Optoelectronic devices and methods of making the same

US12433148B2 · US · B2

Patent metadata
FieldValue
Publication numberUS-12433148-B2
Application numberUS-202218066628-A
CountryUS
Kind codeB2
Filing dateDec 15, 2022
Priority dateSep 27, 2018
Publication dateSep 30, 2025
Grant dateSep 30, 2025

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  1. Title

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  2. Abstract

    A short plain-language summary of the technical disclosure.

  3. Assignees and inventors

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  4. Key dates

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  5. First independent claim

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  6. CPC / IPC classifications

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  7. Citations and related patents

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Abstract

Official abstract text for this publication.

The present disclosure relates to a device that includes a first layer that includes at least one of a semiconducting material, a hole transport material (HTM), and/or an electron transport material (ETM), a second layer, and a third layer that includes a material that is at least one of transparent or conductive, where the second layer is positioned between the first layer and the third layer, the first layer, the second layer, and the third layer are in electrical contact with each other, and the third layer has a first thickness between greater than zero nm and about 100 nm. In some embodiments of the present disclosure, the semiconducting material may include a perovskite.

First claim

Opening claim text (preview).

What is claimed is: 1. A device comprising, in order: a first layer comprising a first perovskite; a second layer comprising an electron transport material (ETM); a third layer comprising an acid anhydride; a fourth layer comprising a metal oxide deposited directly on the third layer, wherein: the first layer, the second layer, the third layer, and the fourth layer are in electrical contact with each other, the third layer has a thickness between greater than zero nm and about 50 nm, the fourth layer has a thickness between greater than zero nm and about 50 nm, and the ETM comprises at least one of a structured carbon or an organic molecule. 2. The device of claim 1 , wherein the thickness of the third layer is between greater than zero nm and about 20 nm. 3. The device of claim 1 , wherein the acid anhydride comprises a dianhydride. 4. The device of claim 3 , wherein the dianhydride comprises at least one of perylene-3,4,9,10-tetracarboxylic dianhydride, 3,3′,4,4′-biphenyltetracarboxylic dianhydride, 1,4,5,8-naphthalenetetracarboxylic dianhydride, bicyclo[2.2.2]oct-7-ene-2,3,5,6-tetracarboxylic dianhydride, or pyromellitic dianhydride. 5. The device of claim 1 , wherein the metal oxide comprises at least one of zinc oxide, titanium oxide, aluminum oxide, gallium oxide, indium oxide, cadmium oxide, or tin oxide. 6. The device of claim 1 , wherein the fourth layer has an electrical sheet resistance laterally across the plane of the fourth layer between 1 KOhm/sq and 10 MOhm/sq. 7. The device of claim 1 , wherein the third layer results in the device having at least one improved physical property or performance metric. 8. The device of claim 7 , wherein the improved physical property or performance metric comprises improved bonding of the fourth layer to the second layer as demonstrated by a shift in at least one of an oxygen peak, a metal peak, or a carbon peak, as detected by X-ray photoelectron spectroscopy. 9. The device of claim 7 , wherein the improved physical property or performance metric comprises improved bonding of the fourth layer to the second layer as demonstrated by emersion of the device in pure dimethylformamide for about 30 seconds at about room temperature. 10. The device of claim 7 , wherein the improved physical property or performance metric comprises improved bonding of the fourth layer to the second layer as demonstrated by improved fracture toughness as demonstrated by a tensile stress test. 11. The device of claim 1 , wherein the ETM comprises a fullerene. 12. The device of claim 1 , further comprising: a fifth layer comprising a second perovskite, wherein: the fourth layer is positioned between the third layer and the fifth layer, the first perovskite has a first bandgap, and the second perovskite has a second bandgap that is different from the first bandgap. 13. The device of claim 5 , wherein the zinc oxide is doped with at least one of aluminum or indium. 14. The device of claim 5 , wherein the oxide comprises tin oxide and the thickness of the fourth layer is between 10 nm and 20 nm. 15. The device of claim 1 , wherein the device is flexible.

Assignees

Inventors

Classifications

  • Thickness · CPC title

  • Constructional details relating to the organic devices covered by this subclass · CPC title

  • Electron transporting layers · CPC title

  • Hole transporting layers · CPC title

  • Polyethylene dioxythiophene [PEDOT]; Derivatives thereof · CPC title

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Frequently asked questions

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What does patent US12433148B2 cover?
The present disclosure relates to a device that includes a first layer that includes at least one of a semiconducting material, a hole transport material (HTM), and/or an electron transport material (ETM), a second layer, and a third layer that includes a material that is at least one of transparent or conductive, where the second layer is positioned between the first layer and the third layer,…
Who is the assignee on this patent?
Alliance Sustainable Energy, Swift Solar Inc
What technology area does this patent fall under?
Primary CPC classification H10K85/151. Mapped technology areas include Electricity.
When was this patent published?
Publication date Tue Sep 30 2025 00:00:00 GMT+0000 (Coordinated Universal Time) (B2). Legal status and post-grant events are not shown on this page.
What related patents are in patentsdb?
We list 6 related publications on this page (citations in our corpus or others sharing the same primary CPC).