Method of evaluating an electromagnetic field

Patent metadata

Field	Value
Publication number	US-12467963-B2
Application number	US-202318364218-A
Country	US
Kind code	B2
Filing date	Aug 2, 2023
Priority date	Aug 2, 2023
Publication date	Nov 11, 2025
Grant date	Nov 11, 2025

Abstract

The present disclosure relates to techniques for evaluating an electromagnetic field of a device under test.

First claim

The embodiments of the invention in which an exclusive property or privilege is claimed are defined as follows:

1 . A method of evaluating an electromagnetic field of a device under test, wherein the method comprises:
providing a device under test that radiates an electromagnetic field, performing a measurement of the device under test in order to obtain measurement data, wherein at least two components of the electromagnetic field of the device under test are measured with regard to their magnitude and phase over a measurement surface, determining an equivalent source of the device under test based on the measurement data, wherein the equivalent source has a source surface that is different than the measurement surface, providing a model that comprises the equivalent source determined and at least one modeled scatterer, wherein the equivalent source determined is used as an excitation source, creating a monitoring surface that encompasses the equivalent source with its source surface, but does not encompass the at least one modeled scatterer or cross the at least one modeled scatterer, calculating an electromagnetic field of the equivalent source over the monitoring surface, evaluating a total radiated power based on the electromagnetic field of the equivalent source calculated over the monitoring surface in presence of the at least one modeled scatterer, and determining at least one normalization factor based on the total radiated power determined and the measurement data.

2 . The method according to claim 1 , wherein an initial total radiated power is measured when performing the measurement of the device under test on the measurement surface, and wherein the at least one normalization factor is determined based on the initial total radiated power and the total radiated power determined on the monitoring surface.

3 . The method according to claim 1 , wherein a normalization factor for the power, a normalization factor for the electric field and/or a normalization factor for the magnetic field are/is calculated.

4 . The method according to claim 1 , wherein an initial total radiated power is measured when performing the measurement of the device under test on the measurement surface, wherein the at least one normalization factor is determined based on the initial total radiated power and the total radiated power determined on the monitoring surface, and wherein a normalization factor for the power is a quotient of the initial total radiated power and the total radiated power determined on the monitoring surface.

5 . The method according to claim 1 , wherein an initial total radiated power is measured when performing the measurement of the device under test on the measurement surface, wherein the at least one normalization factor is determined based on the initial total radiated power and the total radiated power determined on the monitoring surface, and wherein a normalization factor for the electric field and/or a normalization factor for the magnetic field is a square root of a quotient of the initial total radiated power and the total radiated power determined on the monitoring surface.

6 . The method according to claim 1 , wherein the equivalent source is determined such that a simulated electromagnetic field of the equivalent source on the measurement surface is similar to the electromagnetic field of the device under test measured on the measurement surface.

7 . The method according to claim 1 , wherein a scattered electromagnetic field of the at least one modeled scatterer is taken into account when determining the at least one normalization factor.

8 . The method according to claim 1 , wherein the device under test is fully encompassed by at least one of the source surface and the monitoring surface.

9 . The method according to claim 1 , wherein at least one of the source surface and the monitoring surface does not cross the device under test.

10 . The method according to claim 1 , wherein the equivalent source is determined based on an algorithm applied.

11 . The method according to claim 1 , wherein the equivalent source is a Huygens source and the source surface is a Huygens surface.

12 . The method according to claim 1 , wherein the source surface is a numerical field surface.

13 . The method according to claim 1 , wherein the at least one modeled scatterer provides a scattering environment.

14 . The method according to claim 1 , wherein the device under test is encompassed by the measurement surface.

15 . The method according to claim 1 , wherein the measurement surface is a spherical surface.

16 . The method according to claim 1 , wherein the measurement is a free space measurement and/or wherein the measurement is performed in an anechoic chamber.

17 . A method of evaluating an electromagnetic field of a device under test, wherein the method comprises the steps of:
providing a device under test that radiates an electromagnetic field, performing a measurement of the device under test in order to obtain measurement data, wherein at least two components of the electromagnetic field of the device under test are measured with regard to their magnitude and phase over a measurement surface, determining an equivalent source of the device under test based on the measurement data, wherein the equivalent source has a source surface that is different than the measurement surface, wherein the equivalent source is a Huygens source and the source surface is a Huygens surface, providing a model that comprises the Huygens source determined and at least one modeled scatterer, wherein the Huygens source determined is used as an excitation source, creating a monitoring surface that encompasses the Huygens source with its Huygens surface, but does not encompass the at least one modeled scatterer or cross the at least one modeled scatterer, calculating an electromagnetic field of the Huygens source over the monitoring surface, evaluating a total radiated power based on the calculated electromagnetic field in presence of the at least one modeled scatterer, and determining at least one normalization factor based on the total radiated power determined and the measurement data.

18 . A method of evaluating an electromagnetic field of a device under test, wherein the method comprises the steps of:
providing a device under test that radiates an electromagnetic field, performing a measurement of the device under test in order to obtain measurement data, wherein at least two components of the electromagnetic field of the device under test are measured with regard to their magnitude and phase over a measurement surface, determining an equivalent source of the device under test based on the measurement data, wherein the equivalent source has a source surface that is different than the measurement surface, providing a model that comprises the equivalent source determined and at least one modeled scatterer, wherein the equivalent source determined is used as an excitation source, creating a monitoring surface that encompasses the equivalent source, but does not encompass the at least one modeled scatterer or cross the at least one modeled scatterer, calculating an electromagnetic field of the equivalent source over the monitoring surface, evaluating a total radiated power based on the calculated electromagnetic field in presence of the at least one modeled scatterer, and determining at least one normalization factor based on the total radiated power determined and the measurement data such that an in-situ normalization i

Assignees

• Rohde & Schwarz
• Imst Gmbh

Inventors

• Derat Benoit
• Celik Mert
• Simon Winfried
• Schaefer David

Classifications

• G01R29/10

  Radiation diagrams of antennas · CPC title

• G01R29/0892 Primary

  Details related to signal analysis or treatment; presenting results, e.g. displays; measuring specific signal features other than field strength, e.g. polarisation, field modes, phase, envelope, maximum value · CPC title

• G01R29/0814 Primary

  Field measurements related to measuring influence on or from apparatus, components or humans (EMC, EMI and similar testing in general G01R31/001), e.g. in ESD, EMI, EMC, EMP testing, measuring radiation leakage; detecting presence of micro- or radiowave emitters; dosimetry; testing shielding; measurements related to lightning · CPC title