Radiation detector and radiation imaging system

US12442940B2 · US · B2

Patent metadata
FieldValue
Publication numberUS-12442940-B2
Application numberUS-202318195652-A
CountryUS
Kind codeB2
Filing dateMay 10, 2023
Priority dateMay 18, 2022
Publication dateOct 14, 2025
Grant dateOct 14, 2025

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  1. Title

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  2. Abstract

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  3. Assignees and inventors

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  4. Key dates

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  5. First independent claim

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  6. CPC / IPC classifications

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  7. Citations and related patents

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Abstract

Official abstract text for this publication.

A radiation detector comprising: a pixel array in which pixels each having a radiation detection element configured to convert radiation into charges and an amplification transistor configured to amplify a signal from the radiation detection element and output the amplified signal are arrayed in a matrix shape; and signal wiring provided for each pixel column, wherein a pixel isolation structure formed to surround the radiation detection element in a plan view is provided, and the amplification transistor is arranged inside a region defined by the pixel isolation structure in a plan view.

First claim

Opening claim text (preview).

What is claimed is: 1. A radiation detector comprising: a pixel array in which pixels each having a radiation detection element configured to convert radiation into charges and an amplification transistor configured to amplify a signal from the radiation detection element and output the amplified signal are arrayed in a matrix shape; and signal wiring provided for each pixel column, wherein a pixel isolation structure formed to surround the radiation detection element in a plan view is provided, and the amplification transistor is arranged inside a region defined by the pixel isolation structure in a plan view. 2. The radiation detector according to claim 1 , wherein the amplification transistor is arranged in a region surrounded by an active region of the radiation detection element. 3. The radiation detector according to claim 1 , wherein the pixel further has a transfer transistor configured to transfer charges converted by the radiation detection element to a charge retention unit, and wherein the transfer transistor and the charge retention unit are also arranged inside the region defined by the pixel isolation structure in a plan view. 4. The radiation detector according to claim 1 , wherein the pixel further has wiring configured to connect an extraction unit for extracting charges from the radiation detection element and a gate of the amplification transistor. 5. The radiation detector according to claim 1 , wherein the signal wiring includes at least two signal wiring lines that are arranged with respect to a pixel column of the pixel array. 6. The radiation detector according to claim 5 , wherein the radiation detection element and the signal wiring lines are arranged at a same cycle as a pixel pitch in the pixel array, and wherein the radiation detection element and the signal wiring lines are arranged to be shifted by a half phase from each other. 7. The radiation detector according to claim 5 , wherein the signal wiring lines are formed in a same layer as wiring that supplies a power supply voltage to the amplification transistor, and wherein the signal wiring lines are arranged to be adjacent to each other. 8. The radiation detector according to claim 7 , wherein connection wiring that is provided for each amplification transistor and that is orthogonal to at least any of the signal wiring lines is provided, wherein the signal wiring lines and the connection wiring are formed in different layers and electrically connected to each other via a via hole, and wherein plane layouts of the pixels are substantially same in shape except for the via hole. 9. The radiation detector according to claim 8 , wherein overlapping areas of portions at which the signal wiring and the connection wiring cross each other have substantially same value at all intersecting points. 10. The radiation detector according to claim 5 , wherein the pixels have power supply wiring arranged parallel to the signal wiring line, and wherein an interval between the adjacent signal wiring lines is smaller than an interval between the signal wiring line, which is adjacent to the power supply wiring, and the power supply wiring. 11. The radiation detector according to claim 10 , wherein the pixels include a reset transistor, and wherein the power supply wiring includes first power supply wiring that supplies a drain potential of the amplification transistor, second power supply wiring that supplies a well potential, and third power supply wiring that supplies a drain potential of the reset transistor. 12. The radiation detector according to claim 11 , wherein the second power supply wiring is arranged between the first power supply wiring and the third power supply wiring. 13. The radiation detector according to claim 11 , wherein the third power supply wiring is arranged between the first power supply wiring and the second power supply wiring. 14. The radiation detector according to claim 11 , wherein the first power supply wiring, the second power supply wiring, and the third power supply wiring are arranged at an upper part of a region in which the amplification transistor is arranged. 15. The radiation detector according to claim 1 , wherein the signal wiring is arranged at an upper part of a region in which the radiation detection element is arranged, and wherein the signal wiring includes at least three signal wiring lines per pixel column. 16. The radiation detector according to claim 1 , wherein the radiation detector is of a surface irradiation type. 17. A radiation imaging system comprising: the radiation detector according to claim 1 ; and a signal processing unit that processes a signal output from the radiation detector. 18. A radiation imaging system comprising: the radiation detector according to claim 1 ; and a radiation source.

Assignees

Inventors

Classifications

  • Complementary metal-oxide-semiconductor [CMOS] image sensors; Photodiode array image sensors · CPC title

  • Interconnections · CPC title

  • the integrated elements comprising a transistor · CPC title

  • G01T1/175Primary

    Power supply circuits · CPC title

  • H10F39/807Primary

    Pixel isolation structures · CPC title

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Frequently asked questions

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What does patent US12442940B2 cover?
A radiation detector comprising: a pixel array in which pixels each having a radiation detection element configured to convert radiation into charges and an amplification transistor configured to amplify a signal from the radiation detection element and output the amplified signal are arrayed in a matrix shape; and signal wiring provided for each pixel column, wherein a pixel isolation structur…
Who is the assignee on this patent?
Canon Kk
What technology area does this patent fall under?
Primary CPC classification G01T1/175. Mapped technology areas include Physics.
When was this patent published?
Publication date Tue Oct 14 2025 00:00:00 GMT+0000 (Coordinated Universal Time) (B2). Legal status and post-grant events are not shown on this page.
What related patents are in patentsdb?
We list 5 related publications on this page (citations in our corpus or others sharing the same primary CPC).