Imaging system having radiation detectors of different orientations

Patent metadata

Field	Value
Publication number	US-12416587-B2
Application number	US-202117365299-A
Country	US
Kind code	B2
Filing date	Jul 1, 2021
Priority date	Jan 10, 2019
Publication date	Sep 16, 2025
Grant date	Sep 16, 2025

Abstract

Disclosed herein is system comprising: a radiation source; an image sensor; wherein the image sensor comprises a first radiation detector and a second radiation detector, respectively comprising a planar surface configured to receive radiation from the radiation source; wherein the planar surface of the first radiation detector and the planar surface of the second radiation detector are not parallel; wherein the first radiation detector and the second radiation detector are configured to move to a plurality of positions relative to the radiation source; wherein the image sensor is configured to capture, by using the first radiation detector and the second radiation detector and with the radiation, images of portions of a scene at the positions respectively, and configured to form an image of the scene by stitching the images of the portions; wherein the system is configured to rotate relative to the scene about a third axis.

First claim

What is claimed is:

1. A system comprising:
a radiation source;
an image sensor;
wherein the image sensor comprises a first radiation detector and a second radiation detector, respectively comprising a planar surface configured to receive radiation from the radiation source;
wherein the planar surface of the first radiation detector and the planar surface of the second radiation detector are not parallel;
wherein the first radiation detector and the second radiation detector are configured to move to a plurality of positions relative to the radiation source;
wherein the image sensor is configured to capture, by using the first radiation detector and the second radiation detector and with the radiation, images of portions of a scene at the positions respectively, and configured to form an image of the scene by stitching the images of the portions;
wherein the system is configured to rotate relative to the scene about a first axis;
wherein the radiation source or the image sensor is on the first axis.

2. The system of claim 1 , wherein a relative position of the first radiation detector with respect to the second radiation detector remains the same.

3. The system of claim 1 , wherein the first radiation detector and the second radiation detector are configured to move relative to the radiation source by rotating about a second axis relative to the radiation source.

4. The system of claim 3 , wherein the second axis is parallel to the planar surface of the first radiation detector and the planar surface of the second radiation detector.

5. The system of claim 3 , wherein the first radiation detector and the second radiation detector are configured to move relative to the radiation source by rotating about a third axis relative to the radiation source; wherein the third axis is different from the second axis.

6. The system of claim 3 , wherein the radiation source is on the second axis.

7. The system of claim 1 , wherein the first radiation detector and the second radiation detector are configured to move relative to the radiation source by translating along a first direction relative to the radiation source.

8. The system of claim 7 , wherein the first direction is parallel to the planar surface of the first radiation detector and the planar surface of the second radiation detector.

9. The system of claim 7 , wherein the first direction is parallel to the planar surface of the first radiation detector but not parallel to the planar surface of the second radiation detector.

10. The system of claim 7 , wherein the first radiation detector and the second radiation detector are configured to move relative to the radiation source by translating along a second direction relative to the radiation source; wherein the second direction is different from the first direction.

11. The system of claim 1 , wherein the first radiation detector and the second radiation detector each comprise an array of pixels.

12. The system of claim 1 , wherein the first radiation detector is rectangular in shape.

13. The system of claim 1 , wherein the first radiation detector is hexagonal in shape.

14. The system of claim 1 , wherein the system is configured to rotate relative to the scene about a fourth axis different from the first axis.

15. The system of claim 14 , wherein the radiation source is on the fourth axis.

16. The system of claim 14 , wherein the image sensor is on the fourth axis.

17. The system of claim 1 , wherein the image sensor is configured to form images of the scene when the system is respectively at a plurality of rotational positions relative to the scene.

18. A method of using the system of claim 1 , the method comprising:
forming a first image of the scene with the image sensor while the system is at a first rotational position relative to the scene;
rotating the system relative to the scene about the first axis to a second rotational position relative to the scene;
forming a second image of the scene with the image sensor while the system is at the second rotational position relative to the scene.

19. The method of claim 18 , further comprising rotating the system relative to the scene about a fourth axis to a third rotational position relative to the scene; and forming a third image of the scene with the image sensor while the system is at the third rotational position relative to the scene; wherein the fourth axis is different from the first axis.

20. The method of claim 19 , wherein the radiation source is on the fourth axis.

21. The method of claim 19 , wherein the image sensor is on the fourth axis.

Assignees

• Shenzhen Xpectvision Tech Co Ltd

Inventors

• Cao Peiyan
• Liu Yurun

Classifications

• G01T1/2928

  using solid state detectors · CPC title

• G01N2223/401

  image processing · CPC title

• G01V5/232

  having relative motion between the source, detector and object other than by conveyor (G01V5/226 takes precedence) · CPC title

• G01T1/24

  with semiconductor detectors · CPC title

• G01T1/16

  Measuring radiation intensity (G01T1/29 takes precedence {; self-powered detectors G01T3/006; using an ionisation chamber filled with a liquid or solid, e.g. frozen liquid, dielectric G01T3/008}) · CPC title