Apparatuses, systems, and methods for sample testing

Patent metadata

Field	Value
Publication number	US-12422361-B2
Application number	US-202117447995-A
Country	US
Kind code	B2
Filing date	Sep 17, 2021
Priority date	May 7, 2020
Publication date	Sep 23, 2025
Grant date	Sep 23, 2025

Abstract

Methods, apparatuses, and systems associated with a sample testing device are provided. For example, an example sample testing device may include a substrate layer defining a bottom surface of the sample testing device, as well as a waveguide disposed on the substrate layer and includes at least one reference channel and at least one sample channel.

First claim

The invention claimed is:

1. A computer-implemented method comprising:
triggering a light source calibration event associated with a light source component;
capturing reference interference fringe data representing a reference interference fringe pattern in a sample environment, the reference interference fringe pattern projected via a reference channel of a waveguide, wherein the waveguide comprises a sample channel;
comparing the reference interference fringe data with stored calibration interference data to determine a refractive index offset between the reference interference fringe data and the stored calibration interference data;
tuning the light source component based on the refractive index offset;
receiving first interference fringe data for an unidentified sample medium, the first interference fringe data associated with a first wavelength;
receiving second interference fringe data for the unidentified sample medium, the second interference fringe data associated with a second wavelength;
deriving refractive index curve data based on the first interference fringe data associated with the first wavelength and the second interference fringe data associated with the second wavelength;
determining an operating temperature associated with the unidentified sample medium;
querying a refractive index database based on at least the refractive index curve data and the operating temperature to determine a sample identity data, wherein the refractive index database stores a plurality of known refractive index curves associated with a plurality of identified samples and corresponding temperature data; and
determining the sample identity data based on a match between the refractive index curve data and stored refractive index curves at the operating temperature.

2. The computer-implemented method according to claim 1 , wherein tuning the light source component based on the refractive index offset comprises:
adjusting a voltage level applied to the light source component to adjust a light wavelength associated with the light source component.

3. The computer-implemented method according to claim 1 , wherein tuning the light source component based on the refractive index offset comprises:
adjusting a current level applied to the light source component to adjust a light wavelength associated with the light source component.

4. The computer-implemented method according to claim 1 , the computer-implemented method further comprising:
adjusting a temperature control, wherein adjusting the temperature control sets the sample environment to a tuned operating temperature, and wherein the tuned operating temperature is within a threshold range from a desired operating temperature.

5. The computer-implemented method according to claim 1 , the computer-implemented method further comprising:
initiating a calibration setup event associated with the light source component;
capturing calibrated reference interference fringe data representing a calibrated interference fringe pattern in a calibrated environment, the calibrated interference fringe pattern projected via the reference channel of the waveguide; and
storing, in a local memory, the calibrated reference interference fringe data.

6. The computer-implemented method according to claim 5 , wherein the calibrated environment comprises an environment having a known operating temperature.

Assignees

• Hand Held Prod Inc

Inventors

• Feng Chen
• Venkatarayalu Suresh
• Kester Robert Timothy

Classifications

• C23C2/51

  Computer-controlled implementation · CPC title

• C02F2209/006

  comprising a software program or a logic diagram · CPC title

• B29C2037/903

  by means of a computer · CPC title

• B23D63/008

  using computer control means · CPC title

• B01D2313/701

  comprising a software program or a logic diagram · CPC title