Port identification method and apparatus

Patent metadata

Field	Value
Publication number	US-12451973-B2
Application number	US-202318308308-A
Country	US
Kind code	B2
Filing date	Apr 27, 2023
Priority date	Oct 29, 2020
Publication date	Oct 21, 2025
Grant date	Oct 21, 2025

Abstract

This application provides a port identification method. The method includes: obtaining reflection information of reflection peaks formed by each ONT by separately reflecting test light when the test light provided by a wavelength-tunable device is transmitted in the PON; determining, based on the reflection information of the reflection peaks, a port of a splitter corresponding to each reflection peak group, where each reflection peak group includes reflection peaks formed by a same ONT by reflecting the test light; and determining, based on first transmission information of at least one reflection peak in each reflection peak group, the port of the splitter corresponding to each reflection peak group, and second transmission information between each ONT and an OLT, a port corresponding to each ONT in the splitter. According to this application, port identification efficiency can be improved.

First claim

What is claimed is:

1. A method, wherein the method is applied to a passive optical network (PON), the PON comprises at least one splitter comprised in at least one level of splitter, and the PON further comprises at least one optical network terminal (ONT), each ONT of the at least one ONT is separately connected to a different port of ports of the at least one splitter through an optical fiber, reflection components are disposed on the ports of the at least one splitter, wavelengths of test lights reflected by reflection components of different ports of a same splitter of the at least one splitter are different, and the method comprises:
obtaining reflection information of reflection peaks formed by each ONT of the at least one ONT by separately reflecting a test light when the test lights that are provided by a wavelength-tunable device are transmitted in the PON, wherein the test lights comprise test lights reflected by the reflection components of the ports of the at least one splitter, the reflection information comprises at least heights of the reflection peaks;
determining, based on the reflection information of the reflection peaks, a port of a splitter of the at least one splitter corresponding to each reflection peak group, wherein each reflection peak group comprises reflection peaks formed by a same ONT by reflecting the test lights; and
determining, based on first transmission information corresponding to at least one reflection peak in each reflection peak group, the port of the splitter of the at least one splitter that corresponds to each reflection peak group, and second transmission information between each ONT and an optical line terminal (OLT), the port corresponding to each ONT in the at least one splitter; and
wherein determining, based on the reflection information of the reflection peaks, the port of the splitter of the at least one splitter corresponding to each reflection peak group comprises:
determining, based on locations and the heights of the reflection peaks, the port of the splitter of the at least one splitter corresponding to each reflection peak group; or
determining, based on time information and the heights of the reflection peaks, the port of the splitter of the at least one splitter corresponding to each reflection peak group, wherein time information of any reflection peak is a duration used by the wavelength-tunable device to transmit test light corresponding to the reflection peak to an ONT corresponding to the reflection peak.

2. The method according to claim 1 , wherein:
when the first transmission information is a location, the second transmission information is a transmission distance;
when the first transmission information is a height, the second transmission information is a transmission loss;
when the first transmission information is a location and a height, the second transmission information is a transmission distance and a transmission loss;
when the first transmission information is time information, the second transmission information is transmission duration; or
when the first transmission information is time information and a transmission loss, the second transmission information is a transmission duration and a transmission loss.

3. The method according to claim 1 , further comprising:
obtaining reflection information of a reflection peak formed by each ONT by reflecting target test light when the target test light provided by the wavelength-tunable device is transmitted in the PON, wherein a wavelength of the target test light is different from the wavelengths of the test lights reflected by the reflection components of the ports of the at least one splitter; and
wherein determining, based on locations and the heights of the reflection peaks, the port of the splitter of the at least one splitter corresponding to each reflection peak group comprises:
determining, based on the locations and the heights of the reflection peaks and a location and a height of the reflection peak formed by the target test light, the port of the splitter of the at least one splitter corresponding to each reflection peak group.

4. The method according to claim 3 , wherein the at least one splitter is an even splitter, the at least one level of splitter is n levels of splitters, n is greater than or equal to 2, the at least one ONT is connected to a level-n splitter of the at least one splitter, and wavelengths of the test lights reflected by reflection components of ports of different levels of splitters are different; and
wherein determining, based on the locations and the heights of the reflection peaks and the location and the height of the reflection peak formed by the target test light, the port of the splitter of the at least one splitter corresponding to each reflection peak group comprises:
determining, based on the location and the height of the reflection peak formed by the target test light and a location and a height of a reflection peak formed by test light of a level-(i−1) splitter in the test light, a reflection peak corresponding to a same level-i splitter in each reflection peak group, and a port of the level-(i−1) splitter connected to a level-i splitter, wherein the test light of the level-(i−1) splitter is test light reflected by a reflection component of the port of the level-(i−1) splitter, and i is greater than 1 and less than or equal to n;
determining, based on the location and the height of the reflection peak formed by the target test light and a location and a height of a reflection peak formed by test light of the level-n splitter in the test light, a port of the level-n splitter corresponding to each reflection peak group, wherein the test light of the level-n splitter is test light reflected by a reflection component of the port of the level-n splitter; and

determining, based on the reflection peak corresponding to the same level-i splitter in each reflection peak group, the port of the level-(i−1) splitter connected to the level-i splitter, and the port of the level-n splitter corresponding to each reflection peak group, the port of the splitter corresponding to each reflection peak group.

5. The method according to claim 3 , wherein the at least one splitter is an even splitter, the at least one level of splitter is n levels of splitters, n is greater than or equal to 2, the at least one ONT is connected to a level-n splitter of the at least one splitter, and wavelengths of the test lights reflected by reflection components of ports of different levels of splitters are the same; and
wherein determining, based on the locations and the heights of the reflection peaks and the location and the height of the reflection peak formed by the target test light, the port of the splitter of the at least one splitter corresponding to each reflection peak group comprises:
determining each reflection peak group based on the locations of the reflection peaks formed by the test lights and the location of the reflection peak formed by the target test light; and
determining, for a reflection peak group j, based on differences between the height of the reflection peak formed by the target test light and the heights of the reflection peaks formed by the test lights in the reflection peak group j, a port of a splitter of the at least one splitter corresponding to the reflection peak group j, wherein j is an integer.

6. The method according to claim 3 , wherein the at least one level of splitter is an uneven splitter, the at least one level of splitter is n levels of splitters, and n is greater than or equal to 2; and
wherein determining, based on the locations and the heights of the reflection peaks and the location and the height of the reflection peak formed by the target test light, the port of the splitter of the at least one spli

Assignees

• Huawei Tech Co Ltd

Inventors

• Dong Zhenhua
• Dong Xiaolong
• Jin Chao

Classifications

• H04B10/07

  Arrangements for monitoring or testing transmission systems; Arrangements for fault measurement of transmission systems · CPC title

• H04Q11/0067 Primary

  Provisions for optical access or distribution networks, e.g. Gigabit Ethernet Passive Optical Network (GE-PON), ATM-based Passive Optical Network (A-PON), PON-Ring · CPC title

• H04Q2011/0083

  Testing; Monitoring · CPC title

• H04B10/071 Primary

  using a reflected signal, e.g. using optical time domain reflectometers [OTDR] · CPC title

• H04B10/294

  in a multiwavelength system, e.g. gain equalisation · CPC title