Apparatuses, systems, and methods for sample testing

US12422362B2 · US · B2

Patent metadata
FieldValue
Publication numberUS-12422362-B2
Application numberUS-202117447998-A
CountryUS
Kind codeB2
Filing dateSep 17, 2021
Priority dateMay 7, 2020
Publication dateSep 23, 2025
Grant dateSep 23, 2025

How to read this patent

A practical reading order for non-experts. Skip the full description unless you need deep technical detail.

  1. Title

    What the patent document calls the invention.

  2. Abstract

    A short plain-language summary of the technical disclosure.

  3. Assignees and inventors

    Who owns or filed the patent and who is credited as inventor.

  4. Key dates

    Filing, priority, publication, and grant dates set the timeline.

  5. First independent claim

    The legal scope of protection — read this for what is actually claimed.

  6. CPC / IPC classifications

    Technology tags used to group this patent with similar filings.

  7. Citations and related patents

    Prior art links and similar publications in this corpus.

Abstract

Official abstract text for this publication.

Methods, apparatuses, and systems associated with a sample testing device are provided. For example, an example sample testing device may include a substrate layer defining a bottom surface of the sample testing device, as well as a waveguide disposed on the substrate layer and includes at least one reference channel and at least one sample channel.

First claim

Opening claim text (preview).

The invention claimed is: 1. A sample testing device comprising: a waveguide comprising a plurality of flow channels; a pump configured to deliver a buffer solution to a first flow channel of the plurality of flow channels through a first valve; a first buffer loop connecting the first flow channel of the plurality of flow channels to a second flow channel of the plurality of flow channels through a second valve; and a second buffer loop connecting the second flow channel of the plurality of flow channels to a third flow channel of the plurality of flow channels through a third valve, wherein a length of the first buffer loop is different from a length of the second buffer loop. 2. The sample testing device of claim 1 , wherein the first valve is a 2-configuration 6-port valve. 3. The sample testing device of claim 2 , wherein the first valve comprises a first port, a second port, a third port, a fourth port, a fifth port, and a sixth port, wherein the first valve is configured to provide a first configuration and a second configuration. 4. The sample testing device of claim 3 , wherein, when the first valve is in the first configuration, the fifth port of the first valve is connected to the sixth port of the first valve. 5. The sample testing device of claim 4 , wherein the pump is connected to the fifth port of the first valve. 6. The sample testing device of claim 5 , wherein the first flow channel is connected to the sixth port of the first valve. 7. The sample testing device of claim 6 , wherein, when the first valve is in the first configuration, the pump is configured to provide the buffer solution to the first flow channel through the first valve. 8. The sample testing device of claim 3 , wherein, when the first valve is in the first configuration, the first port of the first valve is connected to the second port of the first valve. 9. The sample testing device of claim 3 , wherein, when the first valve is in the first configuration, the third port of the first valve is connected to the fourth port of the first valve. 10. The sample testing device of claim 3 , wherein, when the first valve is in the second configuration, the first port of the first valve is connected to the sixth port of the first valve. 11. The sample testing device of claim 3 , wherein, when the first valve is in the second configuration, the third port of the first valve is connected to the second port of the first valve. 12. The sample testing device of claim 3 , wherein, when the first valve is in the second configuration, the fifth port of the first valve is connected to the fourth port of the first valve. 13. The sample testing device of claim 12 , wherein the fourth port of the first valve is connected to the first port of the first valve through a first sample loop. 14. The sample testing device of claim 13 , wherein, the first sample loop comprises a first fluid. 15. The sample testing device of claim 14 , when the first valve is in the second configuration, the pump is configured to inject the first fluid to the first flow channel. 16. The sample testing device of claim 14 , wherein the second valve is connected to the second flow channel of the plurality of flow channels of the waveguide. 17. The sample testing device of claim 16 , wherein the second valve is a 2-configuration 6-port valve. 18. The sample testing device of claim 17 , wherein the second valve comprises a second sample loop. 19. The sample testing device of claim 18 , wherein the second sample loop comprises a second fluid. 20. The sample testing device of claim 19 , wherein the pump is configured to inject the first fluid to the first flow channel and inject the second fluid to the second flow channel a same time.

Assignees

Inventors

Classifications

  • Computer-controlled implementation · CPC title

  • comprising a software program or a logic diagram · CPC title

  • by means of a computer · CPC title

  • using computer control means · CPC title

  • comprising a software program or a logic diagram · CPC title

Patent family

Related publications grouped by family.

External sources

Frequently asked questions

Answers are generated from the same data shown on this page.

What does patent US12422362B2 cover?
Methods, apparatuses, and systems associated with a sample testing device are provided. For example, an example sample testing device may include a substrate layer defining a bottom surface of the sample testing device, as well as a waveguide disposed on the substrate layer and includes at least one reference channel and at least one sample channel.
Who is the assignee on this patent?
Hand Held Prod Inc
What technology area does this patent fall under?
Primary CPC classification G01N21/45. Mapped technology areas include Physics.
When was this patent published?
Publication date Tue Sep 23 2025 00:00:00 GMT+0000 (Coordinated Universal Time) (B2). Legal status and post-grant events are not shown on this page.
What related patents are in patentsdb?
We list 12 related publications on this page (citations in our corpus or others sharing the same primary CPC).