Treatment liquid and substrate washing method

US12441965B2 · US · B2

Patent metadata
FieldValue
Publication numberUS-12441965-B2
Application numberUS-202318158544-A
CountryUS
Kind codeB2
Filing dateJan 24, 2023
Priority dateJul 30, 2020
Publication dateOct 14, 2025
Grant dateOct 14, 2025

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  1. Title

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  2. Abstract

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  3. Assignees and inventors

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  4. Key dates

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  5. First independent claim

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  6. CPC / IPC classifications

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  7. Citations and related patents

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Abstract

Official abstract text for this publication.

An object of the present invention is to provide a treatment liquid for a semiconductor device, which is excellent in removal performance for residues present on a substrate, and to provide a substrate washing method using the treatment liquid. The treatment liquid of the present invention is a treatment liquid for a semiconductor device, which includes water, a basic compound, hexylene glycol, and a compound A that is at least one kind selected from the group consisting of isobutene, (E)-2-methyl-1,3-pentadiene, 4-methyl-1,3-pentadiene, 2,2,4-trimethyloxetane, 4-methyl-3-penten-2-ol, and 2,4,4,6-tetramethyl-1,3-dioxane.

First claim

Opening claim text (preview).

What is claimed is: 1. A treatment liquid for a semiconductor device, comprising: water; a basic compound; hexylene glycol; and a compound A that is at least one kind selected from the group consisting of isobutene, (E)-2-methyl-1,3-pentadiene, 4-methyl-1,3-pentadiene, 2,2,4-trimethyloxetane, 4-methyl-3-penten-2-ol, and 2,4,4,6-tetramethyl-1,3-dioxane. 2. The treatment liquid according to claim 1 , wherein in a case where the treatment liquid comprises one kind of the compound A, a content of the compound A with respect to a total mass of the treatment liquid is 1,000 ppm by mass or less, and in a case where the treatment liquid comprises two or more kinds of the compounds A, a content of each of the compounds A with respect to the total mass of the treatment liquid is 1,000 ppm by mass or less. 3. The treatment liquid according to claim 1 , wherein the treatment liquid comprises two or more kinds of the compounds A, and in the treatment liquid, in a case where a content of a compound having a highest content among the compounds A is denoted by α and a content of a compound having a second highest content among the compounds A is denoted by β, a ratio α/β of the content α to the content β is less than 10 in terms of mass ratio. 4. The treatment liquid according to claim 1 , wherein the treatment liquid comprises three or more kinds of the compounds A, and in the treatment liquid, in a case where a content of a compound having a second highest content among the compounds A is denoted by β and a content of a compound having a third highest content among the compounds A is denoted by γ, a ratio β/γ of the content β to the content γ is less than 10 in terms of mass ratio. 5. The treatment liquid according to claim 1 , wherein the treatment liquid comprises at least one kind selected from the group consisting of isobutene, 4-methyl-1,3-pentadiene, 2,2,4-trimethyloxetane, and 4-methyl-3-penten-2-ol. 6. The treatment liquid according to claim 1 , wherein a content of the hexylene glycol in the treatment liquid is 60% by mass or more with respect to a total mass of the treatment liquid. 7. The treatment liquid according to claim 1 , wherein the basic compound comprises at least one selected from the group consisting of tetramethylammonium hydroxide, monoethanolamine, and hydroxylamine. 8. The treatment liquid according to claim 1 , wherein the basic compound comprises a compound B represented by Formula (1), NH 2 —CH 2 CH 2 —X—CH 2 CH 2 —Y  (1) in Formula (1), X represents —NR— or —O—, R represents a hydrogen atom or a substituent, and Y represents a hydroxy group or a primary amino group. 9. The treatment liquid according to claim 8 , wherein the compound B comprises at least one selected from the group consisting of 2-(2-aminoethylamino)ethanol, 2,2′-oxybis(ethylamine), and 2-(2-aminoethoxy)ethanol. 10. The treatment liquid according to claim 8 , wherein a content of the compound B with respect to a total mass of the treatment liquid is 0.1% to 1.15% by mass. 11. The treatment liquid according to claim 1 , wherein the basic compound comprises two or more kinds of amine compounds. 12. The treatment liquid according to claim 11 , wherein in the treatment liquid, a ratio of a content of a compound having a highest content among the amine compounds to a content of an amine compound having a lowest content among the amine compounds is 9 to 100 in terms of mass ratio. 13. The treatment liquid according to claim 1 , wherein the treatment liquid is used as a washing solution for removing etching residues from a substrate including a metal-containing layer or as a washing solution for removing residues from a substrate after chemical mechanical polishing. 14. A substrate washing method comprising a washing step of washing a substrate comprises a metal-containing layer, by contacting the substrate with the treatment liquid according to claim 1 . 15. The treatment liquid according to claim 2 , wherein the treatment liquid comprises two or more kinds of the compounds A, and in the treatment liquid, in a case where a content of a compound having a highest content among the compounds A is denoted by α and a content of a compound having a second highest content among the compounds A is denoted by β, a ratio α/β of the content α to the content β is less than 10 in terms of mass ratio. 16. The treatment liquid according to claim 2 , wherein the treatment liquid comprises three or more kinds of the compounds A, and in the treatment liquid, in a case where a content of a compound having a second highest content among the compounds A is denoted by β and a content of a compound having a third highest content among the compounds A is denoted by γ, a ratio β/γ of the content β to the content γ is less than 10 in terms of mass ratio. 17. The treatment liquid according to claim 2 , wherein the treatment liquid comprises at least one kind selected from the group consisting of isobutene, 4-methyl-1,3-pentadiene, 2,2,4-trimethyloxetane, and 4-methyl-3-penten-2-ol. 18. The treatment liquid according to claim 2 , wherein a content of the hexylene glycol in the treatment liquid is 60% by mass or more with respect to a total mass of the treatment liquid. 19. The treatment liquid according to claim 2 , wherein the basic compound comprises at least one selected from the group consisting of tetramethylammonium hydroxide, monoethanolamine, and hydroxylamine. 20. The treatment liquid according to claim 2 , wherein the basic compound comprises a compound B represented by Formula (1), NH 2 —CH 2 CH 2 —X—CH 2 CH 2 —Y  (1) in Formula (1), X represents —NR— or —O—, R represents a hydrogen atom or a substituent, and Y represents a hydroxy group or a primary amino group.

Assignees

Inventors

Classifications

  • Cleaning during device manufacture · CPC title

  • H10P70/234Primary

    the processing being the formation of vias or contact holes · CPC title

  • linear · CPC title

  • unsaturated · CPC title

  • Solvents · CPC title

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What does patent US12441965B2 cover?
An object of the present invention is to provide a treatment liquid for a semiconductor device, which is excellent in removal performance for residues present on a substrate, and to provide a substrate washing method using the treatment liquid. The treatment liquid of the present invention is a treatment liquid for a semiconductor device, which includes water, a basic compound, hexylene g…
Who is the assignee on this patent?
Fujifilm Corp
What technology area does this patent fall under?
Primary CPC classification H10P70/234. Mapped technology areas include Electricity.
When was this patent published?
Publication date Tue Oct 14 2025 00:00:00 GMT+0000 (Coordinated Universal Time) (B2). Legal status and post-grant events are not shown on this page.
What related patents are in patentsdb?
We list 2 related publications on this page (citations in our corpus or others sharing the same primary CPC).