Method and apparatus for operating a vacuum interface of a mass spectrometer

Patent metadata

Field	Value
Publication number	US-12441611-B2
Application number	US-202418617503-A
Country	US
Kind code	B2
Filing date	Mar 26, 2024
Priority date	Apr 13, 2018
Publication date	Oct 14, 2025
Grant date	Oct 14, 2025

Abstract

A method is disclosed for operating a mass spectrometer vacuum interface, the vacuum interface comprising an evacuated expansion chamber downstream of a plasma ion source wherein the expansion chamber is pumped by an interface vacuum pump to provide an interface pressure in the chamber; the method comprising using a controller to automatically, or according to user input, control the throughput of the interface vacuum pump to control the interface pressure dependent on one or more operating modes of the spectrometer.

First claim

We claim:

1. A method of operating a mass spectrometer vacuum interface:
wherein the vacuum interface comprises an evacuated expansion chamber situated downstream of a plasma ion source and upstream of a mass analyzer, the expansion chamber having a first aperture that interfaces with the plasma ion source to form an expanding plasma downstream of the first aperture and a second aperture, downstream of the first aperture from the plasma ion source and upstream of the mass analyzer, for skimming the expanding plasma to form a skimmed expanding plasma;
wherein the expansion chamber is pumped by an interface vacuum pump to provide an interface pressure in the expansion chamber, the interface vacuum pump is coupled to a controller, and the controller is coupled to a Visual Display Unit (VDU) upon which a graphical user interface (GUI), supporting a plurality of GUI modes, is displayed; and
the method comprises, by the controller:
receiving, via the GUI and a first input device, a selection of one or more operating conditions of the plasma ion source, wherein the selected one or more operating conditions of the plasma ion source comprise: electrical power supplied to the plasma ion source, a temperature of the plasma, or a plasma torch position;
dependent on the selected one or more operating conditions of the plasma ion source, automatically controlling a rotation speed of the interface vacuum pump to automatically maintain a predetermined value of the interface pressure between the first and second apertures of the expansion chamber;
initially displaying the automatically controlled rotation speed of the interface vacuum pump and/or the automatically maintained interface pressure on the GUI in a first GUI mode;
receiving input, via the GUI, to enter an override mode and set a particular rotation speed of the interface vacuum pump, provided via the GUI, and/or a particular interface pressure, provided via the GUI; and
in the override mode, displaying on the GUI the particular rotation speed of the interface vacuum pump as set and/or the particular interface pressure as set.

2. The method of claim 1 , wherein:
the receiving a selection further includes receiving a selection of one or more elements of interest to be mass analyzed by the mass spectrometer; and
the automatically controlling the rotation speed and the interface pressure are also dependent on the selected one or more elements.

3. An apparatus for operating a mass spectrometer vacuum interface, comprising:
a plasma ion source for generating a plasma;
an evacuated expansion chamber downstream of the plasma ion source and upstream of a mass analyzer, the expansion chamber having a first aperture that interfaces with the plasma ion source for forming an expanding plasma downstream of the first aperture and a second aperture downstream of the first aperture from the plasma ion source and upstream of the mass analyzer, for skimming the expanding plasma to form a skimmed expanding plasma;
wherein the expansion chamber is pumped by an interface vacuum pump to provide an interface pressure in the expansion chamber;
a controller coupled to the interface vacuum pump; and
coupled to the controller, a visual display unit (VDU) upon which a graphical user interface (GUI), supporting a plurality of GUI modes, is displayed;
wherein the controller is configured to:
receive, via the GUI and a first input device, a selection of one or more operating conditions of the plasma ion source, wherein the selected one or more operating conditions of the plasma ion source comprise: electrical power supplied to the plasma ion source, a temperature of the plasma, or a plasma torch position;
dependent on the selected one or more operating conditions of the plasma ion source, automatically control a rotation speed of the interface vacuum pump to automatically maintain a predetermined value of the interface pressure between the first and second apertures of the expansion chamber;
initially display the automatically controlled rotation speed of the interface vacuum pump and/or the automatically maintained interface pressure on the GUI in a first GUI mode;
receive input, via the GUI to enter an override mode and set a particular rotation speed of the interface vacuum pump, provided via the GUI, and/or a particular interface pressure, provided via the GUI; and
in the override mode, display on the GUI the particular rotation speed of the interface vacuum pump as set and/or the particular interface pressure as set.

4. The apparatus of claim 3 , wherein:
the controller is further configured to receive a selection of one or more elements of interest to be mass analyzed by the mass spectrometer; and
the automatically controlling the rotation speed and the interface pressure are also dependent on the selected one or more elements.

Assignees

• Thermo Fisher Scient Bremen Gmbh

Inventors

• Wehe Christoph
• Manecki Marcus
• Thyssen Georgina
• Wohlgethan Sven
• Precht Daniel

Classifications

• C01B3/28 Primary

  using moving solid particles, e.g. fluidised bed technique · CPC title

• H01J49/24 Primary

  Vacuum systems, e.g. maintaining desired pressures · CPC title

• H01J49/105

  using high-frequency excitation, e.g. microwave excitation, Inductively Coupled Plasma [ICP] · CPC title

• H01J49/067

  Ion lenses, apertures, skimmers · CPC title

• C01B2203/0277

  containing a catalytic decomposition step · CPC title