Method and apparatus for storing visibility data of three-dimensional model, device, and storage medium

Patent metadata

Field	Value
Publication number	US-12437473-B2
Application number	US-202318207577-A
Country	US
Kind code	B2
Filing date	Jun 8, 2023
Priority date	Nov 19, 2021
Publication date	Oct 7, 2025
Grant date	Oct 7, 2025

Abstract

The present disclosure provides a method for processing visibility data of a three-dimensional model performed by a computer device. The method includes: obtaining original values of visibility data of a plurality of sampling points of the three-dimensional model; determining visibility data of a plurality of vertexes of the three-dimensional model based on a first error function measuring differences between recovery values of the visibility data of the sampling points from interpolation of the visibility data of the vertexes of the three-dimensional model and the original values of the visibility data of the sampling points and change rates of the recovery values of the visibility data of the sampling points; and storing the visibility data of each vertex of the three-dimensional model. This method reduces the space for storing the visibility data, relieves the pressure of storing the visibility data, and improves the efficiency of rendering the three-dimensional model.

First claim

What is claimed is:

1. A method for processing visibility data of a three-dimensional model, performed by a computer device, comprising:
obtaining original values of visibility data of a plurality of sampling points of the three-dimensional model, wherein the three-dimensional model is formed by a plurality of surface slices, each surface slice having a polygon formed by a set of vertexes with sampling points on the surface slice surrounded by the set of vertexes;
determining visibility data of a plurality of vertexes of the three-dimensional model based on (i) a first error function measuring differences between recovery values of the visibility data of the sampling points on a surface slice of the three-dimensional model from interpolation of the visibility data of the vertexes of the surface slice of the three-dimensional model and the original values of the visibility data of the sampling points on the surface slice of the three-dimensional model and (ii) change rates of the recovery values of the visibility data of the sampling points on the surface slice of the three-dimensional model; and
storing the visibility data of each vertex of the three-dimensional model.

2. The method according to claim 1 , wherein a quantity of the vertexes of the three-dimensional model is smaller than a quantity of the sampling points of the three-dimensional model.

3. The method according to claim 1 , wherein the determining visibility data of a plurality of vertexes of the three-dimensional model comprises:
constructing the first error function based on the recovery values and the original values of the visibility data of the sampling points, a value of the first error function being positively correlated with the differences between the recovery values and the original values of the visibility data of the sampling points, and the value of the first error function being positively correlated with the change rate of the recovery values of the visibility data of the sampling point; and
determining the visibility data of the vertexes of the three-dimensional model via minimizing the value of the first error function.

4. The method according to claim 3 , wherein the constructing the first error function based on the recovery values and the original values of the visibility data of the sampling points comprises:
constructing a first sub-function based on the differences between the recovery values and the original values of the visibility data of the sampling points;
constructing a second sub-function based on differences between the change rates of the recovery values of the visibility data of the sampling points corresponding to at least a set of adjacent surface slices on the three-dimensional model; and
constructing the first error function based on the first sub-function and the second sub-function.

5. The method according to claim 1 , wherein the obtaining original values of visibility data of a plurality of sampling points of the three-dimensional model comprises:
obtaining initial visibility data of a target sampling point of the three-dimensional model, the initial visibility data of the target sampling point comprising: intersection data of the target sampling point used as an origin in a plurality of directions;
determining a target vertebra used for fitting the initial visibility data of the target sampling point; and
determining an original value of the visibility data of the target sampling point based on the target vertebra, the visibility data of the target sampling point comprising a central axis direction, an opening angle, and a scaling value of the target vertebra, and the scaling value representing a brightness of a visible region of the target sampling point.

6. The method according to claim 1 , wherein the method further comprises:
obtaining visibility data of each vertex of a target surface slice on the three-dimensional model;
determining visibility data of a gravity center point of the target surface slice according to the visibility data of each vertex of the target surface slice; and
performing interpolation according to the visibility data of each vertex of the target surface slice and the visibility data of the gravity center point of the target surface slice, to obtain the recovery value of the visibility data of each sampling point within the target surface slice.

7. A computer device, comprising a processor and a memory, the memory storing a computer program, and the computer program being loaded and executed by the processor and causing the computer device to implement a method for processing visibility data of a three-dimensional model including:
obtaining original values of visibility data of a plurality of sampling points of the three-dimensional model, wherein the three-dimensional model is formed by a plurality of surface slices, each surface slice having a polygon formed by a set of vertexes with sampling points on the surface slice surrounded by the set of vertexes;
determining visibility data of a plurality of vertexes of the three-dimensional model based on (i) a first error function measuring differences between recovery values of the visibility data of the sampling points on a surface slice of the three-dimensional model from interpolation of the visibility data of the vertexes of the surface slice of the three-dimensional model and the original values of the visibility data of the sampling points on the surface slice of the three-dimensional model and (ii) change rates of the recovery values of the visibility data of the sampling points on the surface slice of the three-dimensional model; and
storing the visibility data of each vertex of the three-dimensional model.

8. The computer device according to claim 7 , wherein a quantity of the vertexes of the three-dimensional model is smaller than a quantity of the sampling points of the three-dimensional model.

9. The computer device according to claim 7 , wherein the determining visibility data of a plurality of vertexes of the three-dimensional model comprises:
constructing the first error function based on the recovery values and the original values of the visibility data of the sampling points, a value of the first error function being positively correlated with the differences between the recovery values and the original values of the visibility data of the sampling points, and the value of the first error function being positively correlated with the change rate of the recovery values of the visibility data of the sampling point; and
determining the visibility data of the vertexes of the three-dimensional model via minimizing the value of the first error function.

10. The computer device according to claim 9 , wherein the constructing the first error function based on the recovery values and the original values of the visibility data of the sampling points comprises:
constructing a first sub-function based on the differences between the recovery values and the original values of the visibility data of the sampling points;
constructing a second sub-function based on differences between the change rates of the recovery values of the visibility data of the sampling points corresponding to at least a set of adjacent surface slices on the three-dimensional model; and
constructing the first error function based on the first sub-function and the second sub-function.

11. The computer device according to claim 7 , wherein the obtaining original values of visibility data of a plurality of sampling points of the three-dimensional model comprises:
obtaining initial visibility data of a target sampling point of the three-dimensional model, the initial visibility data of the target sampling point comprising: inter

Assignees

• Tencent Tech Shenzhen Co Ltd

Inventors

• Xia Fei

Classifications

• G06V10/60

  relating to illumination properties, e.g. using a reflectance or lighting model · CPC title

• G06V20/64

  Three-dimensional [3D] objects · CPC title

• G06T15/205

  Image-based rendering · CPC title

• G06T3/4023

  based on decimating pixels or lines of pixels; based on inserting pixels or lines of pixels · CPC title

• G06T17/00 Primary

  Three-dimensional [3D] modelling for computer graphics · CPC title