Optical particle characterization apparatus

US12449341B2 · US · B2

Patent metadata
FieldValue
Publication numberUS-12449341-B2
Application numberUS-202318503223-A
CountryUS
Kind codeB2
Filing dateNov 7, 2023
Priority dateNov 9, 2022
Publication dateOct 21, 2025
Grant dateOct 21, 2025

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  1. Title

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  5. First independent claim

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Abstract

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Embodiments in accordance with the present invention relate to an apparatus for optical characterization of aerosol particles, including a laser source; a beam splitter configured to split the laser into two orthogonally polarized optical beams, wherein one component of the orthogonally polarized optical beam is deflected from the second component of the polarized optical beam at a predetermined angle; a cylindrical lens for collecting the two orthogonally polarized optical beams and focusing each of the optical beams to an interrogation region; an inlet positioned to deliver the sample gas including particles to the interrogation region as a single particle gas stream through the interrogation region; an ellipsoidal mirror positioned at a non-perpendicular angle adjacent to paths traversed by the polarized optical beams to reflect scattered optical beams from the particles traversing through the interrogation region; and a photodetector for measuring the scattered optical beams reflected by the mirror.

First claim

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What is claimed is: 1. An apparatus for measuring particles in a sample gas, said apparatus comprising: a light source for emitting a first optical beam; a first optical beam splitter configured to split the first optical beam into a first component polarized optical beam and a second component polarized optical beam, wherein the splitting the first polarized optical beam into the first component and the second component polarized optical beams comprises deflecting the first component polarized optical beam from the second component polarized optical beam at a first angle; a first lens configured to collect the first component and the second component polarized optical beams and focus each of the first component and the second component polarized optical beams to an interrogation region, wherein the first optical beam splitter is positioned at the first lens focal point; an inlet positioned adjacent to the interrogation region to deliver the sample gas comprising the particles to the interrogation region, wherein the inlet comprises a channel configured to restrict flow of the sample gas to a single particle gas stream through the interrogation region, wherein the single particle gas stream flowing through the interrogation region scatters the first component and the second component polarized optical beams; a first mirror positioned adjacent to paths traversed by the first component and the second component polarized optical beams to reflect a first scattered optical beam scattered from the first component polarized optical beam and a second scattered optical beam scattered from the second component polarized optical beam, wherein an axis perpendicular to a plane of the first mirror intersects the paths traversed by the first component and the second component polarized optical beams at a non-perpendicular second angle, wherein the first mirror focal point is positioned at the interrogation region; a first photodetector positioned to measure the first and the second scattered optical beams from the first mirror and produce corresponding first and second signals; and a processor, responsive to the first and the second signals from the first photodetector, for calculating intensity and time separation of the first and the second scattered optical beams, wherein the processor, responsive to said intensity and time separation of the first and the second scattered optical beams, determines velocity and aerodynamic diameter of the particles in the sample gas. 2. The apparatus of claim 1 , further comprising: a second mirror positioned facing the first mirror and adjacent to paths traversed by the first component and the second component polarized optical beams to reflect a third scattered optical beam scattered from the first component polarized optical beam and a fourth scattered optical beam scattered from the second component polarized optical beam, wherein an axis perpendicular to a plane of the second mirror aligns with the axis perpendicular to the plane of the first mirror, wherein the second mirror focal point is positioned at the interrogation region; and a second photodetector positioned to measure the third and the fourth scattered optical beams from the second mirror and produce corresponding third and fourth signals, wherein the processor, responsive to the third and the fourth signals from the second photodetector, calculates intensity and time separation of the third and the fourth scattered optical beams, wherein the processor, responsive to said intensity and time separation of the third and the fourth scattered optical beams, determines velocity and aerodynamic diameter of the particles in the sample gas. 3. The apparatus of claim 