Method and device for measuring fluid in target pipeline

US12436165B2 · US · B2

Patent metadata
FieldValue
Publication numberUS-12436165-B2
Application numberUS-202318193383-A
CountryUS
Kind codeB2
Filing dateMar 30, 2023
Priority dateApr 1, 2022
Publication dateOct 7, 2025
Grant dateOct 7, 2025

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  5. First independent claim

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Abstract

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This application discloses a fluid measuring method and device and electronic equipment. When a fluid flows in a target pipeline, high-speed cameras obtain a first sampling image set of a tracer particle cluster in the fluid passing a front end of the target pipeline and a second sampling image set of the tracer particle cluster passing a rear end of the target pipeline, thereby obtaining passing time distribution information of the tracer particle cluster passing through the target pipeline. A mean residence time of the fluid in the high-pressure target pipeline is obtained based on the passing time distribution information. In this way, the accuracy of non-intrusive online measurement of the mean residence time of the supercritical pressure fluid in the pipeline is improved.

First claim

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What is claimed is: 1. A method for measuring fluid in a target pipeline, comprising: obtaining a working medium temperature and a working medium pressure of the fluid at a front end and/or a rear end of the target pipeline; determining a target laser incidence mode in a plurality of laser incidence modes based on the working medium temperature and the working medium pressure, wherein a laser has different incidence angles in different laser incidence modes; controlling the laser to emit a laser light based on the target laser incidence mode; obtaining, when the fluid flows in the target pipeline, a first sampling image set of a tracer particle cluster in the fluid passing the front end of the target pipeline and a second sampling image set of the tracer particle cluster passing the rear end of the target pipeline, wherein images in the first sampling image set and the second sampling image set are images obtained when the laser excites the tracer particle cluster to scatter; obtaining, based on the first sampling image set and the second sampling image set, passing time distribution information of the tracer particle cluster passing through the target pipeline; and obtaining a mean residence time of the fluid in the target pipeline based on the passing time distribution information. 2. The method according to claim 1 , wherein the determining the target laser incidence mode in the plurality of laser incidence modes based on the working medium temperature and the working medium pressure comprises: determining that the target laser incidence mode is a laser normal incidence mode when the working medium temperature satisfies a pseudo-critical temperature corresponding to the working medium pressure, wherein an incidence direction of the laser in the laser normal incidence mode is perpendicular to a central axis of the target pipeline; or determining that the target laser incidence mode is a laser oblique incidence mode when the working medium temperature does not satisfy the pseudo-critical temperature corresponding to the working medium pressure, wherein the incidence direction of the laser in the laser oblique incidence mode has an inclination angle with the central axis of the target pipeline. 3. The method according to claim 2 , wherein when the target laser incidence mode is the laser normal incidence mode, the obtaining, based on the first sampling image set and the second sampling image set, passing time distribution information of the tracer particle cluster passing through the target pipeline comprises: applying optical distortion correction to the images in the first sampling image set and the second sampling image set to obtain a first corrected particle image set and a second corrected particle image set; and obtaining, based on the first corrected particle image set and the second corrected particle image set, the passing time distribution information of the tracer particle cluster passing through the target pipeline. 4. The method according to claim 3 , wherein the applying optical distortion correction to the images in the first sampling image set and the second sampling image set to obtain the first corrected particle image set and the second corrected particle image set comprises: obtaining a diameter of the target pipeline, a half-width of a sampling cross-section, distances between all tracer particle images and the central axis of the target pipeline, and a thickness of the laser light emitted by the laser; and applying optical distortion correction to the images in the first sampling image set and the second sampling image set based on the diameter, the half-width, the distances and the thickness of the laser light, to obtain the first corrected particle image set and the second corrected particle image set. 5. The method according to claim 1 , wherein before the obtaining, based on the first sampling image set and the second sampling image set, the passing time distribution information of the tracer particle cluster passing through the target pipeline, the method further comprises: processing the images in the first sampling image set and the second sampling image set to obtain a first pre-processed particle image set and a second pre-processed particle image set; and the obtaining, based on the first sampling image set and the second sampling image set, the passing time distribution information of the tracer particle cluster passing through the target pipeline comprises: obtaining, based on the first pre-processed particle image set and the second pre-processed particle image set, the passing time distribution information of the tracer particle cluster passing through the target pipeline. 6. The method according to claim 5 , wherein the processing the images in the first sampling image set and the second sampling image set to obtain a first pre-processed particle image set and a second pre-processed particle image set comprises: performing boundary removal on the images in the first sampling image set and the second sampling image set to obtain a first boundary-removed particle image set and a second boundary-removed particle image set; performing noise reduction on the images in the first boundary-removed particle image set and the second boundary-removed particle image set to obtain a first noise-reduced particle image set and a second noise-reduced particle image set; and binarizing the images in the first noise-reduced particle image set and the second noise-reduced particle image set to obtain the first pre-processed particle image set and the second pre-processed particle image set. 7. The method according to claim 6 , wherein after the binarizing the images in the first noise-reduced particle image set and the second noise-reduced particle image set to obtain the first pre-processed particle image set and the second pre-processed particle image set, the method further comprises: obtaining a mechanical oscillation period of the first pre-processed particle image set and the second pre-processed particle image set; and smoothing the first pre-processed particle image set and the second pre-processed particle image set based on the mechanical oscillation period to obtain a first smoothed particle image set and a second smoothed particle image set. 8. The method according to claim 1 , wherein the obtaining a mean residence time of the fluid in the target pipeline based on the passing time distribution information comprises: obtaining a first mean passing moment of the front end of the target pipeline based on the passing time distribution information; obtaining a second mean passing moment of the rear end of the target pipeline based on the passing time distribution information; and calculating the mean residence time based on the first mean passing moment and the second mean passing moment. 9. A device for measuring fluid in a target pipeline, comprising: a laser incidence control unit configured to obtain a working medium temperature and a working medium pressure of the fluid at a front end and/or a rear end of the target pipeline, wherein the laser incidence control unit is further configured to determine a target laser incidence mode in a plurality of laser incidence modes based on the working medium temperature and the working medium pressure, wherein a laser has different incidence angles in different laser incidence modes; the laser incidence control unit is further configured to control the laser to emit a laser light based on the target laser incidence mode; an image sampling module configured to obtain, when the fluid flows in the target pipeline, a first sampling image set of a tracer particle cluster in the fluid passing the front end of the target pipeline and a second samplin

Assignees

Inventors

Classifications

  • using feature-based methods, e.g. the tracking of corners or segments · CPC title

  • Denoising; Smoothing · CPC title

  • using particles entrained by a fluid stream (G01P5/22 takes precedence) · CPC title

  • by measuring differences of pressure in the fluid · CPC title

  • Full-field flow measurement, e.g. determining flow velocity and direction in a whole region at the same time, flow visualisation · CPC title

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What does patent US12436165B2 cover?
This application discloses a fluid measuring method and device and electronic equipment. When a fluid flows in a target pipeline, high-speed cameras obtain a first sampling image set of a tracer particle cluster in the fluid passing a front end of the target pipeline and a second sampling image set of the tracer particle cluster passing a rear end of the target pipeline, thereby obtaining passi…
Who is the assignee on this patent?
Univ Tsinghua
What technology area does this patent fall under?
Primary CPC classification G01P5/26. Mapped technology areas include Physics.
When was this patent published?
Publication date Tue Oct 07 2025 00:00:00 GMT+0000 (Coordinated Universal Time) (B2). Legal status and post-grant events are not shown on this page.
What related patents are in patentsdb?
We list 8 related publications on this page (citations in our corpus or others sharing the same primary CPC).