Gas measuring device and gas measuring method

US12442757B2 · US · B2

Patent metadata
FieldValue
Publication numberUS-12442757-B2
Application numberUS-202318197947-A
CountryUS
Kind codeB2
Filing dateMay 16, 2023
Priority dateJun 15, 2022
Publication dateOct 14, 2025
Grant dateOct 14, 2025

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  1. Title

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  2. Abstract

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  3. Assignees and inventors

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  4. Key dates

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  5. First independent claim

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  6. CPC / IPC classifications

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  7. Citations and related patents

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Abstract

Official abstract text for this publication.

A gas measuring device includes a gas chamber into which a sample gas containing a target gas is introduced, a gas detection unit configured to detect the target gas contained in the sample gas introduced into the gas chamber, an irradiation unit configured to apply polarized light to the sample gas introduced into the gas chamber using a polarizer, an optical rotation measurement unit configured to measure optical rotation between the polarized light applied from the irradiation unit to the sample gas and the polarized light that has been transmitted through the sample gas using an analyzer, and an output unit configured to output information on the target gas detected by the gas detection unit and information on the optical rotation of the polarized light detected by the optical rotation measurement unit in association with each other.

First claim

Opening claim text (preview).

What is claimed is: 1. A gas measuring device comprising: a case that defines a gas chamber; the gas chamber into which a sample gas containing a target gas is introduced; a gas sensor configured to detect the target gas contained in the sample gas introduced into the gas chamber; a light source configured to apply polarized light to the sample gas introduced into the gas chamber using a polarizer; an optical sensor configured to measure optical rotation between the polarized light applied from the light source to the sample gas and the polarized light that has been transmitted through the sample gas using an analyzer; and an output module configured to output information on the target gas detected by the gas sensor and information on the optical rotation of the polarized light detected by the optical sensor in association with each other, wherein the gas sensor, the light source and the optical sensor are disposed inside the case. 2. The gas measuring device according to claim 1 , wherein the optical sensor and the gas sensor are configured by one semiconductor sensor, and the one semiconductor sensor is configured to respond to both light and gas. 3. The gas measuring device according to claim 1 , comprising: an optical splitter configured to optically split the polarized light applied from the light source to the sample gas into a plurality of polarized lights, wherein the optical sensor measures optical rotation between the polarized light applied from the light source to the sample gas and each of the plurality of polarized lights that have been optically split by the optical splitter and transmitted through the sample gas. 4. The gas measuring device according to claim 1 further comprising: a gas introduction part configured to form a gas flow of the sample gas in the gas chamber; and an airflow controller having a plurality of openings through which the sample gas passes, wherein the gas sensor is configured to detect the target gas contained in the sample gas that has passed through the openings of the airflow controller. 5. The gas measuring device according to claim 4 , wherein the airflow controller is optically configured to split the polarized light that has been transmitted through the sample gas into a plurality of polarized lights, and the optical sensor is configured to measure optical rotation between the polarized light applied from the light source to the sample gas and each of the plurality of polarized lights that have been optically split by the airflow controller. 6. A gas measuring method comprising: an introduction step of introducing a sample gas containing a target gas into a gas chamber defined by a case; a gas detection step of detecting with a gas sensor the target gas contained in the sample gas introduced into the gas chamber; an irradiation step of applying with a light source polarized light to the sample gas introduced into the gas chamber; a light detection step of measuring with an optical sensor optical rotation between the polarized light applied to the sample gas and the polarized light that has been transmitted through the sample gas; and an output step of outputting information on the target gas detected in the gas detection step and information on the optical rotation of the polarized light detected in the light detection step in association with each other, wherein the gas detection sensor, the light source and the optical sensor are disposed inside the case that defines a gas chamber therein.

Assignees

Inventors

Classifications

  • Flow-through cuvettes (G01N21/09 takes precedence; handling fluid samples G01N1/10) · CPC title

  • Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry {(G01N21/72 takes precedence)} · CPC title

  • G01N21/21Primary

    Polarisation-affecting properties (G01N21/19 takes precedence) · CPC title

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What does patent US12442757B2 cover?
A gas measuring device includes a gas chamber into which a sample gas containing a target gas is introduced, a gas detection unit configured to detect the target gas contained in the sample gas introduced into the gas chamber, an irradiation unit configured to apply polarized light to the sample gas introduced into the gas chamber using a polarizer, an optical rotation measurement unit configur…
Who is the assignee on this patent?
Sintokogio Ltd, National Univ Corporation Toyohashi Univ Of Technology
What technology area does this patent fall under?
Primary CPC classification G01N21/21. Mapped technology areas include Physics.
When was this patent published?
Publication date Tue Oct 14 2025 00:00:00 GMT+0000 (Coordinated Universal Time) (B2). Legal status and post-grant events are not shown on this page.
What related patents are in patentsdb?
We list 8 related publications on this page (citations in our corpus or others sharing the same primary CPC).