1 , further comprising: a second lens configured to collect the first component and the second component polarized optical beams transmitted through the interrogation region and focus each of the collected the first component and the second component polarized optical beams to the second lens focal point; and a second photodetector positioned at the second lens focal point to measure the each of the collected the first component and the second component polarized optical beams and produce corresponding third and fourth signals, wherein the processor, responsive to the third and the fourth signals from the second photodetector, determines extinction of the particles in the sample gas. 4. The apparatus of claim 2 , further comprising: a second lens configured to collect the first component and the second component polarized optical beams transmitted through the interrogation region and focus each of the collected the first component and the second component polarized optical beams to the second lens focal point; a second optical beam splitter positioned at the second lens focal point and configured to split the focused the first and the second polarized optical beams into a third component polarized optical beam and a fourth component polarized optical beam, wherein the splitting the focused the first component and the second component polarized optical beams into the third component and the fourth component polarized optical beams comprises deflecting the third component polarized optical beam from the fourth component polarized optical beam at a third angle; a third photodetector positioned to measure the third component polarized optical beam and produce a corresponding fifth signal; and a fourth photodetector positioned to measure the fourth component polarized optical beam and produce a corresponding sixth signal, wherein the processor, responsive to the fifth and the sixth signals, determines extinction of the particles in the sample gas. 5. The apparatus of claim 1 , wherein the axis perpendicular to the plane of the first mirror intersects the paths traversed by the first component and the second component polarized optical beams at the second angle of about 75 degrees. 6. The apparatus of claim 2 , wherein the axis perpendicular to the plane of the first and the second mirrors intersects the paths traversed by the first component and the second component polarized optical beams at the second angle of about 75 degrees. 7. The apparatus of claim 1 , wherein the first optical beam splitter is Wollaston prism. 8. The apparatus of claim 1 , wherein each of the first and the second mirrors is an ellipsoidal mirror. 9. The apparatus of claim 1 , wherein the light source is a 450 nm diode laser. 10. The apparatus of claim 3 , wherein each of the first and the second lenses is a 40 mm cylindrical lens. 11. An apparatus for measuring particles in a sample gas, said apparatus comprising: a light source for emitting a first optical beam; a first optical beam splitter configured to split the first optical beam into a first component polarized optical beam and a second component polarized optical beam, wherein the splitting the first polarized optical beam into the first component and the second component polarized optical beams comprises deflecting the first component polarized optical beam from the second component polarized optical beam at a first angle; a first cylindrical lens configured to collect the first component and the second component polarized optical beams and focus each of the first component and the second component polarized optical beams to an interrogation region, wherein the first optical beam splitter is positioned at the first cylindrical lens focal point; an inlet positioned adjacent to the interrogation region to deliver the sample gas comprising the particles to the interrogation region, wherein the inlet comprises a channel configured to restrict flow of the sample gas to a single particle gas stream through the interrogatio

Assignees

Inventors

Classifications

  • Optical arrangements · CPC title

  • Determining speed or velocity of a particle · CPC title

  • the analysis being performed on a sample stream · CPC title

  • in gas, e.g. smoke · CPC title

  • Investigating a scatter or diffraction pattern · CPC title

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What does patent US12449341B2 cover?
Embodiments in accordance with the present invention relate to an apparatus for optical characterization of aerosol particles, including a laser source; a beam splitter configured to split the laser into two orthogonally polarized optical beams, wherein one component of the orthogonally polarized optical beam is deflected from the second component of the polarized optical beam at a predetermine…
Who is the assignee on this patent?
Us Commerce, Us Secretary Of Commerce
What technology area does this patent fall under?
Primary CPC classification G01N15/0211. Mapped technology areas include Physics.
When was this patent published?
Publication date Tue Oct 21 2025 00:00:00 GMT+0000 (Coordinated Universal Time) (B2). Legal status and post-grant events are not shown on this page.
What related patents are in patentsdb?
We list 8 related publications on this page (citations in our corpus or others sharing the same primary CPC).