by the one or more processors, initial electrode measurement data representative of the working surface of the initial electrode. 9 . The method of claim 8 , wherein the updated electrode model data is further determined based on one or more differences between the initial electrode measurement data and the initial electrode model data. 10 . A device for defining a pulsed electrochemical machining (pECM) tool, comprising: a memory configured to store: workpiece model data representative of a finished surface of a master workpiece; and initial electrode model data representative of a working surface of an initial electrode; and one or more processors configured to: receive workpiece measurement data representative of a machined surface of a machined workpiece, wherein the machined workpiece has been machined by the working surface of the initial electrode, and wherein the workpiece measurement data comprises a first point cloud; identify a set of dimensional differences between the workpiece measurement data and the workpiece model data, wherein the workpiece model data comprises a second point cloud, and wherein the set of dimensional differences comprises a plurality of vectors representing a distance between corresponding data points of the first point cloud and the second point cloud; update, based on the set of dimensional differences, the initial electrode model data; and output the updated electrode model data. 11 . The device of claim 10 , wherein the initial electrode model data comprises a plurality of data points, and wherein, to update the initial electrode model data, the one or more processors are configured to adjust the plurality of data points by the plurality of vectors. 12 . The device of claim 11 , wherein the initial electrode is configured to advance along a z-axis, and wherein each of the plurality of vectors comprises a difference in the z-axis between a data point of the first point cloud and a corresponding data point of the second point cloud. 13 . The device of claim 12 , wherein each of the plurality of vectors comprises a magnitude along the z-axis and a direction along the z-axis. 14 . The device of claim 10 , wherein the one or more processors are configured to: receive second workpiece measurement data representative of a machined surface of a second machined workpiece, wherein the second machined workpiece has been machined by a working surface of a refined electrode based on the updated electrode model data; identify a second set of dimensional differences between the second workpiece measurement data and the workpiece model data; update, based on the second set of dimensional differences, the previously updated electrode model data representative of the working surface of the refined electrode; and output the newly updated electrode model data. 15 . The device of claim 10 , wherein the working surface of the initial electrode is offset from the finished surface of the master workpiece by a predetermined gap, and wherein the one or more processors are configured to determine, based on the workpiece model data and the predetermined gap, the initial electrode model data. 16 . The device of claim 10 , wherein the one or more processors are configured to receive initial electrode measurement data representative of the working surface of the initial electrode. 17 . The device of claim 16 , wherein the one or more processors are configured to determine the updated electrode model data based on one or more differences between the initial electrode measurement data and the initial electrode model data. 18 . A system for refining a pulsed electrochemical machining (pECM) tool, comprising: a coordinate measurement device configured to generate workpiece measurement data representative of a machined workpiece; and a computing device comprising one or more processors configured to: receive the workpiece measurement data, wherein the machined workpiece has been machined by a working surface of an initial electrode, and wherein the workpiece measurement data comprises a first point cloud; identify a set of dimensional differences between the workpiece measurement data and workpiece model data representative of a finished surface of a master workpiece, wherein the workpiece model data comprises a second point cloud, and wherein the set of dimensional differences comprises a plurality of vectors representing a distance between corresponding data points of the first point cloud and the second point cloud; update, based on the set
Electrodes specially adapted therefor or their manufacture (B23H9/00 takes precedence) · CPC title
Pulsed electrochemical machining · CPC title
for program control, e.g. adaptive · CPC title
Electric circuits specially adapted therefor, e.g. power supply, control, preventing short circuits · CPC title
Related publications grouped by family.
Answers are generated from the same data shown on this page.