Devices, systems, and methods for calibrating an optical measurement device

Patent metadata

Field	Value
Publication number	US-12433517-B2
Application number	US-202217665821-A
Country	US
Kind code	B2
Filing date	Feb 7, 2022
Priority date	Feb 19, 2021
Publication date	Oct 7, 2025
Grant date	Oct 7, 2025

Abstract

An illustrative optical measurement device includes a light source configured to emit light pulses directed at a target of a user. The optical measurement device further includes a detector configured to detect arrival times for photons of the light pulses after the photons are scattered by the target. The optical measurement device further includes a processing unit configured to determine, while the optical measurement device is being worn by the user, an instrument response function (IRF) associated with the optical measurement device. The processing unit is further configured to generate, based on the arrival times of the photons at the detector, histogram data associated with the target. The processing unit is further configured to determine, based on the IRF and the histogram data, a property of the target.

First claim

What is claimed is:

1. An optical measurement device configured to be worn by a user, the device comprising:
a light source configured to emit light directed at a target of the user;
a detector configured to detect arrival times for photons of the light after the photons are scattered by the target; and
a processing unit configured to:
determine, while the optical measurement device is being worn by the user, an instrument response function (IRF) associated with the optical measurement device, the determining the IRF comprising measuring a property associated with the optical measurement device while the optical measurement device is being worn by the user and determining the IRF based on the property associated with the optical measurement device,
generate, based on the arrival times of the photons at the detector, histogram data associated with the target, and
determine, based on the IRF and the histogram data, a property of the target.

2. The optical measurement device of claim 1 , wherein the determining the IRF further comprises accessing a lookup table including IRFs corresponding to values of the property associated with the optical measurement device.

3. The optical measurement device of claim 1 , wherein the determining the IRF based on the property associated with the optical measurement device comprises adjusting an initial IRF based on a change in the property associated with the optical measurement device.

4. The optical measurement device of claim 1 , wherein the property associated with the optical measurement device comprises a temperature of one or more components of the optical measurement device.

5. The optical measurement device of claim 1 , wherein the property associated with the optical measurement device comprises a property associated with an environment of the optical measurement device.

6. The optical measurement device of claim 1 , wherein the property associated with the optical measurement device comprises an operating parameter of the optical measurement device.

7. The optical measurement device of claim 6 , wherein the operating parameter comprises a current applied to the light source.

8. The optical measurement device of claim 1 , wherein the determining the IRF is further based on a plurality of properties associated with the optical measurement device.

9. The optical measurement device of claim 1 , wherein the determining the IRF further comprises deconvolving, based on a set of principle IRF components and a set of principle target-related temporal point spread function (TPSF) components, the histogram data to determine the IRF and the target-related TPSF.

10. The optical measurement device of claim 9 , wherein the determining the IRF further comprises combining a plurality of histograms of the histogram data for deconvolving.

11. The optical measurement device of claim 9 , wherein the determining the IRF further comprises determining histograms of the histogram data for deconvolving that are associated with a quiescent period of the user.

12. The optical measurement device of claim 9 , wherein:
the processing unit is further configured to generate additional histogram data based on additional arrival times of photons of the light emitted by the light source and scattered by the target, the additional arrival times detected by an additional detector; and
the determining the IRF further comprises deconvolving the additional histogram data to determine an additional IRF that is substantially similar to the IRF.

13. The optical measurement device of claim 9 , wherein the determining the IRF further comprises minimizing, during a calibration period, the target-related TPSF component.

14. A system comprising:
a memory storing instructions; and
a processor communicatively coupled to the memory and configured to execute the instructions to:
determine, while an optical measurement device is being worn by a user, an instrument response function (IRF) associated with the optical measurement device, the determining the IRF comprising measuring a property associated with the optical measurement device while the optical measurement device is being worn by the user and determining the IRF based on the property associated with the optical measurement device,
generate, based on arrival times of photons at a detector of the optical measurement device after the photons are scattered by a target of the user, histogram data associated with the target, and
determine, based on the IRF and the histogram data, a property of the target.

15. The system of claim 14 , wherein the determining the IRF based on the property associated with the optical measurement device comprises accessing a lookup table including IRFs corresponding to values of the property associated with the optical measurement device.

16. The system of claim 14 , wherein the determining the IRF based on the property associated with the optical measurement device comprises adjusting an initial IRF based on a change in the property associated with the optical measurement device.

17. The system of claim 14 , wherein the property associated with the optical measurement device comprises a temperature of one or more components of the optical measurement device.

18. The system of claim 14 , wherein the property associated with the optical measurement device comprises a property associated with an environment of the optical measurement device.

19. The system of claim 14 , wherein the property associated with the optical measurement device comprises an operating parameter of the optical measurement device.

20. The system of claim 19 , wherein the operating parameter comprises a current applied to a light source of the photons.

21. The system of claim 14 , wherein the determining the IRF is further based on a plurality of properties associated with the optical measurement device.

22. The system of claim 14 , wherein the determining the IRF comprises deconvolving, based on a set of principle IRF components and a set of principle target-related temporal point spread function (TPSF) components, the histogram data to determine the IRF and the target-related TPSF.

23. The system of claim 22 , wherein the determining the IRF further comprises combining a plurality of histograms of the histogram data for deconvolving.

24. The system of claim 22 , wherein the determining the IRF further comprises determining histograms of the histogram data for deconvolving that are associated with a quiescent period of the user.

25. The system of claim 22 , wherein:
the processor is further configured to generate additional histogram data based on additional arrival times of photons scattered by the target, the additional arrival times detected by an additional detector; and
the determining the IRF further comprises deconvolving the additional histogram data to determine an additional IRF that is substantially similar to the IRF.

26. The system of claim 22 , wherein the determining the IRF further comprises minimizing, during a calibration period, the target-related TPSF component.

27. A method comprising:
determining, by a processing unit of an optical measurement device, while the optical measurement device is being worn by a user, an instrument response function (IRF) associated with the optical measurement device, the determining the IRF comprising measuring a property associated with the optical measurement device wh

Assignees

• Hi Llc

Inventors

• Henninger Michael
• Field Ryan
• Ban Han Yong

Classifications

• A61B5/14552 Primary

  Details of sensors specially adapted therefor · CPC title

• A61B2560/0233

  Optical standards · CPC title

• A61B5/1495 Primary

  Calibrating or testing of in-vivo probes · CPC title